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ATE Systems
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CD guide explains semiconductor testing
The CD that also includes a large variety of semiconductor test application information such as applications notes, white papers and presentations. Brochure available
News from Keithley Instruments ( 9 May 2008)
Harness testers add hipot for safety
Harness testers include the capability of high-voltage testing for insulation resistance up to 1Gohm and dielectric withstand up to 1500V DC.
News from Dynalab Test Systems ( 9 May 2008)
Guide covers switching fundamentals
The handbook is free and discusses topics such as the switching function and switching components, issues in switch system design, switch configurations by signal type and applications. Brochure available
News from Keithley Instruments ( 8 May 2008)
Characterisation software addresses wafer level
Reliability test and data analysis tools allow ACS-based test systems to produce lifetime predictions as much as five times faster than traditional WLR test solutions. Brochure available
News from Keithley Instruments ( 1 May 2008)
Automated test summit to have global coverage
The Automated Test Summit 2008 will be hosted live online on 5th June 2008, and will be presented in the Americas, Europe and Asia. Brochure available
News from National Instruments (30 April 2008)
Memory test system handles 128 devices
The T5503 tester's semiconductor circuitry makes full use of the latest CMOS technology to achieve greater packaging density.
News from Advantest (Europe) (24 April 2008)
Signal-conditioning devices tested for integrity
User application article Test system provides low cost of test and supports a full range of digital, mixed-signal, RF and wireless applications.
News from Verigy ( 8 April 2008)
Flying-probe tester tackles boards from both sides
The Pilot V8 has 14 mobile resources fully available to test the UUT, with a full range of in-circuit and functional test capabilities.
News from Seica (31 March 2008)
Research partnership targets wireless technologies
IMC and Keithley will work together on joint research projects to expand existing applications as well as research emerging wireless applications and technologies. Brochure available
News from Keithley Instruments (28 March 2008)
Tester and handlers speed device testing
Eagle Test's 200T/FT Series offers the industry's most complete final test solution for discrete devices.
News from Eagle Test Systems (24 March 2008)
Test technology takes boundary scan a step further
Novel limited access technique for in-circuit testing eliminates the need for physical test points, offering benefits that traditional vectorless testing cannot provide.
News from Agilent Technologies Europe (21 March 2008)
Boundary scan verifies audio console quality
User application article DiGiCo uses boundary-scan test to verify the assembly of the 10-layer surface-mount PCB at the heart of its audio mixing consoles. Brochure available
News from JTAG Technologies (12 March 2008)
Development system eases PCB debugging
User application article The XJTAG system has been used by engineers at Curtiss-Wright's video and graphics group in Letchworth, UK, to debug and test its latest range of printed circuit boards.
News from XJTAG (11 March 2008)
Partnership provides chip quality boost
The co-operation between Q-Star Test and Source III has already led to the establishment of a push-button automated WGL-based VTRAN flow.
News from Q-Star Test (26 February 2008)
Powerful ATE turns to battery reliability
Intepro has developed an automatic test system designed to test batteries by performing charge and discharge cycles while monitoring key battery parameters in real time.
News from Intepro UK (19 February 2008)
Novel approach to in-circuit testing
Technology is a hybrid between two established test methodologies in today's electronic manufacturing test environment: boundary scan and VTEP vectorless testing.
News from Agilent Technologies Europe (18 February 2008)
Test cell wins industry recognition
Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
News from Advantest (Europe) (25 January 2008)
Software upgrade brings new semiconductor options
Keithley's Automated Characterisation Suite, V3.2 contains ready to run applications for its 4200-SCS, 2600 System SourceMeter instruments and other SMU-based systems. Brochure available
News from Keithley Instruments (11 January 2008)
ATE system adds boundary scan option
The addition of boundary scan offers 5800 Series users the advantage of structural device, board and system-level test access throughout the whole product lifecycle.
News from Aeroflex (16 November 2007)
In-circuit tester handles two PCBs at once
Manufacturers can perform simultaneous testing of two PCBs, effectively doubling their test throughput without doubling capital equipment costs.
News from Teradyne (15 November 2007)
Boundary-scan controller suits laptop use
The JT 3705/USB can be used for structural board testing or in-system device programming (ISP) of CPLDs and flash memories. Brochure available
News from JTAG Technologies ( 9 November 2007)
Functional tester is made for auto makers
Functional test system helps accelerate test-solution development and deployment, helping automotive manufacturers get their products to market faster.
News from Agilent Technologies Europe ( 1 November 2007)
JTAG tester cuts costs for ARM-based board makers
Mixed-signal, concurrent 1149.1/JTAG and CPU emulation based functional tests are combined in a single platform for testing up to 32 PCBs at a time.
News from Intellitech Corp ( 1 November 2007)
RF test system provides high throughput
The 12GWSGA RF module is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market.
News from Advantest (Europe) (19 October 2007)
eDRAM tester supports new options
Embedding large blocks of DRAM into SoCs creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS.
News from LogicVision Europe (17 October 2007)
RF test system suits communications equipment
Keithley Instruments has released a 4X4 MIMO (multiple-input, multiple-output) RF test system for R and D and production testing of next generation RF communications equipment and devices. Brochure available
News from Keithley Instruments (10 October 2007)
System provides easy CV measurements
Keithley Instruments' 4200-CVU instrument is designed for the company's 4200-SCS semiconductor characterisation system. Brochure available
News from Keithley Instruments (10 October 2007)
PSU tester eases integration using LXI
LXI-based power supply test system addresses the growing market for AC/DC and DC/DC power convertors under 1000W in one single-bay cabinet.
News from Intepro UK (21 September 2007)
Test system eases custom configuration
Platform provides basis for custom military and aerospace test equipment using drag-and-drop system creation and modification.
News from Agilent Technologies Europe (19 September 2007)
System switch handles high channel counts
The series 3700 system switch/multimeter solutions offer scalable, high-performance switching and multi-channel measurements, optimised for automated testing of electronic products and components. Brochure available
News from Keithley Instruments (17 September 2007)
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