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ATE Systems
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Burn-in tester boosts memory module reliability
Kingston Technology has developed a proprietary test platform designed to detect early-life failure (ELF) in server memory modules.
News from Kingston Technology (18 November 2004)
Platform automates handset testing
TestQuest will demonstrate the latest enhancements to its TestQuest Pro platform at the Smart Phone Show at the London ExCel on 5th and 6th October 2004.
News from TestQuest International ( 5 October 2004)
Parametric test systems bound for Korea
Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems. Brochure available
News from Keithley Instruments ( 6 September 2004)
All-in 200mm wafer tester aims for 130nm devices
Keithley Instruments has developed a packaged, ready-to-run parametric test system claiming unrivalled cost-per-pin and total price/performance ratio. Brochure available
News from Keithley Instruments (16 July 2004)
Semiconductor survey shows continued satisfaction
For the 16th consecutive year, Advantest has been rated as one of the world's top equipment suppliers in the annual customer satisfaction survey conducted by industry-analyst firm VLSI Research.
News from Advantest (Europe) ( 6 July 2004)
Tester meets Openstar requirements
The Advantest T2000 Series has been certified by the Semiconductor Test Consortium as the industry's first system to meet the Open Semiconductor Test Architecture (Openstar) standard.
News from Advantest (Europe) ( 6 July 2004)
Tester gets to grips with high-pin-count SoCs
The T6577 SoC test system is capable of simultaneous high-speed testing - even for odd numbers of devices - and supports input/output (I/O) pins up to 1024 channels.
News from Advantest (Europe) (23 June 2004)
Collaboration aids high-frequency wafer testing
A novel joint solution from Advantest (Europe) and SUSS MicroTec provides automatic wafer probe testing for 20GHz high-frequency multiport devices.
News from Advantest (Europe) (23 June 2004)
Photodiodes put to the test
The Model 280 photodiode test system from dBm Optics allows suppliers of PIN and APD photodiodes to characterise the parametric performance of their components in R and D, QA and production.
News from dBm Optics (23 March 2004)
High yields depend on reliable measurement
Technical background article Paul Meyer explains how to improve test accuracy and throughput for optoelectronic components with specifically designed automated test instruments. Brochure available
News from Keithley Instruments ( 2 March 2004)
Flying probe testers gain boundary scan
Symphony APT-9000 from JTAG Technologies integrates boundary-scan within Takaya flying probe testers. Brochure available
News from JTAG Technologies (25 February 2004)
ATE module aims to spot nanometre-scale defects
The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume.
News from Q-Star Test (17 February 2004)
Partnership targets nanotechnology research
Keithley Instruments is working with the Albany NanoTech Center to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies. Brochure available
News from Keithley Instruments ( 6 February 2004)
SoC tester meets latest standards
The T2000 SoC tester is the first system based on the Openstar standards defined by the Semiconductor Test Consortium (STC).
News from Advantest (Europe) ( 3 February 2004)
Catalogue brings full test range together
Keithley Instruments has published its 2004 catalogue of test and measurement products for engineering development, production testing, and scientific research. Brochure available
News from Keithley Instruments (10 December 2003)
Higher throughput for wafer test equipment
The S680DC/RF parametric test system is the latest addition to the Keithley Instruments S600 Series family. Brochure available
News from Keithley Instruments ( 9 December 2003)
Distribution deal lines up high-voltage ATE
A new distribution agreement covers the extensive range of automatic electrical testing solutions from MK Test Systems. Brochure available
News from Tyco Electronics - Global Application Tooling ( 5 December 2003)
Power supply gains plug-and-play drivers
National Instruments IVI drivers are now available for the QL Series of high-performance laboratory bench power supplies.
News from TTi (Thurlby Thandar Instruments) ( 1 December 2003)
Acquisition adds burn-in to ATE portfolio
Japan Engineering Co (JEC) is to become a wholly owned subsidiary of Advantest Corp.
News from Advantest (Europe) (12 November 2003)
Open-architecture LSI tester tackles many tasks
The T2000 Series of system LSI test systems is the industry's first to be based on the new Openstar open architecture standards.
News from Advantest (Europe) (23 October 2003)
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