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ATE Systems
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Analysing time-dependent observations
Harmonic Software has released version 2.1 of STSA, the statistical time series analysis toolbox for O-Matrix.
News from Harmonic Software (14 December 2006)
Expanded use of embedded test solutions
User application article LogicVision has announced that its embedded test solutions have been selected by NEC Electronics to help ensure impeccable quality and manufacturability, targeting SoC designs.
News from LogicVision Europe (14 December 2006)
Embedded memory tests aid parallel processing
User application article Rapport has adopted LogicVision's leading edge memory BIST solutions for next-generation Kilocore Architecture-based products.
News from LogicVision Europe ( 5 December 2006)
Automatic test system keeps Boeings in the air
Pakistan International Airlines has acquired a first ATEC Series 6 test system from EADS Test and Services plus 28 associated test programs for maintaining its Boeing fleet in Karachi, Pakistan.
News from EADS Test and Services ( 1 December 2006)
Upgrade for semiconductor characterisation
KTE Interactive V6.1 is an updated version of the powerful measurement software for the Model 4200-SCS semiconductor characterisation system. Brochure available
News from Keithley Instruments (24 November 2006)
Spea adds boundary scan to in-circuit tester
Spea and JTAG Technologies have collaborated to integrate JTAG's test methods within the Spea 3030 in-circuit test system. Brochure available
News from JTAG Technologies (22 November 2006)
More options for multifunction ATE system
Multiconfiguration, multifunction ATE system is improved with the addition of a boundary scan and Q-test capability along with a PXI software wrapper tool.
News from Aeroflex (21 November 2006)
Software environment speeds test program debug
New from Teradyne, Debug Pro is a user-friendly software debug environment for TestStation ICT equipment.
News from Teradyne (16 November 2006)
Boundary-scan software extends to dot6 standard
JTAG Technologies has announced the industry's most complete support for PCB and systems testing based on IEEE standard 1149.6 for advanced digital networks. Brochure available
News from JTAG Technologies (15 November 2006)
Pin cards add versatility to in-circuit testing
Teradyne has released two new pin cards for its TestStation ICT platform.
News from Teradyne (15 November 2006)
System speeds PCB test throughput
Flying probe test system addresses demand for cost-effective test solutions that will further enhance ease of programming, high fault coverage and fast throughput for PCB test.
News from Seica (13 November 2006)
Test system is ready for memory expansion
Test system is designed for multipurpose memory devices such as DRAM, SDRAM and DDR SDRAM, as well as Flash memory and package test of MCP and other devices.
News from Advantest (Europe) (13 November 2006)
Networking software simplifies harness testing
Dynalab's NX Server networking software now offers simplified wire harness test program selection and execution.
News from Dynalab Test Systems (13 November 2006)
Probe cards accelerate parametric testing
Keithley Instruments is working with Mesatronic Group (Voiron, France) to develop advanced probe cards for semiconductor parametric testers used in RF and low current DC applications. Brochure available
News from Keithley Instruments (10 November 2006)
Rent-to-buy deal gives easy access to testers
User application article The key to Exception EMS' successful Fast Track service for single batch prototyping at the highest technical levels has been its approach to assembled board testing.
News from Itochu Europe ( 9 November 2006)
Functional tester is made for low-cost handsets
Agilent Technologies has introduced the Agilent GS-8000 Lite wireless functional test system targeted at the low-cost manufacturing test of mobile handsets.
News from Agilent Technologies Europe ( 7 November 2006)
Hauptmann manages Central Europe
Bernd Hauptmann has assumed the position of Seica Sales Manager for Central Europe, based in Munich.
News from Seica (27 October 2006)
Bead probes aid ATE accessibility
Agilent Technologies is now licensing its Medalist bead probe technology, a proven methodology for placing solder beads, or "bead probes", directly onto printed circuit board (PCB) signal traces.
News from Agilent Technologies Europe (26 October 2006)
JTAG test execution made simple
Production based JTAG test execution packages feature a simple software interface that allows nontechnical users to perform JTAG testing on a wide range of product lines. Brochure available
News from Direct Insight (19 October 2006)
Sheedy engineers management role
Advantest (Europe) has appointed Gary Sheedy as its new Engineering Manager, based at the company's headquarters in Munich.
News from Advantest (Europe) ( 9 October 2006)
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