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ATE Systems
Archive page 16 of 16
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Advantest reports sales up a third
Advantest Europe closed its fiscal year 2000 on the 31st March 2001 with healthy results, and is confident about the future despite the industry slump.
News from Advantest (Europe) (12 July 2001)
Visual Basic speeds custom PSU test generation
Users of Schaffner's market-leading power supply ATE systems can now create their own custom test sequences in minutes using the PowerStar 5 Test Development Kit. Brochure available
News from Schaffner EMC ( 3 July 2001)
Flash tester runs up to 128 devices at a time
With the ability to simultaneously test up to 128 devices, Advantest reckons its T5771 front-end Flash memory test system is a low-cost solution for achieving higher test throughput.
News from Advantest (Europe) (29 June 2001)
Memory test system more than doubles its speed
The Advantest T5375 memory test system is capable of testing up to 128 devices simultaneously at speeds of either 143 or 286MHz DDR.
News from Advantest (Europe) (20 June 2001)
IFR bases ATE Division in Stevenage
IFR Systems has opened a new European HQ for its Automatic Test Equipment (ATE) Division at Pin Green, Stevenage, UK.
News from IFR Systems (19 June 2001)
Low-frequency high-performance analogue ATE
Teradyne has released its BBAC instrumentation for low-frequency high-performance analogue testing of broadband devices such as converters, xDSL and CDMA.
News from Teradyne ( 5 June 2001)
Catalyst system selected for the Alba Centre
Test Advantage has purchased a Teradyne Catalyst test system to support its SoC and mixed-signal device test development, preproduction and educational activities.
News from Teradyne (24 May 2001)
Silicon Vision comes to Teradyne for sensor tester
Silicon Vision has purchased a Teradyne IP750 image sensor test system for multisite testing of CCD and CMOS image sensor devices.
News from Teradyne (14 May 2001)
Tality helps Advantest to Bluetooth solution
Tality Corp, a subsidiary of Cadence Design Systems, is collaborating in the development of Advantest's Bluetooth Protocol Tester.
News from Advantest (Europe) (11 May 2001)
LCD driver test system doubles throughput
Addressing a surge in demand for liquid crystal displays, the Advantest T6371 offers twice the throughput offered by previous test systems.
News from Advantest (Europe) (11 May 2001)
Advantest joins LogicVision Ready Partner Program
LogicVision and Advantest are to develop and market products that will link LogicVision's Embedded Test Solutions with Advantest's automatic test equipment.
News from LogicVision Europe (11 May 2001)
Machine vision makes PSU ATE run even faster
The fast measuring speed of the Intepro 9000 series ATE from Schaffner EMC Ltd can now be complemented with the addition of an advanced machine vision system. Brochure available
News from Schaffner EMC ( 8 May 2001)
Improved performance for VLSI and SoC testing
The Teradyne J973EP VLSI test system made its first appearance in Europe at Semicon Europa.
News from Teradyne ( 4 May 2001)
STATS adds European angle to test development
ST Assembly Test Services (STATS) has opened a new UK test development centre (TDC) as part of its strategy to expand worldwide engineering support for customers.
News from ST Assembly Test Services (19 April 2001)
Short-term rental for Teradyne ATE kit
Teradyne and TSL have jointly announced a new ATE rental initiative to address the growing need of the electronic manufacturing services (EMS) sector for short-term access to test equipment.
News from Teradyne ( 6 April 2001)
AOI system sees all solder faults on the dark side
Teradyne reckons its Optima 7350 Post-Solder Bottomside AOI System is the industry's only bottomside automated inspection system for full solder defect coverage.
News from Teradyne ( 6 April 2001)
Schaffner adds ATLAS to power-supply ATE
Schaffner has developed a full suite of bridge software to allow military and avionics users of its power-supply ATE systems to program tests in ATLAS (Abbreviated Test Language for All Systems). Brochure available
News from Schaffner EMC (11 January 2001)
DT Vision Foundry wins "Best in Test" award
Test and Measurement World has chosen Data Translation's machine vision solution DT Vision Foundry 2.5 as one of twelve winners of the "Best in Test" Award for 2000.
News from Data Translation ( 2 January 2001)
Yelo acquired by Mindready Solutions
Mindready Solutions Inc, a subsidiary of nurun Inc, has acquired Yelo, the supplier of the TestPoint low cost test system, based in Carrickfergus, Northern Ireland.
News from Yelo ( 6 November 2000)
IEE President visits ATE systems manufacturer
The President of the Insititution of Electrical Engineers, Dr Malcolm Kennedy, recently visited Yelo to tour the factory and meet key staff.
News from Yelo (14 March 2000)
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