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ATE Systems
Archive page 15 of 16
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Testforce takes Mindready into Canada
Mindready Solutions (NI) has signed a distribution agreement with Testforce Systems as its Canadian representative.
News from Mindready Solutions (NI) (24 December 2001)
Dynamic test handler takes up to eight SoCs
Advantest's M4541AD is a dynamic test handler capable of testing up to eight SoCs or other logic devices simultaneously - twice the capacity of its predecessor.
News from Advantest (Europe) (21 December 2001)
LogicVision to boost reliability of MoSys 1T-SRAM
LogicVision and MoSys are collaborating to qualify and deliver embedded test and built-in repair analysis for the MoSys 1T-SRAM family of high-density embedded memories.
News from LogicVision Europe (19 December 2001)
Advantest pulls itself together
Advantest has restructured and optimised its European operations.
News from Advantest (Europe) ( 4 December 2001)
Technology partnership creates novel RF ATE
Keithley Instruments has entered into a technology partnership with Anritsu that provides technical and marketing support for each other's products used in semiconductor parametric testing. Brochure available
News from Keithley Instruments ( 4 December 2001)
Video-speed ATE boasts audio-grade performance
Advantest has released wideband video frequency generator (WVFG) and wideband video frequency digitiser (WVFD) units for its T6673/T6683 SoC test systems.
News from Advantest (Europe) (27 November 2001)
PCB impedance testing joins the production line
Polar Instruments has launched RITS520a, the first turnkey system to offer reliable, repeatable, automated controlled impedance testing of 22 x 24in PCBs and coupons in a production environment.
News from Polar Instruments (20 November 2001)
Laser diodes come under closer scrutiny
Keithley Instruments has updated its L-I-V (light-current-voltage) test systems for testing laser diode modules (LDMs). Brochure available
News from Keithley Instruments (12 November 2001)
More functions for test software
The Peak Group has introduced a number of new features to its TestMaster suite of programs, adding comprehensive display, reporting, database, analysis and communications capabilities.
News from Peak Production Equipment ( 8 November 2001)
Teradyne completes GenRad acquisition
Teradyne has completed its acquisition of GenRad, following approval by GenRad shareholders and US regulatory bodies.
News from Teradyne ( 6 November 2001)
Switching handbook aids test system integration
Keithley Instruments has published the latest edition of its switching handbook. Brochure available
News from Keithley Instruments (25 October 2001)
Advantest hits the New York market
Advantest Corp listed and began trading its American Depositary Receipts (ADRs) on the New York Stock Exchange last week.
News from Advantest (Europe) (17 October 2001)
Grapy is new Teradyne field operations manager
Charles Grapy has been appointed Field Operations Manager for Semiconductor Test Europe at Teradyne.
News from Teradyne ( 9 October 2001)
DC and RF come together in a single ATE
New from Keithley Instruments is a single-insertion RF and DC parametric test solution for probing communications and high-speed digital wafer devices. Brochure available
News from Keithley Instruments (25 September 2001)
Maruyama becomes president and COO at Advantest
Advantest has named Toshio Maruyama as its new president and COO.
News from Advantest (Europe) (23 August 2001)
Card integrates DC, RF and optical measurements
New from Keithley Instruments, the Model 7090 optical switching card enables optical, DC and RF switching all within one instrument. Brochure available
News from Keithley Instruments (23 August 2001)
Online experience of automated optical inspection
Teradyne has released wht it describes as an "online interactive product experience module", or PEM, to promote its Optima 7000 Series of automated optical inspection systems.
News from Teradyne ( 7 August 2001)
Advantest promotes European Sales Manager
Advantest has promoted Michael Stichlmair (38) to Sales Manager of Automatic Test Systems at Advantest (Europe).
News from Advantest (Europe) ( 2 August 2001)
Testers boost mixed-signal SoC throughput
Advantest has released two new test systems aimed at mixed-signal SoCs: the T6683 has a top speed of 1GHz and up to 2048 test pins; the T6673 runs at up to 500MHz with a maximum of 1024 test pins
News from Advantest (Europe) (19 July 2001)
A second look at automated optical inspection kit
alternativeSMT, the supplier of second-user surface-mount assembly machines for electronics manufacturing, has expanded into the area of automated optical inspection.
News from alternativeSMT (13 July 2001)
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