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Electronics Manufacturing Quality Assurance
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Labels warn of water intrusion
Water indicating label material provides clear evidence of water intrusion for control of invalid warranty claims, failure analysis, design assistance and service and repair troubleshooting. Brochure available
News from Brady Corporation (31 January 2006)
LEDs shed new light on AOI systems
New LED lighting systems add to the versatility of the Schneider and Koch LaserVision AOI system in production applications.
News from Rohde and Schwarz (13 January 2006)
Wafer metrology tool offers atomic layer accuracy
A new nondestructive nanotechnology weight metrology tool handles high-volume production of 300mm semiconductor wafers.
News from Metryx (11 January 2006)
Weight metrology tool keeps wafers honest
A novel nanotechnology weight metrology tool offers atomic layer measurement accuracy and is designed to handle the demands of volume production environments.
News from Metryx (15 December 2005)
Tests prove RoHS compliance
Brady has been conducting exhaustive testing of its products to ensure that all materials are compliant with RoHS legislation. Brochure available
News from Brady Corporation ( 9 December 2005)
Solder inspection use machine vision techniques
Industrial Vision Systems has created a generic machine concept for PCB manufacturers to allow robust solder inspection for a fraction of the price of some of the larger AOI machines on the market.
News from Industrial Vision Systems Ltd (28 November 2005)
Air blowers promise local static elimination
Two new benchtop ionising air blowers offer easily portable localised static elimination.
News from TBA Electro Conductive Products (18 November 2005)
PoP dummy component introduced at Productronica
Practical Components is to introduce the new Amkor Technology PSvfBGA (PoP) to its extensive line of dummy components at the 2005 Productronica Exibition in Munich, Germany, Hall A4 Stand 480.
News from Practical Components (14 November 2005)
AOI system installed for lead-free production
User application article Contax has installed the first Omron VT-RNS automated optical inspection (AOI) system at leading UK contract electronics manufacturer Axiom Manufacturing Services.
News from Contax (10 November 2005)
WEEE compliance: is RFID tagging the answer?
Technical background article IDC Managing Director Kevin Buckley discusses the issues involved in using RFID tagging to achieve compliance with the WEEE Directive. Brochure available
News from IDC - Intelligent Distributed Controls ( 1 November 2005)
Productronica launchpad for novel X-ray system
Phoenix X-ray will be launching its new Micromex high-resolution X-ray inspection system at Productronica 2005.
News from Contax (25 October 2005)
Logger helps get exhibition demo up and running
User application article The SolderStar datalogger solved a tricky Pb-free process profiling problem at the recent Forum De L'Electronique exhibition in France.
News from SolderStar (21 October 2005)
Inspection system checks for cracked joints
User application article To improve the quality of the solder joint evaluation reports it provides to its customers in the electronics industry, Tin Technology has invested in new digital imaging technology from Nikon. Brochure available
News from Nikon UK (17 October 2005)
Wafer inspection system zaps out faulty chips
A new low cost wafer inspection system enables electronic component manufacturers producing ceramic or silicon wafers to automatically inspect each wafer optically for faults.
News from Envisage Systems ( 7 October 2005)
Illuminated magnifiers are ESD protected
High quality illuminated magnifiers providing appropriate lighting for the task in hand are a vital requirement for many manual assembly, craft and inspection tasks. Brochure available
News from Waldmann Lighting ( 5 October 2005)
Weight metrology proves popular in wafer fabs
Metryx has won orders worth up to $4 million for its revolutionary Mentor high-throughput simple-to-use nondestructive metrology tool that offers atomic layer measurement accuracy.
News from Metryx (29 September 2005)
AOI system promises rock-solid performance
The Vi-3K2 PCB AOI system determines the presence and absence of components, confirms their value and polarity, checks solder joints and bridges and provides feedback to ensure placement accuracy. Brochure available
News from Kaisertech (27 September 2005)
Improved version of PCB inspection system on show
Omron AOI is planning to launch its desktop printed circuit board inspection solution, the VT-RNS-pt Hi-Performance model, at Productronica this year.
News from Omron AOI (26 September 2005)
System stops static damage to RFID chips
A novel static elimination system is specifically designed to protect manufacturing operations for RFID tags and labels.
News from Fraser Anti-Static Techniques (19 September 2005)
Website features practical RoHS support tools
Manufacturers looking to design or modify their products to comply with the latest RoHS Directive can now access an array of practical support tools from 3M's electronics and communications business.
News from 3M Electronic Materials (16 September 2005)
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