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ATE Systems

(a sub category of Test and Measurement)

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Latest articles from 'ATE Systems'

News releases from this sub-category

Showing 251-275 of 394 articles

On-chip test boosts ASIC memory yields

Open-Silicon has adopted LogicVision's embedded memory-test and repair-analysis technology as part of the standard tool flow in its ASIC designs.

News from LogicVision Europe, Feb 14, 2005

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AMD signs for DC/RF parametric test system

AMD has selected the Keithley Model S680 DC/RF parametric test system to support full production of advanced logic chips at its new state-of-the-art 300mm Fab 36 in Dresden, Germany.

News from Keithley Instruments, Feb 7, 2005

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Seica systems integrate boundary scan

JTAG Technologies has integrated its test methods within the Seica Pilot and Pilot LX flying-probe in-circuit test systems.

News from JTAG Technologies, Feb 2, 2005

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CD explains semiconductor reliability testing

Keithley Instruments has released an interactive, tutorial CD on reliability testing for semiconductor test engineers.

News from Keithley Instruments, Jan 24, 2005

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Mainframe cuts the cost of test system switching

The Model 7002-HD high-density two-slot switching mainframe and cards combine to offer instrument grade switching at a price up to 40% less than comparable platforms.

News from Keithley Instruments, Jan 24, 2005

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Burn-in tester boosts memory module reliability

Kingston Technology has developed a proprietary test platform designed to detect early-life failure (ELF) in server memory modules.

News from Kingston Technology, Nov 18, 2004

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Platform automates handset testing

TestQuest will demonstrate the latest enhancements to its TestQuest Pro platform at the Smart Phone Show at the London ExCel on 5th and 6th October 2004.

News from TestQuest International, Oct 5, 2004

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Parametric test systems bound for Korea

Keithley Instruments has received a multiple-fab, multiple-system order from a leading Korean semiconductor manufacturer for its S680 DC/RF parametric test systems.

News from Keithley Instruments, Sep 6, 2004

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All-in 200mm wafer tester aims for 130nm devices

Keithley Instruments has developed a packaged, ready-to-run parametric test system claiming unrivalled cost-per-pin and total price/performance ratio.

News from Keithley Instruments, Jul 16, 2004

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Semiconductor survey shows continued satisfaction

For the 16th consecutive year, Advantest has been rated as one of the world's top equipment suppliers in the annual customer satisfaction survey conducted by industry-analyst firm VLSI Research.

News from Advantest (Europe), Jul 6, 2004

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Tester meets Openstar requirements

The Advantest T2000 Series has been certified by the Semiconductor Test Consortium as the industry's first system to meet the Open Semiconductor Test Architecture (Openstar) standard.

News from Advantest (Europe), Jul 6, 2004

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Tester gets to grips with high-pin-count SoCs

The T6577 SoC test system is capable of simultaneous high-speed testing - even for odd numbers of devices - and supports input/output (I/O) pins up to 1024 channels.

News from Advantest (Europe), Jun 23, 2004

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Collaboration aids high-frequency wafer testing

A novel joint solution from Advantest (Europe) and SUSS MicroTec provides automatic wafer probe testing for 20GHz high-frequency multiport devices.

News from Advantest (Europe), Jun 23, 2004

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Photodiodes put to the test

The Model 280 photodiode test system from dBm Optics allows suppliers of PIN and APD photodiodes to characterise the parametric performance of their components in R and D, QA and production.

News from dBm Optics, Mar 23, 2004

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High yields depend on reliable measurement

Paul Meyer explains how to improve test accuracy and throughput for optoelectronic components with specifically designed automated test instruments.

News from Keithley Instruments, Mar 2, 2004

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Flying probe testers gain boundary scan

Symphony APT-9000 from JTAG Technologies integrates boundary-scan within Takaya flying probe testers.

News from JTAG Technologies, Feb 25, 2004

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ATE module aims to spot nanometre-scale defects

The QT-1410 is a novel digital transient current monitor module that aims to increase IC test coverage while reducing test cost and time to volume.

News from Q-Star Test, Feb 17, 2004

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Partnership targets nanotechnology research

Keithley Instruments is working with the Albany NanoTech Center to share research information and work together to further the understanding of nanotechnology and optoelectronics technologies.

News from Keithley Instruments, Feb 6, 2004

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SoC tester meets latest standards

The T2000 SoC tester is the first system based on the Openstar standards defined by the Semiconductor Test Consortium (STC).

News from Advantest (Europe), Feb 3, 2004

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Catalogue brings full test range together

Keithley Instruments has published its 2004 catalogue of test and measurement products for engineering development, production testing, and scientific research.

News from Keithley Instruments, Dec 10, 2003

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Higher throughput for wafer test equipment

The S680DC/RF parametric test system is the latest addition to the Keithley Instruments S600 Series family.

News from Keithley Instruments, Dec 9, 2003

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Distribution deal lines up high-voltage ATE

A new distribution agreement covers the extensive range of automatic electrical testing solutions from MK Test Systems.

News from Tyco Electronics - Global Application Tooling, Dec 5, 2003

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Power supply gains plug-and-play drivers

National Instruments IVI drivers are now available for the QL Series of high-performance laboratory bench power supplies.

News from TTi (Thurlby Thandar Instruments), Dec 1, 2003

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Acquisition adds burn-in to ATE portfolio

Japan Engineering Co (JEC) is to become a wholly owned subsidiary of Advantest Corp.

News from Advantest (Europe), Nov 12, 2003

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Open-architecture LSI tester tackles many tasks

The T2000 Series of system LSI test systems is the industry's first to be based on the new Openstar open architecture standards.

News from Advantest (Europe), Oct 23, 2003

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Showing 251-275 of 394 articles

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