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Electronics Manufacturing Quality Assurance
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Data logger optimises solar cell production
A temperature profiling system based on the new Q18 data logger enables solar cell manufacturers to improve production quality and throughput.
News from Datapaq (16 August 2007)
Package rework system provides controlled heating
The APR-5000-DZ has a dual-convection bottom-side heater that enables faster rework while controlling the temperature to levels required by component and material manufacturers' specifications. Brochure available
News from OK International (14 August 2007)
Imaging system finds fault with ICs and small PCBs
The Micro thermal imaging system includes several important hardware components that are essential when analysing or troubleshooting semiconductor devices.
News from OptoTherm (10 August 2007)
AOI system saves space on the desktop
Small-footprint desktop AOI system supports comprehensive inspection of PCBs, including SMT and THT components, reflow and wave solder joints and solder paste.
News from Marantz Europe (17 July 2007)
AOI machine spots more defects in 24bit colour
Automatic optical inspection system provides fast programming, reliable detection and true 24/7 operation - all on a single inline machine platform.
News from Marantz Europe (28 June 2007)
Software upgrades AOI setup
Updated component library software promises dramatic improvements in AOI setup time and product programming efficiency.
News from Marantz Europe (26 June 2007)
Benchtop AOI system finds fault with larger PCBs
Benchtop automatic optical inspection system is billed as a breakthrough in its ability to handle large board sizes up to 650 x 550mm.
News from Marantz Europe (21 June 2007)
Automated optical inspection deal renewed
Nylund will continue to be responsible for the sales and service of Marantz products in the territories of Finland and Estonia.
News from Marantz Europe (15 June 2007)
Chinese distribution for dummies
Practical Components has appointed Kasion Automation as the exclusive distributor of its products in the People's Republic of China.
News from Practical Components (12 June 2007)
BGA inspection system takes a closer look
A three-stage upgrade enhances the performance and usability of the award winning Ersascope BGA inspection system.
News from Blundell Production Equipment (31 May 2007)
IR camera aids in MEMS device characterisation
User application article High-resolution infra-red camera system provides detailed information as to the static and dynamic thermal behaviour of MEMS structures. Brochure available
News from Cedip Infrared Systems (18 May 2007)
Evaluation systems assess assembly reliability
Ion migration and lead free solder evaluation systems address problems with high density assemblies using lead free solder.
News from Unitemp ( 3 May 2007)
Profiling tools to be demonstrated at Nepcon
SolderStar will show its latest hardware and software tools for assembly process temperature profiling at the Nepcon UK 2007 show in Birmingham.
News from SolderStar ( 3 May 2007)
Nepcon launch for upgraded solderability tester
Solderability tester performs all forms of solderability tests in accordance with all major international standards.
News from Gen3 Systems ( 1 May 2007)
Colour adds extra dimension to optical inspection
Desktop AOI system for small volume manufacturing can be used as an offline test station or repair station. Brochure available
News from Goepel Electronic (30 April 2007)
Ionisation goes hands-free in clean rooms
New from Meech International is the Model 200 proximity sensor switching system for use with its Series 200 range of ionising nozzles. Brochure available
News from Meech International (16 April 2007)
Directors accelerate global business development
Mark Berry has been appointed North America and Europe Business Director, and Gary Ditmer has joined Metryx as Asia Business Director.
News from Metryx (13 April 2007)
Logger is made for process profiling
Data logger is specially designed to profile all the thermal processes found in the electronics assembly industry.
News from Datapaq (10 April 2007)
Upgrade for X-ray joint inspection
Submicron high-resolution X-ray system for manual and automatic solder joint inspection is enhanced with new inspection software
News from Contax (30 March 2007)
Benchtop system inspects 100,000 an hour
An advanced benchtop automated optical inspection system can handle boards up to 650 x 550mm and inspect 100,000 components per hour.
News from Marantz Europe (28 March 2007)
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