ATE Systems
(a sub category of Test and Measurement)
A - Z list of suppliers
Click on a letter below to find a supplier...
Latest articles from 'ATE Systems'
News releases from this sub-category
Showing 51-75 of 394 articles
Flying-probe tester tackles boards from both sides
The Pilot V8 has 14 mobile resources fully available to test the UUT, with a full range of in-circuit and functional test capabilities.
News from Seica, Mar 31, 2008
Research partnership targets wireless technologies
IMC and Keithley will work together on joint research projects to expand existing applications as well as research emerging wireless applications and technologies.
News from Keithley Instruments, Mar 28, 2008
Tester and handlers speed device testing
Eagle Test's 200T/FT Series offers the industry's most complete final test solution for discrete devices.
News from Eagle Test Systems, Mar 24, 2008
Test technology takes boundary scan a step further
Novel limited access technique for in-circuit testing eliminates the need for physical test points, offering benefits that traditional vectorless testing cannot provide.
News from Agilent Technologies Europe, Mar 21, 2008
Boundary scan verifies audio console quality
DiGiCo uses boundary-scan test to verify the assembly of the 10-layer surface-mount PCB at the heart of its audio mixing consoles.
News from JTAG Technologies, Mar 12, 2008
Development system eases PCB debugging
The XJTAG system has been used by engineers at Curtiss-Wright's video and graphics group in Letchworth, UK, to debug and test its latest range of printed circuit boards.
News from XJTAG, Mar 11, 2008
Partnership provides chip quality boost
The co-operation between Q-Star Test and Source III has already led to the establishment of a push-button automated WGL-based VTRAN flow.
News from Q-Star Test, Feb 26, 2008
Powerful ATE turns to battery reliability
Intepro has developed an automatic test system designed to test batteries by performing charge and discharge cycles while monitoring key battery parameters in real time.
News from Intepro UK, Feb 19, 2008
Novel approach to in-circuit testing
Technology is a hybrid between two established test methodologies in today's electronic manufacturing test environment: boundary scan and VTEP vectorless testing.
News from Agilent Technologies Europe, Feb 18, 2008
Test cell wins industry recognition
Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
News from Advantest (Europe), Jan 25, 2008
Software upgrade brings new semiconductor options
Keithley's Automated Characterisation Suite, V3.2 contains ready to run applications for its 4200-SCS, 2600 System SourceMeter instruments and other SMU-based systems.
News from Keithley Instruments, Jan 11, 2008
ATE system adds boundary scan option
The addition of boundary scan offers 5800 Series users the advantage of structural device, board and system-level test access throughout the whole product lifecycle.
News from Aeroflex, Nov 16, 2007
In-circuit tester handles two PCBs at once
Manufacturers can perform simultaneous testing of two PCBs, effectively doubling their test throughput without doubling capital equipment costs.
News from Teradyne, Nov 15, 2007
Boundary-scan controller suits laptop use
The JT 3705/USB can be used for structural board testing or in-system device programming (ISP) of CPLDs and flash memories.
News from JTAG Technologies, Nov 9, 2007
Functional tester is made for auto makers
Functional test system helps accelerate test-solution development and deployment, helping automotive manufacturers get their products to market faster.
News from Agilent Technologies Europe, Nov 1, 2007
JTAG tester cuts costs for ARM-based board makers
Mixed-signal, concurrent 1149.1/JTAG and CPU emulation based functional tests are combined in a single platform for testing up to 32 PCBs at a time.
News from Intellitech Corp, Nov 1, 2007
RF test system provides high throughput
The 12GWSGA RF module is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market.
News from Advantest (Europe), Oct 19, 2007
eDRAM tester supports new options
Embedding large blocks of DRAM into SoCs creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS.
News from LogicVision Europe, Oct 17, 2007
RF test system suits communications equipment
Keithley Instruments has released a 4X4 MIMO (multiple-input, multiple-output) RF test system for R and D and production testing of next generation RF communications equipment and devices.
News from Keithley Instruments, Oct 10, 2007
System provides easy CV measurements
Keithley Instruments' 4200-CVU instrument is designed for the company's 4200-SCS semiconductor characterisation system.
News from Keithley Instruments, Oct 10, 2007
PSU tester eases integration using LXI
LXI-based power supply test system addresses the growing market for AC/DC and DC/DC power convertors under 1000W in one single-bay cabinet.
News from Intepro UK, Sep 21, 2007
Test system eases custom configuration
Platform provides basis for custom military and aerospace test equipment using drag-and-drop system creation and modification.
News from Agilent Technologies Europe, Sep 19, 2007
System switch handles high channel counts
The series 3700 system switch/multimeter solutions offer scalable, high-performance switching and multi-channel measurements, optimised for automated testing of electronic products and components.
News from Keithley Instruments, Sep 17, 2007
Attenuator/switch drivers ease validation
Agilent's 11713B and 11713C attenuator/switch drivers allow quick, easy design validation and automated testing.
News from Agilent Technologies Europe, Sep 12, 2007
Platform allows fast digital testing
The R and S TS-PHDT high-speed digital test module features a maximum data rate of 40MHz and a storage capacity of 1.5Gbyte.
News from Rohde and Schwarz, Aug 31, 2007
Not what you're looking for? Search the site.
