‘Microscope’
An Electronicstalk guide
Start with the news release
Hot-Beam-05 underheater for reworked components from
Link Hamson, which we summarised at the time by saying "Link Hamson is introducing the Martin Hot-Beam-05 underheater for stress-free rework and manual soldering.".
Several months prior to that,
we featured the news release Semrock offers free laser-engraving service from
Semrock: "Semrock, a manufacturer of optical filters, now laser-engraves its catalogue dichroic beam splitters at no extra charge.".
In December 2008, we covered the news from EV Group
- take a look at EVG offers EVG-NT mask and bond aligners
which says: "EV Group (EVG) has introduced the NT series of mask aligners, wafer-to-wafer (W2W) bond aligners and measurement systems. ".
Take a look also at the news release from Semrock, Semrock expands fluorescence filter range,
as well as Real-time behaviour under the microscope from Express Logic,
and Fibre optic test kits avoid dirt-based downtime from JDSU.
Latest stories...
Loaders handle ultra-thin wafers (July 2008)
Nikon NWL200 wafer loaders remove the need to place very thin wafers on the microscope by hand during the post process stage.
Microscope accessory eases awkward inspections (July 2008)
The CentrePoint microscope accessory allows engineers using the stereo microscope to inspect connectors and internal features using its episcopic illuminator.
Inspection system looks down via holes (May 2008)
Turntable provides the operator with complete hands-free viewing, allowing plenty of distance from the microscope to carry out any rework that might be required.
Stereo microscope spots more with LED illumination (March 2008)
The Lynxx provides a full 360-degree view around the components for 34-degree angled inspection of corners that can often be hard to reach by usual stereo inspection methods.
Field tester adds faster fibre coverage (February 2008)
Engineered to address the growing demands for installation and troubleshooting of Fibre Channel services in metro networks.
AOI machines boost reliability and improve design (January 2008)
Building Block Video and Prima Electronic Services are two of nine UK and Ireland organisations to have purchased Omron AOI systems from Contax.
Wafer probing provides 45nm resolution (January 2008)
Users of the Elite 300 wafer probe station won't have to retool at each process node or lose business to competing foundries with more accurate test capabilities.
Kits clean up on fibre testing (December 2007)
Microscope quickly aligns the inspection probe with either fibre ports or patch cord connectors to greatly increase the speed and efficiency of fibre inspection.
Further reading
-
Real-time behaviour under the microscope
Embedded development tool improves visibility into ThreadX-based systems during development.
-
Microscope accessory eases awkward inspections
The CentrePoint microscope accessory allows engineers using the stereo microscope to inspect connectors and internal features using its episcopic illuminator.
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