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ATE Systems
Archive page 13 of 16
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Lagner looks after factory automation
Peter Lagner is now responsible for Advantest Europe product marketing for factory automation.
News from Advantest (Europe) (30 September 2002)
Alliance to address supply chain quality
Teradyne's Assembly Test Division and MetricStream have formed a strategic alliance.
News from Teradyne (19 September 2002)
Functional tester ranges up from boards
Peak has introduced a new generation of functional test systems which use the company's proprietary test software, TestMaster, to interface a wide variety of hardware modules to the unit under test.
News from Peak Production Equipment (10 September 2002)
Automated optical inspection systems for China
Beijing International Switching System Corp has ordered two Teradyne Optima 7300 post-reflow automated optical inspection (AOI) systems, the first of their kind to be used in China.
News from Teradyne ( 9 September 2002)
Detector aids pulsed power measurement solution
A novel integrating sphere photodetector can be combined with Keithley's pulsed laser diode test system to provide the industry's only complete pulsed source and measurement solution for LIV testing. Brochure available
News from Keithley Instruments ( 4 September 2002)
Cost-effective speed from in-circuit tester
The TestStation SE is the latest addition to Teradyne's family of in-circuit test (ICT) systems.
News from Teradyne (29 August 2002)
Fault detection pinned down at Nepcon
Diagnosys is to exhibit one of the fastest and most economical functional test workstations available at Nepcon.
News from Diagnosys (13 August 2002)
Semiconductor Test Consortium focuses on standards
The Semiconductor Test Consortium is the first industry-wide collaboration aimed at finding cost-effective solutions to testing complex logic devices, such as SoCs.
News from Advantest (Europe) (26 July 2002)
Acquisition adds burn in to test portfolio
Advantest Corp has acquired a 38% stake in JEC (Japan Electric Corp).
News from Advantest (Europe) ( 5 July 2002)
Award acknowledges satisfaction - again
For the 13th consecutive year, Advantest has featured in the "Top 10 best test and material handling equipment companies" in VLSI Research's annual customer satisfaction survey.
News from Advantest (Europe) (20 June 2002)
New level of integration at SMT
Teradyne's Assembly Test Division is to exhibit its major electronics manufacturing test and inspection solutions at SMT/Hybrid/Packaging, from 18th to 20th June 2002 at Nuremberg Trade Fair Centre.
News from Teradyne (31 May 2002)
Failure diagnostics under development
Advantest is to develop a fast, accurate failure diagnostics solution for deep-submicron high-speed SoC designs leveraging TetraMax automatic test pattern generation technology from Synopsys.
News from Advantest (Europe) (29 May 2002)
Verification of interoperability
LogicVision has successfully completed interoperability testing with Verplex's Conformal logic equivalence checker (LEC) formal verification product.
News from LogicVision Europe (28 May 2002)
Teradyne to develop tester for Sony GSM handsets
Teradyne's Assembly Test Division has set up a collaborative partnership with Sony Corp to develop a unique functional test platform for Sony's range of cellular mobile products.
News from Teradyne (23 May 2002)
Advantest checks tool compatibility before launch
Advantest is working with Mentor Graphics to ensure full compatibility between its new SoC failure diagnostics tool and Mentor's suite of FastScan automatic test pattern generation tools.
News from Advantest (Europe) (21 May 2002)
High throughput for airbag inflation tester
New from Keithley Instruments, the Model 2790 SourceMeter switch airbag inflator test system provides an overall cost of test much lower than existing igniter test systems. Brochure available
News from Keithley Instruments (21 May 2002)
Cables and components go on automatic test
Sefelec Saphir-E Series automatic cable testers from Cropico integrate instrumentation and switching systems in a single bay, with modular construction providing extensive flexibility. Brochure available
News from Cropico (20 May 2002)
Advantest breaks up with Tek to go solo in the USA
Advantest and Tektronix are to terminate their nine-year distribution arrangement as of 30th June 2002, by mutual consent.
News from Advantest (Europe) (30 April 2002)
Hybrid switching spreads ATE to optoelectronics
Keithley Instruments has added a range of fully integrated factory configurations for hybrid DC/RF/optical switching to its System 40 product line. Brochure available
News from Keithley Instruments (23 April 2002)
System puts flat panel displays to the test
NI Display Test is a powerful ready-to-run software and hardware solution from National Instruments for reliably inspecting flat panel displays. Brochure available
News from National Instruments (22 April 2002)
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