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ATE Systems
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New centre services Northern Europe
Keithley Instruments has opened its new Northern European Service Centre in the UK. Brochure available
News from Keithley Instruments (22 October 2003)
Software speeds ATE development
A new version of the TestStand test management software package is designed to help engineers build and deploy automated prototype, validation and manufacturing test systems 75% faster. Brochure available
News from National Instruments (17 September 2003)
Toshiba chooses parametric test system
Toshiba Corp has selected the Keithley S630DC/RF parametric test system to support production of its newest generation of semiconductors. Brochure available
News from Keithley Instruments (16 September 2003)
BT opts for DSL test solution
BT has purchased Acterna's centralised DSL test solution comprising QT200 test head and EMS software in addition to a range of services.
News from Acterna (10 September 2003)
PCI card interfaces put to the test
Test product simplifies testing of PCI card interfaces and at the same time significantly increases the overall test coverage. Brochure available
News from JTAG Technologies ( 2 September 2003)
Teradyne systems upgrade to boundary scan
Software upgrade package to runs boundary-scan testing applications on Teradyne TestStation systems. Brochure available
News from JTAG Technologies (24 July 2003)
New features add flexibility to test software
TestPoint is a software tool for creating custom test, measurement and data acquisition applications. Brochure available
News from Keithley Instruments ( 9 July 2003)
Triple treat for ATE supplier
Spea (UK) has recently signed contracts to supply Erskine Systems, Kingfield Electronics and Methode Electronics Europe with its test systems.
News from Spea (UK) (17 June 2003)
In-circuit testers protect low-voltage devices
Teradyne has added SafeTest protection technologies to its line of TestStation in-circuit test systems.
News from Teradyne (16 June 2003)
Modelithics helps with RF modelling expertise
Keithley Instruments has entered into a collaborative agreement with Modelithics to create more efficient software modelling techniques for the design of advanced RF semiconductor devices. Brochure available
News from Keithley Instruments (11 June 2003)
Three move up at Keithley
Three senior appointments at Keithley Instruments see Linda C Rae elected Senior Vice President, and Mark A Hoersten and Alan S Gaffney elected as Vice Presidents of the company. Brochure available
News from Keithley Instruments (30 May 2003)
Second magazine award for inspection system
The Vectron K2-AOI automated optical inspection system has received the 2003 EP and P Global Excellence Award for Inspection.
News from Vectron (30 May 2003)
Boundary scan controllers boost performance
High-performance boundary-scan IEEE1149.1 controllers satisfy increasing requirements for faster and deeper in-system programming of Flash and CPLDs as well as complex digital PCB testing. Brochure available
News from JTAG Technologies (16 May 2003)
Detailed introduction to automatic testing
Racal Instruments Military and Aerospace will be hosting its next automated test training course on 23rd June 2003 at its Ferndown site in Dorset.
News from Racal Instruments Wireless Solutions (13 May 2003)
Boeing looks to next generation test solution
Teradyne has signed a licensing agreement with The Boeing Company to manufacture and market a new automatic test system (ATS) for airplane avionics components.
News from Teradyne (12 May 2003)
Saab helps with manufacturing test systems
Willtek Communications and Saab Test Systems have formed a strategic alliance to develop of manufacturing test systems to improve the testing of mobile phones at the production stage.
News from Willtek Communications (22 April 2003)
Speedy programming for optical process tester
The Optima 7210 is an optical process test (OPT) system for post-placement, inline defect detection and process measurement.
News from Teradyne ( 2 April 2003)
Budget pricing for scalable in-circuit tester
The TestStation LH in-circuit tester is a lower-cost small-footprint feature-scalable version of Teradyne's award-winning TestStation 12X product family.
News from Teradyne ( 2 April 2003)
Agilent testers upgrade to boundary scan
Symphony for 3070 comprises a complete hardware and software boundary-scan upgrade package for the Agilent 307x family of in-circuit testers. Brochure available
News from JTAG Technologies ( 1 April 2003)
Alliance embeds real-time control
JTAG Technologies and LogicVision have formed a partnership to streamline the integration of device-level embedded test and diagnosis with board and system level testing. Brochure available
News from JTAG Technologies (25 March 2003)
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