ATE Systems
(a sub category of Test and Measurement)
A - Z list of suppliers
Click on a letter below to find a supplier...
Latest articles from 'ATE Systems'
News releases from this sub-category
Showing 251-275 of 394 articles
On-chip test boosts ASIC memory yields
Open-Silicon has adopted LogicVision's embedded memory-test and repair-analysis technology as part of the standard tool flow in its ASIC designs.
News from LogicVision Europe, Feb 14, 2005
AMD signs for DC/RF parametric test system
AMD has selected the Keithley Model S680 DC/RF parametric test system to support full production of advanced logic chips at its new state-of-the-art 300mm Fab 36 in Dresden, Germany.
News from Keithley Instruments, Feb 7, 2005
Seica systems integrate boundary scan
JTAG Technologies has integrated its test methods within the Seica Pilot and Pilot LX flying-probe in-circuit test systems.
News from JTAG Technologies, Feb 2, 2005
CD explains semiconductor reliability testing
Keithley Instruments has released an interactive, tutorial CD on reliability testing for semiconductor test engineers.
News from Keithley Instruments, Jan 24, 2005
Mainframe cuts the cost of test system switching
The Model 7002-HD high-density two-slot switching mainframe and cards combine to offer instrument grade switching at a price up to 40% less than comparable platforms.
News from Keithley Instruments, Jan 24, 2005
Burn-in tester boosts memory module reliability
Kingston Technology has developed a proprietary test platform designed to detect early-life failure (ELF) in server memory modules.
News from Kingston Technology, Nov 18, 2004
Platform automates handset testing
TestQuest will demonstrate the latest enhancements to its TestQuest Pro platform at the Smart Phone Show at the London ExCel on 5th and 6th October 2004.
News from TestQuest International, Oct 5, 2004
Parametric test systems bound for Korea
Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems.
News from Keithley Instruments, Sep 6, 2004
All-in 200mm wafer tester aims for 130nm devices
Keithley Instruments has developed a packaged, ready-to-run parametric test system claiming unrivalled cost-per-pin and total price/performance ratio.
News from Keithley Instruments, Jul 16, 2004
Semiconductor survey shows continued satisfaction
For the 16th consecutive year, Advantest has been rated as one of the world's top equipment suppliers in the annual customer satisfaction survey conducted by industry-analyst firm VLSI Research.
News from Advantest (Europe), Jul 6, 2004
Tester meets Openstar requirements
The Advantest T2000 Series has been certified by the Semiconductor Test Consortium as the industry's first system to meet the Open Semiconductor Test Architecture (Openstar) standard.
News from Advantest (Europe), Jul 6, 2004
Tester gets to grips with high-pin-count SoCs
The T6577 SoC test system is capable of simultaneous high-speed testing - even for odd numbers of devices - and supports input/output (I/O) pins up to 1024 channels.
News from Advantest (Europe), Jun 23, 2004
Collaboration aids high-frequency wafer testing
A novel joint solution from Advantest (Europe) and SUSS MicroTec provides automatic wafer probe testing for 20GHz high-frequency multiport devices.
News from Advantest (Europe), Jun 23, 2004
Photodiodes put to the test
The Model 280 photodiode test system from dBm Optics allows suppliers of PIN and APD photodiodes to characterise the parametric performance of their components in R and D, QA and production.
News from dBm Optics, Mar 23, 2004
High yields depend on reliable measurement
Paul Meyer explains how to improve test accuracy and throughput for optoelectronic components with specifically designed automated test instruments.
News from Keithley Instruments, Mar 2, 2004
Flying probe testers gain boundary scan
Symphony APT-9000 from JTAG Technologies integrates boundary-scan within Takaya flying probe testers.
News from JTAG Technologies, Feb 25, 2004
ATE module aims to spot nanometre-scale defects
The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume.
News from Q-Star Test, Feb 17, 2004
Partnership targets nanotechnology research
Keithley Instruments is working with the Albany NanoTech Center to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies.
News from Keithley Instruments, Feb 6, 2004
SoC tester meets latest standards
The T2000 SoC tester is the first system based on the Openstar standards defined by the Semiconductor Test Consortium (STC).
News from Advantest (Europe), Feb 3, 2004
Catalogue brings full test range together
Keithley Instruments has published its 2004 catalogue of test and measurement products for engineering development, production testing, and scientific research.
News from Keithley Instruments, Dec 10, 2003
Higher throughput for wafer test equipment
The S680DC/RF parametric test system is the latest addition to the Keithley Instruments S600 Series family.
News from Keithley Instruments, Dec 9, 2003
Distribution deal lines up high-voltage ATE
A new distribution agreement covers the extensive range of automatic electrical testing solutions from MK Test Systems.
News from Tyco Electronics - Global Application Tooling, Dec 5, 2003
Power supply gains plug-and-play drivers
National Instruments IVI drivers are now available for the QL Series of high-performance laboratory bench power supplies.
News from TTi (Thurlby Thandar Instruments), Dec 1, 2003
Acquisition adds burn-in to ATE portfolio
Japan Engineering Co (JEC) is to become a wholly owned subsidiary of Advantest Corp.
News from Advantest (Europe), Nov 12, 2003
Open-architecture LSI tester tackles many tasks
The T2000 Series of system LSI test systems is the industry's first to be based on the new Openstar open architecture standards.
News from Advantest (Europe), Oct 23, 2003
Not what you're looking for? Search the site.
