ATE Systems
(a sub category of Test and Measurement)
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Latest articles from 'ATE Systems'
News releases from this sub-category
Showing 101-125 of 394 articles
Chip tester appoints new senior VP of Engineering
A semiconductor test specialist has appointed a 24-year industry veteran to the role of Senior Vice President of Engineering, with implementation responsibility for all product lines.
News from Credence Systems Corp, Apr 23, 2007
Instrument maker issues Q2 profit warning
An instrumentation specialist has announced that sales levels for the second quarter of fiscal 2007 fell short of the guidance range that was previously provided.
News from Keithley Instruments, Apr 18, 2007
Chinese customers appreciate Advantest
Advantest has been named one of the best customer-rated equipment suppliers in China.
News from Advantest (Europe), Apr 18, 2007
Automotive tester majors on infotainment systems
Functional test system is designed to test all infotainment and telematics modules in cars.
News from Agilent Technologies Europe, Apr 18, 2007
Testers automate device characterisation
Integrated test systems enable semiconductor characterisation at the device, wafer and cassette level.
News from Keithley Instruments, Apr 16, 2007
Nanotechnology measurements explained
Handbook provides a 124-page guide to electrical measurements for nanoscience applications.
News from Keithley Instruments, Apr 16, 2007
Semiconductor test conference for Napa Valley
The second Global STC conference is open to all STC members as well as other semiconductor, equipment and instrumentation companies.
News from Semiconductor Test Consortium, Apr 16, 2007
Freescale adopts software for IC characterisation
Characterisation platform is designed to significantly reduce the time and effort engineers spend sifting through all the data and correlating results.
News from VI Technology, Apr 11, 2007
Taylor tackles regulatory compliance
Keithley Instruments has named Suzanne Schulze Taylor as its Vice President, General Counsel and Chief Compliance Officer.
News from Keithley Instruments, Apr 6, 2007
Parametric test platform comes in three flavours
Next-generation parametric test platform is designed to meet the evaluation needs of engineers working in semiconductor fabs and research environments.
News from Agilent Technologies Europe, Apr 3, 2007
Semiconductor tester gains extra capabilities
Significant enhancements to a Semiconductor Characterisation System enable new features like Flash memory testing, high-power RF device testing, and pulse testing for advanced semiconductor materials.
News from Keithley Instruments, Apr 2, 2007
Mosaid exits ATE business
Mosaid Technologies has concluded the sale of certain assets of its Systems Division's automatic test equipment (ATE) business to Teradyne for US $20 million in cash.
News from Mosaid, Mar 30, 2007
Test company named as preferred quality supplier
Test company named a recipient of Intel's Preferred Quality Supplier (PQS) award for outstanding performance in providing products and services deemed essential to Intel's success.
News from Advantest (Europe), Mar 29, 2007
Distributor appointment expands Japanese support
LogicVision has signed up Noah Corporation as distributor for its products in Japan.
News from LogicVision Europe, Mar 21, 2007
Enhancements to PCB test systems on show at Nepcon
Enhancements to PCB testers include new digital functional testing, mixed-signal testing, in-system programming and improved probing speeds.
News from Aeroflex, Mar 16, 2007
Tool combines boundary scan and functional testing
Test tool combines boundary-scan and functional test technologies to achieve higher test coverage.
News from Corelis, Mar 14, 2007
Drag and drop tool for building test applications
A graphical environment allows complex test and measurement applications to be developed using drag-and-drop tools that do not require a knowledge of programming to use.
News from Data Translation, Mar 13, 2007
Test systems to support Rafale fighters
Seica and EADS Test and Services have received a contract from Dassault Aviation to provide test systems for the production testing of onboard electronics of Rafale fighters.
News from Seica, Mar 13, 2007
Soft landing for ATE acquisition
"Rent to buy" scheme reduces risks involved in specifying and purchasing test and inspection equipment.
News from Itochu Europe, Mar 5, 2007
Aerospace show is launchpad for board tester
Combination board tester is capable of testing the highly complex, densely populated PCBs typically found in aerospace environments.
News from Cupio, Feb 26, 2007
Missile maker migrates to ATE
Agilent Technologies has been awarded a US $12.6 million contract by Raytheon to deliver an advanced, next-generation automated manufacturing test platform.
News from Agilent Technologies Europe, Feb 23, 2007
Distribution deal expands N European coverage
LogicVision has appointed ISS Group to distribute its products in the UK, Norway, Poland, Finland, Ireland, Denmark and Sweden.
News from LogicVision Europe, Feb 23, 2007
Interactive test tutorial on CD
Keithley Instruments has released the Simplified Test Toolkit, an interactive tutorial CD that helps test engineers overcome tough measurement challenges.
News from Keithley Instruments, Feb 19, 2007
Five star rating for commitment to customers
VLSI Research has awarded Keithley a five star rating among process diagnostics companies, the highest possible rating for overall customer satisfaction.
News from Keithley Instruments, Feb 2, 2007
Parallel test technology explained
Keithley Instruments has published "Parallel test technology: the new paradigm for parametric testing", a semiconductor parametric test handbook.
News from Keithley Instruments, Jan 31, 2007
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