Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "DUT",
and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest.
Let me be your guide.
Start with
the news release Measurement guide prevents common mistakes from
Cropico, which we summarised at the time by saying "Cropico's Guide to Low Resistance Measurement features tables of wire and cable characteristics, temperature coefficients and formulae".
A few weeks before,
we featured the news release Compression software expands frequency analysis from
Agilent Technologies Europe: "Gain compression application enables engineers to measure many frequencies easily and with extreme speed and accuracy".
In November 2007, we covered the news from Rohde and Schwarz
concerning its SMF100A options
- take a look at Options expand microwave signal generation
which says: "New capabilities are particularly attractive for the aerospace and defence sector as well as for manufacturers of microwave modules and components".
Take a look also at the news release from Rohde and Schwarz, WiMAX tester boosts measurement speeds,
as well as Platform allows fast digital testing from Rohde and Schwarz,
and Mobile WiMAX testing supports the new wave from Agilent Technologies Europe.
See also:
Module enables storage system development
(July 2007)
Dual-purpose SAN tester and protocol analyser for 8Gbit/s Fibre Channel allows engineers to speed up the design and development of next-generation storage devices
DC supply stands the test of efficiency
(July 2007)
Highly versatile general-purpose DC power supply is ideal for R and D, production test and instrumentation applications
Vector programming system is fastest for Flash
(May 2007)
The Flashstream Flash vector programming system offers programming of NAND and NOR Flash memory at speeds as low as 2.5% over theoretical programming minimum
Manufacturing testers turn to ZigBee devices
(May 2007)
Production test programs allow ZigBee products to be tested by one-box test instruments and saving substantial manufacturing costs
Power analyser is a class of its own for R and D
(May 2007)
DC power analyser is claimed to provide unrivalled productivity gains when sourcing and measuring DC voltage and current into a device under test
Handler accelerates memory testing
(April 2007)
Dynamic test handler for memory devices such as DDR2/3-SDRAM enables parallel testing of up to 512 devices and boasts a throughput of 20,000 units per hour
Network analyser covers 10 to 40GHz
(April 2007)
The RandS ZVA40 is suitable for RandD in microwave applications, with an output power of more than 18dBm, a dynamic range greater than 150dB and a measurement speed of 3.5us per test point
Network analyser does differential measurements
(March 2007)
A software option adds a true differential measurement mode up to 40GHz to an existing family of network analysers
Low-cost spectrum analyser produces fast results
(March 2007)
Facing mounting cost-reduction pressure from competition, engineers and technicians need cost-effective instruments to cope with various test applications
PCB design services come onboard
(March 2007)
Range of products and services is now being extended to include PCB design for all types of test builds and test applications
Radiated spurious emissions testing comes to Korea
(January 2007)
RFI Global Services has installed a specially commissioned radiated spurious emissions chamber at its test facility in South Korea, which was opened in June last year
Read between the lines of test chamber specs
(December 2006)
Determining which HALT or HASS chamber can best meet your reliability programme requirements takes more than a quick glance of spec sheets
High flexibility for network analysis
(December 2006)
The RandS ZVA40 from Rohde and Schwarz is a new network analyser with a frequency range from 10 MHz to 40 GHz
Test programs take in design verification
(August 2006)
LitePoint Corp has announced design verification test functionally for its IQfact test program family
SoC prototyping is efficient for smaller designs
(July 2006)
The Chipit Iridium Edition offers ASIC and SoC design engineers unprecedented speed and flexibility to verify and debug their designs
EMI test receivers have all standards covered
(July 2006)
The R and S ESU family of CISPR16-1-1-compliant EMI test receivers meet all civil and military standards for electromagnetic interference measurements
Spectrum analyser and phase noise tester combine
(July 2006)
The R and S FSUP is billed as the first instrument specially designed for measuring phase noise and for characterising RF signal sources
Major product test facility opened in Korea
(June 2006)
RFI's brand new laboratories in Gunpo near Seoul were recently approved by the United Kingdom Accreditation Service (UKAS), placing RFI's GBP3.6m investment as formally 'open for business'
Light emitting diodes are put to the test
(June 2006)
The TeraLED is a novel tester for thermal and radiometric characterisation of light emitting diodes
Transient module guarantees high defect coverage
(May 2006)
A new measurement module enables a quick and easy application of transient current tests in a production test environment
Modulation generator answers research demands
(March 2006)
The R and S AFQ100A I/Q modulation generator combines a memory clock of 300MHz with a memory depth of up to 1Gsample
Evaluation kits check out delta-sigma convertors
(February 2006)
New evaluation kits support the XT11200 (12bit) and XT11400 (14bit), 40MHz analogue-to-digital convertors
UMD Technology acquires Dimensions Consulting
(February 2006)
UMD Technology has acquired Silicon-Valley-based Dimensions Consulting in a deal that was finalised on 31st January 2006 and is the company's third acquisition since 2003
SoC verification platform turns to system design
(January 2006)
The new member of the Chipit Platinum series features an enhanced system architecture based on Xilinx Virtex-4 FPGA technology, new debugging features and new software for system design
Software adds layer 1 testing
(January 2006)
Layer 1 test software from Rohde and Schwarz provides a flexible test environment for layer 1 implementations in WCDMA and HSDPA user equipment
Ohmmeter doesn't compromise on specifications
(October 2005)
The redesigned Cropico DO5000 high accuracy microhmmeter encompasses all the features required of an ohmmeter in one flexible instrument with exceptional functionality
Acquisition brings serial test software onboard
(June 2005)
Tektronix has acquired TDA Systems of Lake Oswego, Oregon, a provider of interconnect analysis software tools
High-end features brought to low-cost ATE systems
(March 2005)
Highly integrated four channel BiCMOS pin electronics IC can increase throughput of testers and still deliver one of the lowest cost-per-channel ratios in the industry
Prototyping platform speeds ASIC verification
(February 2005)
Chipit Gold Edition Pro is a cost effective, flexible and innovative high-speed prototyping platform that is applicable wherever functional ASIC design verification is required
Universal functional test system developed
(November 2004)
The Peak Group has developed a new universal functional test system based on a series of modules that can be configured to meet the manufacturing test requirements of a variety of industries
Software sppeds setup for microwave test systems
(September 2004)
Aeroflex has integrated National Instruments' NI TestStand development system into its high-performance synthetic microwave test systems
Module takes control of eight power outputs
(September 2004)
The high power, programmable XMP 2600 multiple output power system has just become more versatile now that Xantrex Technology has introduced a new interfacing control module
News on the DUT and TRC-M medical switchers from PowerPax UK
(June 2004)
Two ranges of high-quality medically approved switch-mode power supplies are now available at even more aggressive prices
Carrier solves PCI-X bus anaysis dilemma
(May 2004)
The Vanguard PCI-X Single Slot Carrier allows PCI-X bus systems to be tested at 133MHz without violating the stringent loading restrictions imposed by the PCI-X specification