ATE Systems
(a sub category of Test and Measurement)
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Latest articles from 'ATE Systems'
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Showing 201-225 of 394 articles
Embedded tester spots shorts at functional test
The Short Finder offers a novel approach to short circuit detection at the functional test stage, allowing manufacturers to bypass in-circuit testing.
News from ProbeStar, Dec 26, 2005
Boundary scan answers CEM test demands
UK based contract electronics manufacturer Barric has selected XJTAG as its boundary scan test solution partner.
News from XJTAG, Dec 20, 2005
Test services help speed comms chip to market
Delta Microelectronics has been selected by Phyworks to develop a test solution and conduct production testing for the company's award-winning PHY1060 IC.
News from Delta Microelectronics, Dec 16, 2005
Gigabit Ethernet fills missing boundary scan link
TapCommunicator is a novel product for remote, high-fidelity communications of boundary-scan test vectors and device programming data, using existing communication links.
News from JTAG Technologies, Dec 7, 2005
Flying probe tester links with boundary scan
Goepel Electronic and Scorpion Technologies have developed a new JTAG/boundary scan option for the Scorpion FPT flying probe tester.
News from Goepel Electronic, Dec 7, 2005
ATE is delivered ahead of schedule
Gaddon Consultants has completed the first phase of a major automated test equipment project for the MoD.
News from Gaddon Consultants, Dec 7, 2005
Test equipment designed and made to order
Placepower UK provides a wide range of innovative, cost-effective solutions across production, handling and test environments.
News from Placepower UK, Dec 6, 2005
Multifunction ATE shows its versatility
A new ATE system provides the true reconfigurability needed to meet the ever-changing requirements of the rapidly evolving PCB industry.
News from Aeroflex, Nov 17, 2005
ATE systems promise maximum flexibility
Seica, Italy's electronics test OEM, has added several new products within its new Viva integrated platform.
News from Seica, Nov 15, 2005
ATE products reach the Philippines
Aeroflex has signed a distribution agreement with Maxtronix, a Philippines company dedicated to selling sophisticated equipment for semiconductor, SMT and through-hole assembly.
News from Aeroflex, Oct 26, 2005
Keithley expands in Singapore and Malaysia
Keithley Instruments has significantly expanded its business presence in southeast Asia with an office expansion in Singapore and the opening of two new offices in Malaysia.
News from Keithley Instruments, Oct 18, 2005
PCMCIA and CompactFlash cards put to the test
A novel test bed handles up to 36 PCMCIA and CompactFlash cards simultaneously, while allowing the user to access each card individually to perform test and/or measurement diagnostics.
News from Elan Digital Systems, Oct 11, 2005
In-circuit testers integrate boundary scan
Goepel Electronic has developed a next generation boundary scan option for Digitaltest MTS 180, MTS 300 and MTS 888 series in-circuit testers.
News from Goepel Electronic, Oct 6, 2005
Test systems designed and built to order
The Peak Group is now offering custom design and build services for test equipment in the electronics manufacturing, aerospace and defence industries.
News from Peak Production Equipment, Oct 4, 2005
Power platform aims for military ATE duties
ReFlex Power provides a reconfigurable, flexible platform, ideal for ATE and production test environments.
News from Elgar Electronics Corp, Sep 29, 2005
Electro-emulation tester links bench with line
New from Schaffner, the W629 electro-emulation tester offers OEMs efficient strategies for testing finished products and partial assemblies during the manufacturing process.
News from Schaffner, Sep 26, 2005
Monitor cuts testing costs for automotive products
Q-Star Test has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020, multi-site IDDQ monitor for running IDDQ tests on its automotive products.
News from Q-Star Test, Sep 23, 2005
Functional tester adapts to Intel's built-in tests
Asset InterTech and International Test Technologies are supporting Intel Interconnect Built-In Self Test embedded test technology on the uMaster functional test platform.
News from Logic Technology, Sep 6, 2005
Hamilton wins 2005 IEEE Joseph F Keithley Award
The IEEE has named Dr Clark A Hamilton as the recipient of the 2005 IEEE Joseph F Keithley Award in Instrumentation and Measurement.
News from Keithley Instruments, Sep 5, 2005
Finkenzeller takes on Northern Europe
Advantest (Europe) has appointed Adolf Peter Finkenzeller as its new Manager Sales Northern Europe.
News from Advantest (Europe), Aug 23, 2005
ATE speeds through multiple memory tests
A new automatic tester for multichip package memory devices achieves high throughput by testing up to 512 devices in parallel.
News from Advantest (Europe), Aug 18, 2005
Subsidiary focuses on event-based test technology
Advantest Technology Solutions is a new subsidiary company set up to supply semiconductor design verification systems using event-based test technology.
News from Advantest (Europe), Aug 17, 2005
Top-ten ranking confirms customer satisfaction
The latest VLSI Research rankings of semiconductor equipment manufacturers put Advantest among the top 10 suppliers for the 17th consecutive year.
News from Advantest (Europe), Aug 17, 2005
Introductory guide explains boundary scan
A new booklet aims to "demystify" test procedures in general and illustrates the benefits of adopting boundary-scan test and in-system programming as an integral part of a product's development.
News from JTAG Technologies, Aug 2, 2005
Dynamic burn-in tester wins US Patent
Kingston Technology has been granted a US Patent for its KT2400 dynamic burn-in tester.
News from Kingston Technology, Jul 28, 2005
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