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    <title>Electronics Manufacturing Quality Assurance latest news on Electronicstalk</title>
    <link>http://www.electronicstalk.com/indexes/categorybrowsemq.html</link>
    <description>Electronics Manufacturing Quality Assurance latest news on Electronicstalk</description>
    <language>en-gb</language>
    <copyright>Copyright (C)2008 Pro-Talk Ltd. All rights reserved.</copyright>
    <pubDate>Thu, 15 May 2008 08:00:00 UT</pubDate>
    <lastBuildDate>Thu, 15 May 2008 08:00:00 UT</lastBuildDate>
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    <item>
      <title>Static electricity: causes and cures</title>
      <description>Free 24-page page colour booklet includes information on what static is, how it occurs and the methods available for its control.</description>
      <pubDate>Thu, 15 May 2008 08:00:00 UT</pubDate>
      <category>Meech International</category>
      <link>http://www.electronicstalk.com/news/mee/mee112.html</link>
    </item>
    <item>
      <title>Inspection system looks down via holes</title>
      <description>Turntable provides the operator with complete hands-free viewing, allowing plenty of distance from the microscope to carry out any rework that might be required.</description>
      <pubDate>Tue, 13 May 2008 08:00:00 UT</pubDate>
      <category>Special Application Products</category>
      <link>http://www.electronicstalk.com/news/sci/sci103.html</link>
    </item>
    <item>
      <title>Strips provide long-term shielding</title>
      <description>Fingerstock BeCu shielding strips are available in a range of mounting styles including clip-on, stick-on, snap-on, special mounting products, low profile and hook-on gaskets and connector gaskets. </description>
      <pubDate>Mon, 05 May 2008 08:00:00 UT</pubDate>
      <category>TBA Electro Conductive Products</category>
      <link>http://www.electronicstalk.com/news/tba/tba144.html</link>
    </item>
    <item>
      <title>PCB assemblies analysed while you wait</title>
      <description>Fast-turnaround inspection service using the Dage XiDAT 7600 X-ray inspection system provides quality assurance data on BGA mounting and other production issues.</description>
      <pubDate>Tue, 29 Apr 2008 08:00:00 UT</pubDate>
      <category>Soldertec Global</category>
      <link>http://www.electronicstalk.com/news/soe/soe123.html</link>
    </item>
    <item>
      <title>X-ray system provides improved diagnostics</title>
      <description>Contract electronics manufacturer ACW Technology enhances its quality control procedures with the latest hardware and software from Phoenix X-Ray.</description>
      <pubDate>Mon, 14 Apr 2008 08:00:00 UT</pubDate>
      <category>Contax</category>
      <link>http://www.electronicstalk.com/news/cnt/cnt200.html</link>
    </item>
    <item>
      <title>AOI platform caters for shrinking assemblies</title>
      <description>The Agilent Medalist sj5000 can inspect even the smallest 01005 components, with no compromise in speed and resolution.</description>
      <pubDate>Wed, 02 Apr 2008 08:00:00 UT</pubDate>
      <category>Agilent Technologies Europe</category>
      <link>http://www.electronicstalk.com/news/agn/agn287.html</link>
    </item>
    <item>
      <title>Analyser keeps watch over solder paste quality</title>
      <description>The G3 SPA 1000 is designed to help OEMs avoid offshore solder paste defect issues by providing quantitative data of solder paste quality on a manufacturer's line.</description>
      <pubDate>Thu, 27 Mar 2008 08:00:00 UT</pubDate>
      <category>Gen3 Systems</category>
      <link>http://www.electronicstalk.com/news/cyx/cyx105.html</link>
    </item>
    <item>
      <title>Stereo microscope spots more with LED illumination</title>
      <description>The Lynxx provides a full 360-degree view around the components for 34-degree angled inspection of corners that can often be hard to reach by usual stereo inspection methods.</description>
      <pubDate>Tue, 25 Mar 2008 08:00:00 UT</pubDate>
      <category>Vision Engineering</category>
      <link>http://www.electronicstalk.com/news/vis/vis116.html</link>
    </item>
    <item>
      <title>Pocket-sized device spots static electricity</title>
      <description>An integral distance meter provides a clear indication of the correct operating range, meaning that all readings will be both accurate and consistent. </description>
      <pubDate>Wed, 19 Mar 2008 08:00:00 UT</pubDate>
      <category>Meech International</category>
      <link>http://www.electronicstalk.com/news/mee/mee111.html</link>
    </item>
    <item>
      <title>Thermal imaging spots faults on PCBs</title>
      <description>Complete package for PCB assembly and electronics testing includes all necessary hardware, software, a camera stand and an I/O relay module.</description>
      <pubDate>Wed, 19 Mar 2008 08:00:00 UT</pubDate>
      <category>OptoTherm</category>
      <link>http://www.electronicstalk.com/news/opr/opr105.html</link>
    </item>
    <item>
      <title>Thermal profiling aids process efficiency</title>
      <description>Compact unit provides a high data sampling rate, greater memory capacity and excellent data precision.</description>
      <pubDate>Mon, 17 Mar 2008 08:00:00 UT</pubDate>
      <category>Link Hamson</category>
      <link>http://www.electronicstalk.com/news/lik/lik104.html</link>
    </item>
    <item>
      <title>Wave solder analyser in improved</title>
      <description>System now directly measures the key process parameter of printed circuit board wave solder immersion depth.</description>
      <pubDate>Thu, 13 Mar 2008 08:00:00 UT</pubDate>
      <category>SolderStar</category>
      <link>http://www.electronicstalk.com/news/emb/emb114.html</link>
    </item>
    <item>
      <title>X-ray inspection speeds board quality control</title>
      <description>The Agilent x6000 finds defects in solder joints, resulting in higher end product quality and lower warranty repair and scrap costs. </description>
      <pubDate>Tue, 05 Feb 2008 08:00:00 UT</pubDate>
      <category>Agilent Technologies Europe</category>
      <link>http://www.electronicstalk.com/news/agn/agn270.html</link>
    </item>
    <item>
      <title>XRF analyser needs only a small sample</title>
      <description>With its high-resolution detector, the X-Strata980 makes it easier to identify, quantify and differentiate neighbouring elements.</description>
      <pubDate>Tue, 05 Feb 2008 08:00:00 UT</pubDate>
      <category>Oxford Instruments Industrial Analysis</category>
      <link>http://www.electronicstalk.com/news/oxd/oxd101.html</link>
    </item>
    <item>
      <title>AOI machines boost reliability and improve design</title>
      <description>Building Block Video and Prima Electronic Services are two of nine UK and Ireland organisations to have purchased Omron AOI systems from Contax.</description>
      <pubDate>Fri, 11 Jan 2008 08:00:00 UT</pubDate>
      <category>Contax</category>
      <link>http://www.electronicstalk.com/news/cnt/cnt195.html</link>
    </item>
    <item>
      <title>Entry-level AOI machine takes a balanced view</title>
      <description>Novel benchtop automatic optical inspection machine strikes a balance between preventing "escapes" maintaining a low "false defects" rate.</description>
      <pubDate>Tue, 27 Nov 2007 08:00:00 UT</pubDate>
      <category>Marantz Europe</category>
      <link>http://www.electronicstalk.com/news/moq/moq107.html</link>
    </item>
    <item>
      <title>Optical inspection uses intelligent detection</title>
      <description>The latest version of the successful OptiCon AdvancedLine inline AOI system features an increase in test speed by up to 30%.</description>
      <pubDate>Fri, 23 Nov 2007 08:00:00 UT</pubDate>
      <category>Goepel Electronic</category>
      <link>http://www.electronicstalk.com/news/gpe/gpe162.html</link>
    </item>
    <item>
      <title>Surveyor keeps watch over oven performance</title>
      <description>Package eliminates the use of expensive test boards while providing an accurate analysis of process performance.</description>
      <pubDate>Fri, 16 Nov 2007 08:00:00 UT</pubDate>
      <category>Datapaq</category>
      <link>http://www.electronicstalk.com/news/dpa/dpa102.html</link>
    </item>
    <item>
      <title>Optical inspection innovations in Munich</title>
      <description>AOI for post-reflow inspection is designed on a flexible platform that is easy to use, helping manufacturers keep pace with the fast-changing demands of surface mount technology.</description>
      <pubDate>Wed, 07 Nov 2007 08:00:00 UT</pubDate>
      <category>Agilent Technologies Europe</category>
      <link>http://www.electronicstalk.com/news/agn/agn249.html</link>
    </item>
    <item>
      <title>Microscope eases PCB inspection</title>
      <description>LED illumination projects bright white, long-life illumination on the PCB. </description>
      <pubDate>Wed, 24 Oct 2007 08:00:00 UT</pubDate>
      <category>Vision Engineering</category>
      <link>http://www.electronicstalk.com/news/vis/vis115.html</link>
    </item>
    <item>
      <title>Automated system monitors light</title>
      <description>Vistec's LMS IPRO4 is a fully automated mask metrology system, capable of measuring registration (overlay on reticles) as well as critical dimensions (CD) in transmitted and reflected light.</description>
      <pubDate>Wed, 10 Oct 2007 08:00:00 UT</pubDate>
      <category>Vistec Semiconductor Systems</category>
      <link>http://www.electronicstalk.com/news/vim/vim114.html</link>
    </item>
    <item>
      <title>Small datalogger aids thermal profiling</title>
      <description>The datalogger attaches by way Solderstar's Smartlink system to a range of adapters which provide between six and 16 measurement channels in a variety of configurations.</description>
      <pubDate>Fri, 05 Oct 2007 08:00:00 UT</pubDate>
      <category>SolderStar</category>
      <link>http://www.electronicstalk.com/news/emb/emb113.html</link>
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