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ATE Systems
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Electro-emulation tester links bench with line
New from Schaffner, the W629 electro-emulation tester offers OEMs efficient strategies for testing finished products and partial assemblies during the manufacturing process. Brochure available
News from Schaffner (26 September 2005)
Monitor cuts testing costs for automotive products
User application article Q-Star Test has announced that Freescale Semiconductor, and in particular its Tempe site, has selected its QD-1020, multi-site IDDQ monitor for running IDDQ tests on its automotive products.
News from Q-Star Test (23 September 2005)
Functional tester adapts to Intel's built-in tests
Asset InterTech and International Test Technologies are supporting Intel Interconnect Built-In Self Test embedded test technology on the uMaster functional test platform.
News from Logic Technology ( 6 September 2005)
Hamilton wins 2005 IEEE Joseph F Keithley Award
The IEEE has named Dr Clark A Hamilton as the recipient of the 2005 IEEE Joseph F Keithley Award in Instrumentation and Measurement. Brochure available
News from Keithley Instruments ( 5 September 2005)
Finkenzeller takes on Northern Europe
Advantest (Europe) has appointed Adolf Peter Finkenzeller as its new Manager Sales Northern Europe.
News from Advantest (Europe) (23 August 2005)
ATE speeds through multiple memory tests
A new automatic tester for multichip package memory devices achieves high throughput by testing up to 512 devices in parallel.
News from Advantest (Europe) (18 August 2005)
Subsidiary focuses on event-based test technology
Advantest Technology Solutions is a new subsidiary company set up to supply semiconductor design verification systems using event-based test technology.
News from Advantest (Europe) (17 August 2005)
Top-ten ranking confirms customer satisfaction
The latest VLSI Research rankings of semiconductor equipment manufacturers put Advantest among the top 10 suppliers for the 17th consecutive year.
News from Advantest (Europe) (17 August 2005)
Introductory guide explains boundary scan
A new booklet aims to "demystify" test procedures in general and illustrates the benefits of adopting boundary-scan test and in-system programming as an integral part of a product's development. Brochure available
News from JTAG Technologies ( 2 August 2005)
Dynamic burn-in tester wins US Patent
Kingston Technology has been granted a US Patent for its KT2400 dynamic burn-in tester.
News from Kingston Technology (28 July 2005)
Boundary scan modules access complex boards
JTAG Technologies has a new family of digital I/O scan modules for enhanced testing of complex printed circuit boards. Brochure available
News from JTAG Technologies (25 July 2005)
Handbook answers semiconductor test challenges
"Overcoming the measurement challenges of advanced semiconductor technologies: DC, pulsed and RF - from modelling to manufacturing" is a new semiconductor test reference handbook. Brochure available
News from Keithley Instruments (14 July 2005)
Characterisation system gains pulse capabilities
Keithley Instruments now offers pulse generation and measurement in its Model 4200-SCS semiconductor characterisation system. Brochure available
News from Keithley Instruments (13 July 2005)
Flying probe test system offers flexible upgrades
User application article Accutron of Limerick required a flexible test platform that would allow it to add boundary scan and functional test at a later stage.
News from Itochu Europe (12 July 2005)
Best choice of mixed signal platform
Best Electronics and Components Company has purchased multiple ASL 1000T test systems from Credence Systems Corp.
News from Credence Systems Corp (11 July 2005)
Power supply ATE is essential to Powerstax
User application article Powerstax has become the latest UK customer to buy an Intepro 9000 power supply ATE system from Schaffner. Brochure available
News from Schaffner (28 June 2005)
Flying probe tester tackles densely packed boards
Itochu's Takaya flying probe test range has been developed to an even higher level with the introduction of the new APT-9411.
News from Itochu Europe (10 June 2005)
New office focuses French support
JTAG Technologies has expanded its marketing and sales efforts in France by opening its own office to directly serve the French market and its partners in France. Brochure available
News from JTAG Technologies ( 3 June 2005)
System gets to the seat of automotive testing
Goepel Electronic has developed a special version of its Tessy functional test system dedicated to testing the electronic assemblies in car seats. Brochure available
News from Goepel Electronic (26 May 2005)
TTPCom is number 150 for JTAG Technologies
Boundary-scan specialist JTAG Technologies is celebrating the signing of its 150th user agreement. Brochure available
News from JTAG Technologies (25 May 2005)
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