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Corelis is ready to work with LogicVision

LogicVision and Corelis have expanded their partnership and will integrate LogicVision's Embedded Test solution for board and diagnostic technology with Corelis Scan Plus boundary scan test system.

News from LogicVision Europe ( 9 April 2002)

LogicVision adds credence to SoC testing

Credence Systems Corp has integrated its Quartet Series testers with LogicVision's Embedded Test solution's access technology.

News from LogicVision Europe ( 9 April 2002)

Embedded test technology boosts SoC throughput

LogicVision has successfully integrated its embedded test technology into Advantest's T6000 series testers to provide faster test and diagnosis of complex SoC devices.

News from LogicVision Europe ( 8 April 2002)

Inspection solutions on show in Shanghai

Teradyne's Assembly Test Division is to exhibit its major electronics manufacturing test and inspection solutions at the Nepcon Shanghai tradeshow from 9th to 12th April 2002.

News from Teradyne ( 8 April 2002)

EEMS orders Advantest memory test solutions

Advantest has received a purchase order from EEMS for multiple units of its Model T5585 high-speed memory test system.

News from Advantest (Europe) (25 March 2002)

Optical amplifier adds flexibility to optical test

New from Teradyne's Assembly Test Division (ATD) is the GRPX1040 CompactPCI C-band optical amplifier, the latest addition to its GR VersaOT optical communications test product portfolio.

News from Teradyne (21 March 2002)

Power meter speeds opto manufacturing lines

New from EXFO Electro-Optical Engineering are the IQS-1700 high-performance optical power meter and OHS-1713-UH ultra-high-power optical remote heads.

News from EXFO Electro-Optical Engineering (20 March 2002)

RF multiplexer modules aid radio testing

Keithley Instruments has released a pair of RF multiplexer modules for its popular Model 2700 and 2750 multimeter/switch systems. Brochure available

News from Keithley Instruments (18 March 2002)

Advantest moves to East Kilbride

Advantest (Europe) has Relocated its Scottish branch office from Paisley to East Kilbride.

News from Advantest (Europe) (12 March 2002)

Intertechnique goes for Teradyne's Spectrum

Intertechnique has selected Teradyne's Spectrum 9100-Series functional test platform to form the backbone of its next generation functional test systems.

News from Teradyne ( 8 March 2002)

Intelligent system puts fibres to the test

EXFO Electro-Optical Engineering has launched the IQS-500 intelligent test system (ITS) for fibre-optic manufacturing and R and D environments.

News from EXFO Electro-Optical Engineering ( 7 March 2002)

Flash startup opts for Advantest testers

A European joint venture recently set up to develop, manufacture and market Flash memories and small form factor Flash cards has placed orders for Advantest T5771 front-end Flash memory test systems.

News from Advantest (Europe) (20 February 2002)

DRAM maker orders multiple ATEs

A leading designer and manufacturer of high-performance DRAM devices, has placed an order with Advantest (Europe) for more than ten T5375 memory testers.

News from Advantest (Europe) (20 February 2002)

Characterisation links with modelling

A new software driver allows users to combine the Keithley Model 4200-SCS semiconductor characterisation system with Agilent Technologies' IC-CAP device modelling software environment. Brochure available

News from Keithley Instruments ( 6 February 2002)

Speedy parametric tester doesn't need babysitting

Keithley Instruments has released what it claims to be the industry's fastest automated parametric test (APT) system for integrated DC and RF wafer measurements. Brochure available

News from Keithley Instruments ( 1 February 2002)

Loads of accuracy from miniature current sources

Datel has made two additions to its growing family of miniature electronic loads.

News from Datel (UK) (29 January 2002)

Benchmark choses Teradyne for novel Irish facility

Benchmark Electronics has selected the Teradyne GR Pilot LX fixtureless flying prober test system, and Teradyne GR Force/A3 test and inspection data preparation solution.