ATE Systems
(a sub category of Test and Measurement)
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Latest articles from 'ATE Systems'
News releases from this sub-category
Showing 151-175 of 394 articles
Functional tester is made for low-cost handsets
Agilent Technologies has introduced the Agilent GS-8000 Lite wireless functional test system targeted at the low-cost manufacturing test of mobile handsets.
News from Agilent Technologies Europe, Nov 7, 2006
Hauptmann manages Central Europe
Bernd Hauptmann has assumed the position of Seica Sales Manager for Central Europe, based in Munich.
News from Seica, Oct 27, 2006
Bead probes aid ATE accessibility
Agilent Technologies is now licensing its Medalist bead probe technology, a proven methodology for placing solder beads, or "bead probes", directly onto printed circuit board (PCB) signal traces.
News from Agilent Technologies Europe, Oct 26, 2006
JTAG test execution made simple
Production based JTAG test execution packages feature a simple software interface that allows nontechnical users to perform JTAG testing on a wide range of product lines.
News from Direct Insight, Oct 19, 2006
Sheedy engineers management role
Advantest (Europe) has appointed Gary Sheedy as its new Engineering Manager, based at the company's headquarters in Munich.
News from Advantest (Europe), Oct 9, 2006
Lutz to develop European business
Advantest (Europe) has appointed Klaus Lutz as Director New Business Development.
News from Advantest (Europe), Oct 9, 2006
Array option expands scope of parametric tester
Test system makes parametric test a viable option for the yield ramp-up phase for the first time by allowing users to test more structures in less time with greater throughput.
News from Agilent Technologies Europe, Oct 4, 2006
Keithley sponsors wireless weblog
Keithley Instruments is sponsoring a weblog, or blog, designed exclusively for engineers working in the wireless industry.
News from Keithley Instruments, Sep 22, 2006
In-circuit tester adds boundary scan option
Goepel Electronic and Spea have developed a next generation boundary scan option for the Spea 3030 in-circuit tester (ICT).
News from Goepel Electronic, Sep 21, 2006
Instrument drives aid ATE system design
Acqiris has introduced a range of class-compliant Interchangeable Virtual Instrument (IVI) drivers that support the company's full range of digitisers.
News from Acqiris USA, Sep 19, 2006
Ten years of UK technical support
JTAG Technologies is celebrating a decade of providing technical support in the UK.
News from JTAG Technologies, Sep 14, 2006
Online market upgrades listing system
Used-Line has upgraded its online listing system for private sellers.
News from Used-Line.com, Sep 5, 2006
Cable tester adds confidence to switch performance
A Synor 1202 cable tester purchased to validate complex six-position rotary switch assemblies with 242 external pin connections for the rail industry, has proved to be a great success.
News from Cropico, Aug 31, 2006
Weblog focuses on semiconductor test issues
The Semiconductor Test Blog informs visitors of the latest technical and business developments in the semiconductor industry and their impact on testing.
News from Keithley Instruments, Aug 11, 2006
Boundary scan seminars promise enthralling agenda
Seminars offer an in-depth view on the burgeoning uses of boundary scan within the design, manufacture and service of digital circuit boards and systems.
News from JTAG Technologies, Aug 10, 2006
EADS Test and Services acquires
EADS Test and Services has acquired the company Get Electronique based in Castres near Toulouse, France.
News from EADS Test and Services, Aug 2, 2006
Expansion set to double tester output
With the completion of a brand new 1300m2 production hall, Seica has nearly doubled its production capacity.
News from Seica, Jul 19, 2006
Motorola standardises on boundary scan systems
Asset InterTech has signed a multiyear contract to become Motorola's worldwide supplier of boundary scan (IEEE1149.1 or JTAG) electronic test systems.
News from Asset InterTech, Jul 17, 2006
T and M website adds PDA interface
A leading search engine for test and measurement equipment now includes a PDA web interface.
News from Used-Line.com, Jul 17, 2006
16-channel mixed-signal module for SoC test
High integration dramatically reduces test cost for consumer ICs while delivering accuracy, flexibility and high performance.
News from Advantest (Europe), Jul 14, 2006
Antares conTech and UMD to Merge
Antares conTech and UMD Advanced Test Technologies to merge to create leader in semiconductor test market.
News from UMD Advanced Test Technologies, Jul 13, 2006
Advantest stars in customer satisfaction survey
Users of Advantest's test and material handling systems have ranked it among the industry's 10 best large semiconductor equipment suppliers in an annual customer satisfaction survey.
News from Advantest (Europe), Jul 12, 2006
Best build quality is key to ATE survey success
Advantest Corporation has earned a place on VLSI Research's "10 Best" list for the 18th consecutive year.
News from Advantest (Europe), Jul 12, 2006
Flying probe tester gains boundary scan option
Goepel Electronic has developed a boundary scan option for the Spea FPT 4040 flying probe tester as part of an OEM agreement.
News from Goepel Electronic, Jul 3, 2006
Intel prefers Advantest
Advantest has received Intel Corporation's Preferred Quality Supplier award for outstanding performance in providing products and services deemed essential to Intel's success.
News from Advantest (Europe), Jun 5, 2006
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