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ATE Systems
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Alliance to ensure mixed-signal interoperability
ATEEDA has joined the Synopsys in-Sync programme to develop and support interoperability between its mixed-signal test tool and the Synopsys HSpice simulator.
News from ATEEDA ( 2 May 2007)
Handler accelerates memory testing
Dynamic test handler for memory devices such as DDR2/3-SDRAM enables parallel testing of up to 512 devices and boasts a throughput of 20,000 units per hour.
News from Advantest (Europe) (26 April 2007)
Increasing interest spurs LogicVision
LogicVision has announced its financial results for the first quarter of 2007, ended 31st March 2007.
News from LogicVision Europe (26 April 2007)
Vectorless technology cuts the cost of ATE
A low-cost in-circuit test system is targeted at the requirements of ODMs who need "just enough test".
News from Agilent Technologies Europe (25 April 2007)
ATE advances aid production automation
At Nepcon in Birmingham Seica will showcase several new products within its Viva Integrated Platform that aim to meet the challenges of today's focus on automation.
News from Seica (23 April 2007)
Chip tester appoints new senior VP of Engineering
A semiconductor test specialist has appointed a 24-year industry veteran to the role of Senior Vice President of Engineering, with implementation responsibility for all product lines.
News from Credence Systems Corp (23 April 2007)
Instrument maker issues Q2 profit warning
An instrumentation specialist has announced that sales levels for the second quarter of fiscal 2007 fell short of the guidance range that was previously provided. Brochure available
News from Keithley Instruments (18 April 2007)
Chinese customers appreciate Advantest
Advantest has been named one of the best customer-rated equipment suppliers in China.
News from Advantest (Europe) (18 April 2007)
Automotive tester majors on infotainment systems
Functional test system is designed to test all infotainment and telematics modules in cars.
News from Agilent Technologies Europe (18 April 2007)
Testers automate device characterisation
Integrated test systems enable semiconductor characterisation at the device, wafer and cassette level. Brochure available
News from Keithley Instruments (16 April 2007)
Nanotechnology measurements explained
Handbook provides a 124-page guide to electrical measurements for nanoscience applications. Brochure available
News from Keithley Instruments (16 April 2007)
Semiconductor test conference for Napa Valley
The second Global STC conference is open to all STC members as well as other semiconductor, equipment and instrumentation companies.
News from Semiconductor Test Consortium (16 April 2007)
Freescale adopts software for IC characterisation
Characterisation platform is designed to significantly reduce the time and effort engineers spend sifting through all the data and correlating results.
News from VI Technology (11 April 2007)
Taylor tackles regulatory compliance
Keithley Instruments has named Suzanne Schulze Taylor as its Vice President, General Counsel and Chief Compliance Officer. Brochure available
News from Keithley Instruments ( 6 April 2007)
Parametric test platform comes in three flavours
Next-generation parametric test platform is designed to meet the evaluation needs of engineers working in semiconductor fabs and research environments.
News from Agilent Technologies Europe ( 3 April 2007)
Semiconductor tester gains extra capabilities
Significant enhancements to a Semiconductor Characterisation System enable new features like Flash memory testing, high-power RF device testing, and pulse testing for advanced semiconductor materials. Brochure available
News from Keithley Instruments ( 2 April 2007)
Mosaid exits ATE business
Mosaid Technologies has concluded the sale of certain assets of its Systems Division's automatic test equipment (ATE) business to Teradyne for US $20 million in cash.
News from Mosaid (30 March 2007)
Test company named as preferred quality supplier
Test company named a recipient of Intel's Preferred Quality Supplier (PQS) award for outstanding performance in providing products and services deemed essential to Intel's success.
News from Advantest (Europe) (29 March 2007)
Distributor appointment expands Japanese support
LogicVision has signed up Noah Corporation as distributor for its products in Japan.
News from LogicVision Europe (21 March 2007)
Enhancements to PCB test systems on show at Nepcon
Enhancements to PCB testers include new digital functional testing, mixed-signal testing, in-system programming and improved probing speeds.
News from Aeroflex (16 March 2007)
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