Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "GPIB",
and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest.
Let me be your guide.
Start with
the news release Powerful claims for timer/counter/analyser from
Aspen Electronics, which we summarised at the time by saying "The CNT-91 is particularly useful for detecting small time and frequency changes, and this is vital for R and D as well as production test applications".
A couple of weeks before,
we featured the news release Half-rack supply enables flexible test systems from
TTi (Thurlby Thandar Instruments): "Delivers stable, variable output voltage and current for a broad range of requirements".
In January 2008, we covered the news from Agilent Technologies Europe
concerning its N7744A and N7745A
- take a look at Power meters test optical multiport components
which says: "Optical power meters offer industry-leading specifications for device connectivity, high-speed measurement data acquisition and fast data transfer for post-processing".
Take a look also at the news release from Berkeley Nucleonics, Generator brings pulse and digital delay together,
as well as Programmable supplies boast top power density from Xantrex Technology,
and Boundary scan controllers have LXI interfaces from Goepel Electronic.
See also:
Upgrade for arbitrary/function generators
(November 2007)
Generators provide a maximum sampling speed of 250Gsample/s, which is much higher than competing units in the same price bracket
Graphical language environment upgraded
(October 2007)
Agilent VEE 8.5 enables users to program instrument systems in a modern, streamlined way with its new integrated development environment
Microwave generator achieves high frequencies
(October 2007)
The VCO-based architecture of the MG37020A microwave signal generator integrates advanced RF hardware, enhanced computing and digital interfaces that minimise command and trigger delays
Talisman MCC business moves to Adept
(October 2007)
Owners of Measurement Computing Corporation test and measurement hardware who bought through Talisman Electronics will now be supported by UK master supplier Adept Scientific
Cost-effective analyser covers broad spectrum
(September 2007)
Affordable 3GHz spectrum analyser is suitable for manufacturing, installation and field service, EMI testing and education sectors
System switch handles high channel counts
(September 2007)
The series 3700 system switch/multimeter solutions offer scalable, high-performance switching and multi-channel measurements, optimised for automated testing of electronic products and components
Instruments cut test times
(September 2007)
The 2635 and 2636 operate as an SMU (source-measure unit), a DMM (digital multimeter), bias source, low frequency pulse generator, and arbitrary waveform generator
Attenuator/switch drivers ease validation
(September 2007)
Agilent's 11713B and 11713C attenuator/switch drivers allow quick, easy design validation and automated testing
Signal analyser eases troubleshooting
(September 2007)
The Agilent EXA signal analyser provides flexible, scalable signal analysis to budget-conscious engineers
Trigger box improves instrument performance
(August 2007)
When an LXI Class C or GPIB instrument is connected to the Agilent E5818A LXI trigger box it gains the timing capabilities of an LXI Class B instrument
Picoammeter has roots in NPL research
(August 2007)
Compact electrometer module board measures very small currents with extremely high precision and repeatability
Tetra tester adds more capabilities
(June 2007)
Digital radio test set provides more test capabilities integrated into one system, as well as extended analysis range and file management functions
Software makes more sense of waveform data
(June 2007)
Waveform viewing software adds a report generation function that allows waveforms to be co-ordinated with measurement results and text data
Power analyser is a class of its own for R and D
(May 2007)
DC power analyser is claimed to provide unrivalled productivity gains when sourcing and measuring DC voltage and current into a device under test
Modules put more power into test systems
(May 2007)
Additional modules extend the N6700 low-profile modular power system to 300W
Smart sensors make multiple microwave measurements
(May 2007)
Microwave power meters cover power measurements from 200pW to 200mW at frequencies up to 18GHz
Microwave signal generator tackles phase noise
(April 2007)
Analogue microwave signal generator is suitable for a variety of telecommunications and radar applications
Data acquisition book is a practical guide to test
(March 2007)
'Understanding New Developments in Data Acquisition, Measurement, and Control' is a free 220+-page data acquisition handbook which offers a practical guide to high performance test and measurement
Network analyser adds spectrum analysis
(March 2007)
All-purpose instrument offers the scope of network-analysis functions of the established R and S ZVB and R and S ZVA instrument families
GPIB controller runs faster over USB
(March 2007)
Latest I/O hardware includes High-Speed USB 2.0 connectivity, parallel polling for fast response check of instruments and an improved transfer rate of 35% from the previous USB/GPIB release
Waveform generator for digital RF tests
(March 2007)
Arbitrary waverform generator is useful for testing digital RF technologies including software-defined radios and radars, WiMAX, WiFi, MIMO, and UWB
TV analyser covers analogue and digital standards
(February 2007)
Universal multistandard platform for analysing TV signals combines the functionality of a TV test receiver and spectrum analyser in a single instrument
Baseband analyser for chipset development
(December 2006)
Baseband analyser is exactly tailored to the requirements of chipset development for mobile phones and basestations
Novel SoC drives generator performance
(November 2006)
The Tektronix AFG3000 Series of arbitrary/function generators consists of six models with the market-leading 240MHz, dual-channel, 2Gsample/s AFG3252 at the head of the series
GPIB controller slims for low-profile PCs
(November 2006)
New from Keithley Instruments is the Model KPCI-488LP low profile GPIB controller interface plug-in board
Analysis software aids WiMAX development
(November 2006)
Tektronix has announced RSA-IQWIMAX demodulation and analysis software, part of a comprehensive test set to find and solve WiMAX design problems
PXI products hold hybrid test systems together
(November 2006)
Keithley Instruments has released a new line of PXI products designed for high speed automated production testing as part of a hybrid test system using precision instruments
DSOs are made for systems integration
(November 2006)
Agilent Technologies has introduced the first LXI class C compliant oscilloscope family optimised for use in test systems
Waveform generators claim speed record
(October 2006)
Series of arbitrary waveform generators are billed as the world's fastest, designed to meet the test needs for high-speed serial databuses and wideband digital RF devices
Supplies test with micro resolution
(September 2006)
Amrel/American Reliance has released what it claims to be the industry's first dual-channel switch-mode power supply under 600W
Software puts new Tek scopes in the system
(September 2006)
With USB plug-and-play capability, SignalExpress Tektronix Edition makes it easy for engineers to connect to and control Tektronix instruments from their PCs
Alliance aims for instrument integration
(August 2006)
National Instruments and Agilent Technologies are working together to create National Instruments LabView plug-and-play instrument drivers for Agilent LXI, USB and GPIB instruments
DAQ modules and controllers ride PCI Express bus
(August 2006)
The NI PXIe-6259 and NI PXIe-6251 M Series modules deliver fast analogue and digital I/O with up to 250Mbyte/s dedicated per-slot bandwidth
Optical spectrum analyser adds test automation
(August 2006)
Aragon Photonics Labs has developed a Macro Editor Tool for its BOSA high resolution optical spectrum analyser