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ATE Systems
Archive page 9 of 16
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Platform puts wireless devices to the test
A novel automated platform enables designers to quickly test WirelessUSB-enabled products without the need for expensive RF test equipment.
News from Cypress Semiconductor (17 May 2005)
Cable harness tester handles up to 384 connections
The WK140 cable harness tester can test up to 384 connection points and detect open and short circuits and miswiring. Brochure available
News from Schaffner ( 6 May 2005)
Addition enhances avionics product portfolio
Aeroflex has acquired the business of JcAIR Test Systems from aerospace and defence supplier, Goodrich Corp for $35 million in cash.
News from Aeroflex (22 April 2005)
Automatic tester checks out PCB manufacture
The Auto-SIR is a novel automatic tester that measures surface insulation resistance of printed circuit boards.
News from Concoat (19 April 2005)
Tester gets the measure of advanced IC reliability
The S510 semiconductor reliability test system is a high-channel-count turnkey solution for use in reliability testing and lifetime modelling of the world's most advanced ULSI CMOS processes. Brochure available
News from Keithley Instruments (14 April 2005)
Nepcon demo for budget analogue in-circuit tester
At Nepcon UK Aeroflex will demonstrate its broad range of test instruments for R and D, product validation, manufacturing test and installation.
News from Aeroflex ( 7 April 2005)
Aperto signs for enterprise test data management
Aperto Networks has selected Arendar enterprise test data management software from VI Technology for testing PacketWave systems produced in its manufacturing facilities.
News from VI Technology ( 4 April 2005)
Brighton debut for desktop ATE
For the first time in the UK, Cupio is presenting the latest in desktop ATE technology from Qmax at this year's Nepcon show.
News from Cupio (18 March 2005)
ATE's RF option reduces specialist intervention
Keithley Instruments has developed its third generation on-wafer RF measurement capability for semiconductor parametric production process control. Brochure available
News from Keithley Instruments (18 March 2005)
Hynix signs for parametric test systems
Keithley Instruments has received a repeat multiple-system order for its S680 DC/RF parametric test systems from Hynix Semiconductor. Brochure available
News from Keithley Instruments (18 March 2005)
New platform claims reduced component test costs
Series 2600 System SourceMeter instruments comprise a new platform that significantly lowers the cost of test for a wide range of electronic component producers. Brochure available
News from Keithley Instruments (18 March 2005)
Goepel joins LXI Consortium
Goepel Electronic has joined the LXI Consortium and is actively participating in the development and introduction of the LXI standard (LAN extensions for instrumentation). Brochure available
News from Goepel Electronic (11 March 2005)
EADS signs for modular test unit
Seica has signed a licensing agreement with EADS Test and Services to add a third level optional testing capability to its line of second level systems, Atec Series 6 and derived products.
News from Seica ( 3 March 2005)
Test platform covers full product lifecycle
A new integrated test platform from Seica includes cutting-edge technology to implement the multiple test strategies needed to address the challenges of electronic testing.
News from Seica (28 February 2005)
Vector signal generator turns to ATE duties
The SMATE200A vector signal generator from Rohde and Schwarz is optimised for production testing, with extremely fast setting of frequency and level to allow high throughput.
News from Rohde and Schwarz (18 February 2005)
On-chip test boosts ASIC memory yields
Open-Silicon has adopted LogicVision's embedded memory-test and repair-analysis technology as part of the standard tool flow in its ASIC designs.
News from LogicVision Europe (14 February 2005)
AMD signs for DC/RF parametric test system
AMD has selected the Keithley Model S680 DC/RF parametric test system to support full production of advanced logic chips at its new state-of-the-art 300mm Fab 36 in Dresden, Germany. Brochure available
News from Keithley Instruments ( 7 February 2005)
Seica systems integrate boundary scan
JTAG Technologies has integrated its test methods within the Seica Pilot and Pilot LX flying-probe in-circuit test systems. Brochure available
News from JTAG Technologies ( 2 February 2005)
CD explains semiconductor reliability testing
Keithley Instruments has released an interactive, tutorial CD on reliability testing for semiconductor test engineers. Brochure available
News from Keithley Instruments (24 January 2005)
Mainframe cuts the cost of test system switching
The Model 7002-HD high-density two-slot switching mainframe and cards combine to offer instrument grade switching at a price up to 40% less than comparable platforms. Brochure available
News from Keithley Instruments (24 January 2005)
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