Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "Design validation",
and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest.
Let me be your guide.
Start with
the news release Test management software drives compliance from
National Instruments, which we summarised at the time by saying "Open, flexible development platform eases implementation of the TekExpress compliance test automation framework for Serial ATA and other complex serial data standards".
Earlier in the week,
we featured the news release Oscilloscope reaches landmark speed from
Agilent Technologies Europe: "The InfiniiScan Plus enables 150ps hardware-event identification and 75ps software-event identification".
In December 2007, we covered the news from Asset InterTech
- take a look at Acquisition unites test technologies
which says: "The complementary technologies of Asset and ITT furthers the convergence of Asset's JTAG-based structural test technology and ITT's functional testing capabilities".
Take a look also at the news release from XJTAG, Development system tracks designs for testability,
as well as Extension cable takes probes to extremes from Agilent Technologies Europe,
and Boundary-scan system supports Intel's IBIST from Asset InterTech.
See also:
Graphical language environment upgraded
(October 2007)
Agilent VEE 8.5 enables users to program instrument systems in a modern, streamlined way with its new integrated development environment
Critical controller boards put on trial
(October 2007)
System provides a comprehensive set of tools to test, debug and program complex printed circuits containing ball grid array devices
Attenuator/switch drivers ease validation
(September 2007)
Agilent's 11713B and 11713C attenuator/switch drivers allow quick, easy design validation and automated testing
Boundary scan system speeds debugging
(September 2007)
The XJTAG system has enabled ARM to achieve its ten-minutes-per-board boundary scan production test target, and to significantly improve production yields
Test application improves reliability
(August 2007)
The Agilent U7231A DDR3 application automatically configures the oscilloscope for each test and generates an HTML report at the end of the test
Scope forms basis for DisplayPort compliance
(August 2007)
Compliance test solution implements all tests identified in the DisplayPort physical layer compliance test specification
Graphical programming turns to multicore design
(August 2007)
The latest version of LabView extends the embedded platform to program multicore real-time processors
Digital storage scopes prove popular
(June 2007)
The new 5000 Series digital storage oscilloscope has tripled Agilent's previous record for oscilloscope orders and shipments
Instruments set HDMI compliance mark
(June 2007)
Several Agilent instruments have been selected as recommended test equipment in the HDMI Compliance Test Specification
Development system debugs precision motion
(June 2007)
Etel uses the XJTAG boundary scan development system to debug and test complex printed circuit boards used in its market-leading range of advanced digital motion controllers
System evolves to monitor FPGA developments
(May 2007)
Development system offers easy access to FPGA analogue debug and system management tool for thermal management and measurement of on-chip power supply voltages
Companies combine to verify wireless equipment
(May 2007)
Companies collaborate to produce an integrated and efficient means of verifying baseband designs with dynamic, accurate, bidirectional network simulations of embedded systems
Physical layer interface IP is ready for 65nm
(May 2007)
Next-generation 65nm serial-interface IP supports both 3 and 6Gbit/s Serial ATA hard disk drives for mobile and desktop computing applications
Oscilloscopes combine performance and portability
(April 2007)
Six new oscilloscopes t combine high-resolution, lab-quality waveform acquisition and measurement capability with a lightweight, portable frame
Software fixes floating point operations
(April 2007)
Toolbox provides enhanced floating-to-fixed-point conversion capabilities and accelerated fixed-point Matlab algorithms that execute at compiled C-code speed
Digital and mixed-signal scopes get battery power
(April 2007)
The 6000 Series of digital storage oscilloscopes and mixed-signal oscilloscopes now have battery options for use in field applications where line power is unavailable
Oscilloscopes win Test Product of the Year award
(March 2007)
80000B Series oscilloscopes have been voted 'Test Product of the Year' by readers of Test and Measurement World magazine
Waveform generator for digital RF tests
(March 2007)
Arbitrary waverform generator is useful for testing digital RF technologies including software-defined radios and radars, WiMAX, WiFi, MIMO, and UWB
FlexRay options aid automotive testing
(February 2007)
Automotive test products can easily be integrated in complex, automated functional test configurations, which can be leveraged from design validation into production
Oscilloscope-based DDR2 compliance test
(December 2006)
Agilent Technologies has introduced what it believes to be the industry's first oscilloscope-based DDR2 compliance test application
Transistor Devices deal expands across Europe
(November 2006)
Expanded agreement with Transistor Devices, the US-based power supply systems manufacturer, consolidates UR's position as a supplier of TDI products in all major European markets
Development tools speed board prototyping
(November 2006)
XJTAG has unveiled its XJTAG Professional development system and announced a plethora of enhancements to its award-winning IEEE1149.1 compliant system
DAQ system provides more channels
(November 2006)
Multifunction data acquisition modules and instrument chassis offer increased bandwidth for multiple I/O operations coupled with ease of connectivity and hot-swappable connections
RFID/NFC transceiver joins MCU in reader design
(November 2006)
Melexis is working with Atmel Corp to propose innovative solutions for 13.56MHz RFID readers and near field communication (NFC) devices
WiMAX testers aid design validation
(November 2006)
Agilent Technologies' WiMAX-specific design validation and production solutions have been successfully delivered and accepted by several customers
Development system speeds complex board debug
(October 2006)
Prism Electronics uses the XJTAG boundary scan development system to speed up the process of debugging and testing highly complex printed circuit boards
HSUPA test case validates terminals
(October 2006)
Five test cases from Anite Telecoms' High Speed Uplink Packet Access (HSUPA) test case package have already been successfully validated against two or more terminals
Boundary scan development system free for CEMs
(September 2006)
XJTAG is offering UK-based contract electronic manufacturers a free XJRunner, the production-optimised version of its XJTAG boundary scan development system
Automated Test Summit comes to the UK
(February 2006)
The Automated Test Summit is a free one-day conference and exhibition taking place at Edgbaston Cricket Ground, Birmingham, UK on Tuesday 28th March 2006
Analyser picks up magazine award
(January 2006)
Asset InterTech's DFT Analyzer has been honoured with a 'Best In Test' award from Test and Measurement World
Boundary scan answers CEM test demands
(December 2005)
UK based contract electronics manufacturer Barric has selected XJTAG as its boundary scan test solution partner
DFT analyser reduces test and prototyping costs
(November 2005)
The DFT analyser from Asset InterTech reduces manufacturing and test costs by validating the boundary-scan design-for-test (DFT) features in a circuit board design before prototypes are assembled
Analyser keeps watch over design for test rules
(October 2005)
A new DFT analyser reduces manufacturing and tests costs by validating the boundary-scan design-for-test features in a circuit board design before any prototypes are assembled
Modular instruments put latest Xbox on trial
(October 2005)
Microsoft Corp is using an NI LabView and PXI-based test solution for its Xbox 360 video game and entertainment system controllers