Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "Microscope",
and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest.
Let me be your guide.
Start with
the news release AOI machines boost reliability and improve design from
Contax, which we summarised at the time by saying "Building Block Video and Prima Electronic Services are two of nine UK and Ireland organisations to have purchased Omron AOI systems from Contax".
Earlier in the week,
we featured the news release Wafer probing provides 45nm resolution from
Cascade Microtech: "Users of the Elite 300 wafer probe station won't have to retool at each process node or lose business to competing foundries with more accurate test capabilities".
In December 2007, we covered the news from Fluke Networks
concerning its Fibre Verification Kits
- take a look at Kits clean up on fibre testing
which says: "Microscope quickly aligns the inspection probe with either fibre ports or patch cord connectors to greatly increase the speed and efficiency of fibre inspection".
Take a look also at the news release from National Physical Laboratory, X-ray fluorescence under the microscope,
as well as Microscope eases PCB inspection from Vision Engineering,
and Colour microscope eases PCB inspection from Kaisertech.
See also:
Universal bond tester offers compact reliability
(September 2007)
All interchangeable test modules in the System 650 range can be range selected over a broad scale, permitting measured force resolution of less than 1mg
IR camera aids in MEMS device characterisation
(May 2007)
High-resolution infra-red camera system provides detailed information as to the static and dynamic thermal behaviour of MEMS structures
Showcase for technology innovation
(May 2007)
SEMI has announced its Technology Innovation Showcase Award winners in three categories: Emerging Technologies, Wafer Processing and Test, Assembly and Packaging
Audit service to test compliance with RoHS
(May 2007)
A new RoHS Reliability assessment service combines the strengths of an expert UK consultant and an independent laboratory report to assist manufacturers to become compliant with the directive
Collaboration on e-beam pattern inspection tools
(April 2007)
Companies are collaborating to enable faster, more accurate, more predictive optical proximity correction (OPC) model building for e-beam manufacturing at 45nm and beyond
Layout software links up with electron microscope
(April 2007)
Layout visualisation software can now be used with scanning electron microscopy to develop test routines for highly accurate measurement of semiconductor masks
Fibres put under the microscope in Anaheim
(February 2007)
Timbercon will host a special fibre optic cable testing and inspection event at the OFC/NFOEC show in Anaheim, from 27th to 29th March 2007
Simulator to host single event effect testing
(February 2007)
Precision Solutions' new SEREEL 2 facility has been officially opened by Lord Sainsbury of Turville
Electron microscope has resolution for research
(January 2007)
Ultra-high-resolution scanning transmission electron microscope is characterised by new electron optics which now include a spherical aberration correction system
Detector upgrades microscope performance
(January 2007)
The new 3Max detector from El-Mul Technologies is billed as the first true innovation in Everhart-Thornley (ET) type chamber detectors in over 40 years
Illuminator delivers consistent performance
(December 2006)
A pre-centred mercury-fibre illumination system that never needs alignment has been launched by Nikon Instruments
Current thinking on testing protective earthing
(December 2006)
Jim Wallace, research and technology manager at Seaward Electronic, looks at the merits of using 25A and 200mA currents to test protective earthing conductors in electrical and electronic appliances
Lab is dedicated to solid-state lighting
(November 2006)
Optek Technology has set up an in-house visible LED lab designed to assist customers in developing solutions for applications involving solid-state lighting
Micromachining system advances Welsh centre
(November 2006)
Oxford Lasers has recently installed the most advanced ultrafast micromachining system of its kind at the Manufacturing Engineering Centre (MEC), Cardiff
RoHS screening service spreads to Ireland
(September 2006)
Dublin based ACK Solutions provides the Irish electronics industry with a RoHS Assurance screening service
Systems diagnose optical problems on a budget
(September 2006)
Optical test systems address consumers' demands for improved image quality in digital devices, such as cellphones, digital cameras, medical instruments and even automobiles
Handset batteries under the microscope
(September 2006)
Independent certification will soon be required for all batteries intended for cellular telephone applications
X-ray system to support analytical examinations
(August 2006)
Conekt has invested Eur 180,000 to enhance current quality, reliability and failure analysis capabilities within its Engineering Services Division in Shirley, UK
Electron optics experts head for Japan
(August 2006)
Representatives from the Hitachi organisation throughout the world will be making a significant contribution to the 16th International Microscopy Congress in Japan next month
X-Loupe helps digital camera zoom-in microns
(July 2006)
X-Loupe contains a microscopic module and a series of objectives that are used to combine with a digital camera in order to clearly capture the image of an object with its size as small as 10 micron
Large chamber analytical VPSEM launched
(July 2006)
Hitachi High-Technologies has announced the launch of the S-3700N variable pressure scanning electron microscope (VPSEM)
Cryogenic treatment creates classic audio
(May 2006)
Cryogenic treatment can be used to prematurely age audio valves, improving sound quality and increasing reliability
Tabletop microscope takes a different view
(April 2006)
A new tabletop microscope has the potential to transform the field of basic microscopy
Photometer extends to brighter tasks
(March 2006)
A CCD-based photometer claims a new value and performance benchmark for LED, display and illumination metrology
Allen expands scope network
(March 2006)
Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes
Speciality fibres come with special qualifications
(March 2006)
Fibercore is among the first speciality optical fibre manufacturers to offer commercially available environmental qualification and reliability testing for speciality fibres
Third-party study confirms stencil superiority
(February 2006)
Photo Stencil has published the results of a comparison study between AMTX (Advanced Microfabrication Technology Xerox) E-Fab electroform and laser-cut electroform nickel foil
Fibre optic connectors handle harsh environments
(November 2005)
Aerco is now supplying the high performance Amphenol MFM series fibre optic connectors
Detector provides a powerful alternative
(November 2005)
Hitachi High-Technologies has introduced a new environmental secondary electron detector (ESED) for the S-3400N variable pressure scanning electron microscope
Using image analysis to determine filter residues
(November 2005)
The Analysis Filterinspector is a residue analysis system for fully automated analysis, classification and documentation of filter residues
Component mounter leads new range in Munich
(October 2005)
At this year's Productronica, Sony Manufacturing Systems Europe will be exhibiting a new range of manufacturing and automation equipment
Measuring system aids Welsh startups
(September 2005)
Technology startups at one of Wales' flagship Technium incubation centres have received a major boost with the installation of a high performance Nikon Nexiv Z120X video measuring system
Website demonstrates new metrology system
(August 2005)
Following the recent launch of the LEXT confocal laser scanning microscope for ultraprecise surface analysis, Olympus is now running an online special feature on this new metrology system
Ideal light source has lower running costs
(August 2005)
Olympus Life and Material Science Europa has today announced the availability of the new Exfo X-Cite 120 fluorescent light source for its microscopes