Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "Microscopes",
and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest.
Let me be your guide.
Start with
the news release Acquisition creates fibre test giant from
JDSU, which we summarised at the time by saying "The addition of Westover Scientific's products to JDSU's Communications Test and Measurement business creates the largest provider of fibre-optic test solutions in the world".
Several months prior to that,
we featured the news release Microscopes analyse LSI devices from
Cambridge Technology Systems: "Imaging large scale integrated devices for design and diagnostic purposes is facilitated by new mosaic automation techniques applied to compound optical microscopy".
In January 2007, we covered the news from Vistec Semiconductor Systems
- take a look at European MEMS maker sees more with IR inspection
which says: "Vistec Semiconductor Systems has delivered two INM100 IR infra-red inspection systems to a European MEMS manufacturer".
Take a look also at the news release from Nikon UK, Illuminator delivers consistent performance,
as well as TM-1000 on show at Buckingham Palace from Hitachi High-Technologies (Electron Microscopy),
and Electron optics experts head for Japan from Hitachi High-Technologies (Electron Microscopy).
See also:
Tabletop microscope takes a different view
(April 2006)
A new tabletop microscope has the potential to transform the field of basic microscopy
Allen expands scope network
(March 2006)
Hitachi High-Technologies has announced a major expansion in sales territories for its electron microscopes
Inspection systems respond to lead-free challenges
(February 2006)
This year Vision Engineering will be demonstrating its range of inspection and measurement systems at Nepon UK on stand C32
Ideal light source has lower running costs
(August 2005)
Olympus Life and Material Science Europa has today announced the availability of the new Exfo X-Cite 120 fluorescent light source for its microscopes
Microscope spots more wafer errors
(June 2005)
The new Olympus MX61 semiconductor inspection microscope for 200/300mm wafers, improves process inspection by increasing the failure detection rate
Microscope gains an extra dimension
(May 2005)
A new, five-segment semiconductor backscattered electron detector with high sensitivity and fast response rates has been introduced for the S-3400N variable pressure SEM
Brighton debut for new-generation viewers
(April 2005)
Ten years after the great success of Vision Engineering's Mantis, the new generation of Mantis family of stereo viewers are due to be launched in the UK at Nepcon 2005 stand G710
Modest price to pay for viewer
(April 2005)
Vision Engineering has developed a new more cost effective generation of Mantis
Spectroradiometer leads long-running range
(April 2005)
The Optronics Laboratories OL756 is the latest in a long running range of portable UV-VIS (200-800nm) spectroradiometers
Scope maintains ESD protection
(March 2005)
The Lynx ESD offers all of the advantages of eyepieceless microscopy but with superior ESD protection for static sensitive components
Instrument driver network tops 4000 devices
(January 2005)
National Instruments now offers more than 4000 instrument drivers in the NI Instrument Driver Network, the industry's largest source for instrument drivers
SMT Lab formalises knowledge-based services
(October 2004)
The expertise of Universal Instruments' SMT Laboratory is now available on factory floors worldwide, through the laboratory's new process audit service
SEM boasts outstanding anaysis capabilities
(August 2004)
The S-4300SE/N from Hitachi High-Technologies provides a unique combination of a field emission source and variable pressure in a truly analytical instrument
TEM promises nanometre-level resolution
(July 2004)
Outstanding spatial resolution at the nanometre level can be achieved on chemical element mapping in the HD-2300 scanning transmission electron microscope from Hitachi High-Technologies
Microscope resolves to handle 8in wafers
(June 2004)
The S-4800 FESEM from Hitachi High-Technologies represents a breakthrough in FESEM technology, offering resolution figures of 1.0nm at 15kV yet capable of handling specimens up to 8in diameter
E-beam lithography system is UK first
(May 2004)
Innos has invested GBP 5 million to upgrade its photolithography capability, including purchase of the UK's first JBX-9300FS electron-beam lithography system
Enter the modern engineer's eyepiece
(May 2004)
SolView is a revolutionary, handheld inspection tool for the examination of solder bonds beneath surface-mount electronic components
Seminar looks at electronics inspection
(April 2004)
Best, Metcal Soldering Systems, VJ Technologies and Leica microscopes are holding a technical seminar on electronics inspection techniques
Optical scale aids submicron precision
(March 2004)
For many industrial applications in research and quality control, the measurement of components with submicron precision can best be accomplished through a microscope with optical linear scales
Jones demonstrates benefits of electron microscopy
(March 2004)
Hitachi High-Technologies has appointed Chris Jones as Applications Specialist and Demonstrator for its Electron Microscopy Division in the UK
Tools speed high bandwidth development
(December 2003)
FPGA technology has come a long way, says Ron Strauss, Vice President and General Manager, SBS Technologies
Pair target nanotechnology research
(October 2003)
Keithley Instruments and Zyvex Corp have signed an agreement to work together to develop new solutions for the nanotech marketplace
A closer look at solder at Productronica
(October 2003)
Vision Engineering will be demonstrating its entire range of ergonomically optimised stereo inspection microscopes at Productronica 2003
Inorganic nanomaterials aim for high-res displays
(September 2003)
A new and superior kind of inorganic nanotubes offers benefits to highly sophisticated products such as advanced generation high resolution flat panel displays and atomic force microscopes (AFMs)
More power to Mars landers
(August 2003)
International Rectifier's power management technology is making an important contribution to the missions of the recently launched Mars explorers, Spirit and Opportunity
Handheld scope for BGA inspection
(June 2003)
The MS1000LW is a handheld, fast and easy to use inspection microscope that can be used for highly cost-effective inspection of BGAs and other components
News on the Meiji Techno microscopes from Kaisertech
(April 2003)
Kaisertech has added Meiji Techno microscopes and vision equipment to its range of electronic production equipment
Design award for novel scope
(April 2003)
The new MIC-D digital microscope from Olympus has won a prestigious design award for its innovation and functionality
Detector boosts microscope applications
(March 2003)
A new technical datasheet details the use of the ESED environmental secondary electron detector in variable pressure scanning electron microscopes
Video measuring systems on show at Nepcon
(September 2002)
Nikon's stand at this year's Nepcon UK show is featuring two of the latest NEXIV video measuring systems
Microscope provides static-safe inspection
(August 2002)
The new Lynx-ESD stereo eyepieceless microscope offers electrostatic discharge protection for inspection in the electronics and semiconductor industries
Laser autofocus system raises throughput
(March 2002)
Prior Scientific has developed a new laser autofocus system
Automation for demanding microscopy applications
(March 2002)
The all-new ProScan series of automated microscopy systems is modular in design and features a wide range of stages for use with most modern microscopes
Camera adds storage to microscopes
(January 2002)
The DP12 is a compact new digital camera from Olympus providing for professional digital imaging in microscopy