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ATE Systems
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Lutz to develop European business
Advantest (Europe) has appointed Klaus Lutz as Director New Business Development.
News from Advantest (Europe) ( 9 October 2006)
Array option expands scope of parametric tester
Test system makes parametric test a viable option for the yield ramp-up phase for the first time by allowing users to test more structures in less time with greater throughput.
News from Agilent Technologies Europe ( 4 October 2006)
Keithley sponsors wireless weblog
Keithley Instruments is sponsoring a weblog, or blog, designed exclusively for engineers working in the wireless industry. Brochure available
News from Keithley Instruments (22 September 2006)
In-circuit tester adds boundary scan option
Goepel Electronic and Spea have developed a next generation boundary scan option for the Spea 3030 in-circuit tester (ICT). Brochure available
News from Goepel Electronic (21 September 2006)
Instrument drives aid ATE system design
Acqiris has introduced a range of class-compliant Interchangeable Virtual Instrument (IVI) drivers that support the company's full range of digitisers.
News from Acqiris USA (19 September 2006)
Ten years of UK technical support
JTAG Technologies is celebrating a decade of providing technical support in the UK. Brochure available
News from JTAG Technologies (14 September 2006)
Online market upgrades listing system
Used-Line has upgraded its online listing system for private sellers.
News from Used-Line.com ( 5 September 2006)
Cable tester adds confidence to switch performance
User application article A Synor 1202 cable tester purchased to validate complex six-position rotary switch assemblies with 242 external pin connections for the rail industry, has proved to be a great success. Brochure available
News from Cropico (31 August 2006)
Weblog focuses on semiconductor test issues
The Semiconductor Test Blog informs visitors of the latest technical and business developments in the semiconductor industry and their impact on testing. Brochure available
News from Keithley Instruments (11 August 2006)
Boundary scan seminars promise enthralling agenda
Seminars offer an in-depth view on the burgeoning uses of boundary scan within the design, manufacture and service of digital circuit boards and systems. Brochure available
News from JTAG Technologies (10 August 2006)
EADS Test and Services acquires
EADS Test and Services has acquired the company Get Electronique based in Castres near Toulouse, France.
News from EADS Test and Services ( 2 August 2006)
Expansion set to double tester output
With the completion of a brand new 1300m2 production hall, Seica has nearly doubled its production capacity.
News from Seica (19 July 2006)
Motorola standardises on boundary scan systems
Asset InterTech has signed a multiyear contract to become Motorola's worldwide supplier of boundary scan (IEEE1149.1 or JTAG) electronic test systems.
News from Asset InterTech (17 July 2006)
T and M website adds PDA interface
A leading search engine for test and measurement equipment now includes a PDA web interface.
News from Used-Line.com (17 July 2006)
16-channel mixed-signal module for SoC test
High integration dramatically reduces test cost for consumer ICs while delivering accuracy, flexibility and high performance.
News from Advantest (Europe) (14 July 2006)
Antares conTech and UMD to Merge
Antares conTech and UMD Advanced Test Technologies to merge to create leader in semiconductor test market.
News from UMD Advanced Test Technologies (13 July 2006)
Advantest stars in customer satisfaction survey
Users of Advantest's test and material handling systems have ranked it among the industry's 10 best large semiconductor equipment suppliers in an annual customer satisfaction survey.
News from Advantest (Europe) (12 July 2006)
Best build quality is key to ATE survey success
Advantest Corporation has earned a place on VLSI Research's "10 Best" list for the 18th consecutive year.
News from Advantest (Europe) (12 July 2006)
Flying probe tester gains boundary scan option
Goepel Electronic has developed a boundary scan option for the Spea FPT 4040 flying probe tester as part of an OEM agreement. Brochure available
News from Goepel Electronic ( 3 July 2006)
Intel prefers Advantest
Advantest has received Intel Corporation's Preferred Quality Supplier award for outstanding performance in providing products and services deemed essential to Intel's success.
News from Advantest (Europe) ( 5 June 2006)
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