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ATE Systems
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Tool combines boundary scan and functional testing
Test tool combines boundary-scan and functional test technologies to achieve higher test coverage.
News from Corelis (14 March 2007)
Drag and drop tool for building test applications
A graphical environment allows complex test and measurement applications to be developed using drag-and-drop tools that do not require a knowledge of programming to use.
News from Data Translation (13 March 2007)
Test systems to support Rafale fighters
Seica and EADS Test and Services have received a contract from Dassault Aviation to provide test systems for the production testing of onboard electronics of Rafale fighters.
News from Seica (13 March 2007)
Soft landing for ATE acquisition
"Rent to buy" scheme reduces risks involved in specifying and purchasing test and inspection equipment.
News from Itochu Europe ( 5 March 2007)
Aerospace show is launchpad for board tester
Combination board tester is capable of testing the highly complex, densely populated PCBs typically found in aerospace environments.
News from Cupio (26 February 2007)
Missile maker migrates to ATE
Agilent Technologies has been awarded a US $12.6 million contract by Raytheon to deliver an advanced, next-generation automated manufacturing test platform.
News from Agilent Technologies Europe (23 February 2007)
Distribution deal expands N European coverage
LogicVision has appointed ISS Group to distribute its products in the UK, Norway, Poland, Finland, Ireland, Denmark and Sweden.
News from LogicVision Europe (23 February 2007)
Interactive test tutorial on CD
Keithley Instruments has released the Simplified Test Toolkit, an interactive tutorial CD that helps test engineers overcome tough measurement challenges. Brochure available
News from Keithley Instruments (19 February 2007)
Five star rating for commitment to customers
VLSI Research has awarded Keithley a five star rating among process diagnostics companies, the highest possible rating for overall customer satisfaction. Brochure available
News from Keithley Instruments ( 2 February 2007)
Parallel test technology explained
Keithley Instruments has published "Parallel test technology: the new paradigm for parametric testing", a semiconductor parametric test handbook. Brochure available
News from Keithley Instruments (31 January 2007)
Used equipment marketplace has more info
Website for high-tech and scientific equipment adds a dealer directory and a community forum that encourages the participation of buyers and sellers alike.
News from Used-Line.com (30 January 2007)
Boundary-scan enhancement is best in test
JTAG Technologies' TapCommunicator has won a prestigious Best-In-Test award at T and M World's 2007 prize-giving event. Brochure available
News from JTAG Technologies (18 January 2007)
Waveform generator wins honourable mention
A baseband waveform generator digitiser module, introduced at Semicon West last year, has won an honourable mention in Test and Measurement World's 2007 Best in Test awards.
News from Advantest (Europe) (12 January 2007)
Open test platform turns to high-volume SoCs
ATE is specifically designed with the compactness and modularity required to effectively test today's high-functionality SoC consumer devices.
News from Advantest (Europe) (20 December 2006)
Alliance focuses on automotive component testing
Cadence Design Systems and Advantest Corp have announced a collaborative partnership to deliver a methodology for zero-defect testing of digital automotive electronics.
News from Advantest (Europe) (20 December 2006)
Diagnostic software works with Teradyne testers
Teradyne and LogicVision have established seamless interaction between LogicVision's ETAccess semiconductor diagnostic products and Teradyne UltraFlex test systems.
News from LogicVision Europe (19 December 2006)
Tester boosts NAND Flash memory throughput
Test system uses tester-per-site architecture, the optimal choice for Flash memory test, to maximise efficiency at every stage of NAND test from wafer test to package test.
News from Advantest (Europe) (19 December 2006)
Development Toolset cuts handset development time
Development Toolset is slicing significant time and cost from handset design projects.
News from Anite Telecoms (15 December 2006)
Q-Star Test partners with test service provider
Q-Star Test and DEI announce a strategic cooperation - serving the Chinese market with solutions targeting product quality improvement and test cost and time-to-volume reduction
News from Q-Star Test (14 December 2006)
Parallel test and RF testing enhanced
Keithley Instruments announces the release of KTE V5.2, Keithley's Interactive Test Environment software for the Series S600 Parametric Test System. Brochure available
News from Keithley Instruments (14 December 2006)
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