Laurence Marchini, Editor, writes:
We see from your search that you're looking for information on the term "Pattern generator",
and we have a large number of manufacturers' news releases and technical articles here on Electronicstalk which will be of interest.
Let me be your guide.
Start with
the news release Test helps improve optical efficiency from
Anritsu (UK), which we summarised at the time by saying "Antitsu's stressed eye measurement suite provides optical modules and transmission equipment with an instrument that reduces measurement times and increases efficiency".
A few weeks before,
we featured the news release USB-based instrument does six jobs in one from
Saelig Company: "Low-cost PC-based instrument combines scope, spectrum analyser, chart recorder, logic analyser, signal generator and pattern generator".
In October 2007, we covered the news from Spectrum Systementwicklung Microelectronic
concerning its PCI Express bus AWGs
- take a look at AWGs output any waveform
which says: "Each card in the AWG family can run as a signal and test pattern generator or they can be used via an internal synchronisation option together with one of the digitiser cards of Spectrum".
Take a look also at the news release from Yokogawa Europe - Test and Measurement, Optical instrumentation extends to XFP modules,
as well as Modules put optical transceivers to the test from Agilent Technologies Europe,
and Wizard suits packaging suite from Zuken.
See also:
Digital pattern generators have flexible outputs
(May 2007)
PC-compatible digital pattern generator boards feature up to 32Gbit memory, maximum clock rates of 40, 10 or 5MHz, and a choice of 16 or 32bit widths
Multiport enhancements for signal-integrity tester
(May 2007)
PLTS version 4.0 simplifies multiple-aggressor differential crosstalk measurements in high-speed backplanes, allows easy importation of 12-port S-parameter data and pinpoints the location of problems
Star Hub boosts number of instruments for a test
(May 2007)
The System Star Hub option for the UltraFast oscilloscope/digitiser, AWG and digital I/O and digital pattern generator PCI cards allows 270 cards to work in synch
64bit Vista expands scope of instrument cards
(April 2007)
Windows Vista 64 and 32bit drivers are compatible with all 150 PCI, PXI and CompactPCI cards in the UltraFast series
PC instruments go online for UK distribution
(March 2007)
Belgium-based Byte Paradigm has enlisted the help of Great Western Microsystems for product distribution and promotion in UK and Ireland
Diagnostics accelerate yield learning
(March 2007)
UMC has adopted Synopsys TetraMAX diagnostics to accelerate yield learning for designs that use the Synopsys DFT MAX scan compression automation solution
Pattern generators master jitter injection
(January 2007)
Design and test engineers can now quickly and accurately stimulate serial high-speed ports with all types of jitter, enabling higher-quality characterisation of device performance
Streaming system used on space station
(December 2006)
Cypress Semiconductor has announced that DVEO, the broadcast division of CMI, has selected Cypress's Serdes for its DVB Master FD PCI Card
Acquisition brings laser sources together
(November 2006)
Photonic Products has been acquired by StockerYale
Test pattern generator targets delay defects
(October 2006)
Automatic test pattern generation technology is designed to increase the quality of manufacturing tests by targeting small delay defects
Automatic test pattern generator accelerated
(September 2006)
Enhancements to the TetraMAX automatic test pattern generator result in a typical speedup of three times or more in runtime performance across all design styles
PC-based instruments upgrade to 64bit Windows
(September 2006)
Strategic Test Corporation has announced the new Windows XP Pro 64bit driver for its range of digitiser, AWG, fast digital I/O and digital pattern generator cards
Instruments gain free software and support
(July 2006)
Strategic Test Corp offers free software updates and technical support on all future purchases of the UltraFast range of digitiser, AWG, fast digital I/O and digital pattern generator cards
16bit microcontroller integrates more than ever
(February 2006)
The H8S/2378BF is the first 16bit microcontroller from Renesas Technology Europe to combine high CPU performance of 35MHz with 512Kbyte Flash in a compact 9 x 9mm CSP package
Maskless lithography system has table-top format
(January 2006)
The uPG101 is an extremely economical and easy to use micro pattern generator for direct write applications as well as low volume mask making
USB module boosts instrument data throughput
(January 2006)
The GP-22050 is a multipurpose PC-based USB 2.0 module used to stream data between a PC and an embedded or remote system
Cadence forms initiative with STARC
(November 2005)
Cadence Design Systems has announced a cooperative quality modelling initiative with the Semiconductor Technology Academic Research Centre (STARC)
USB pod hosts multiple instruments
(November 2005)
The GP-22050 Base is a bidirectional PC-based module that functions as a pattern generator, logic analyser/data logger and JTAG protocol generator
Scope software brings S-parameters to serial tests
(October 2005)
IConnect software runs on Tektronix TDS8200 series sampling oscilloscopes to provide engineers with a measurement-based performance characterisation of gigabit interconnects links and devices
Interface aids FBDIMM adoption
(October 2005)
The IN581AMB is the first device to include an interface between the high-speed serial interface and industry standard DDR2 SDRAM that is fully compliant with the JEDEC AMB specifications
Naval Research Lab takes to maskless lithography
(October 2005)
Heidelberg Instruments, , Heidelberg, Germany, announced the installation of a DWL66 maskless lithography system at the Naval Research Laboratory, Institute of Nanosciences, Washington DC, USA
Bit-error-rate tester targets 10Gbit/s systems
(August 2005)
A new compact, portable bit-error-rate tester is dedicated to high-speed measurements in the 10Gbit/s band
Simulator supports CameraLink development
(August 2005)
The CLS-211 CameraLink simulator is a high-performance video test pattern generator supporting all CameraLink configurations
Transmit-quality convertors use less power
(July 2005)
Analog Devices has developed a low-power generation of its industry-leading TxDAC transmit digital-to-analogue convertors
Optical system gains bit-error-rate tester
(July 2005)
Yokogawa has added a 10Gbit/s bit-error-rate tester to the range of modules available for the company's AQ2200 Series modular optical instrumentation system
Comprehensive testing for 10Gbit/s networks
(June 2005)
Yokogawa has introduced two compact, easy-to-use and economical instruments for 10Gbit/s bit-error-rate testing
Speedy 32bit MCU has time for industrial tasks
(February 2005)
The H8SX/1582F is the latest and fastest 32bit H8SX microcontroller from Renesas Technology
LED drivers for cellphones, smart phones
(November 2004)
National Semiconductor's family of LED integrated circuit drivers are specifically designed for sharper colours and superior brightness in lighting systems for portable handheld devices
LCD scalers hit volume production
(October 2004)
STMicroelectronics has confirmed availability in volume of the recently announced ADE3800 'Kona' family of LCD scaler chips
Pulse pattern generator gains global appeal
(June 2004)
LA Techniques has extended its range with the updated and improved LA19-01-03 pulse pattern generator
PC-based digital pattern generator has long memory
(April 2004)
Semiconductor and electronics test and design engineers now only need one instrument to produce digital signals for all common logic families
Taiwan order begins Asian market drive
(November 2003)
LA Techniques has won a major breakthrough order from Taiwan as part of its drive towards the Asian market
Portable pattern generator has HDTV covered
(October 2003)
The Model 1253 is a cost-effective portable multistandard HDTV pattern generator
Speciality devices speed Camera Link development
(September 2003)
Vivid Engineering has introduced a family of Camera Link specialty products to aid vision professionals in the development, test and integration of CameraLink based components and systems