http://www.electronicstalk.com/indexes/categorybrowseta.html ATE Systems latest news on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Thu, 15 May 2008 08:00:00 UT Thu, 15 May 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 The CD that also includes a large variety of semiconductor test application information such as applications notes, white papers and presentations. Fri, 09 May 2008 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei222.html Harness testers include the capability of high-voltage testing for insulation resistance up to 1Gohm and dielectric withstand up to 1500V DC. Fri, 09 May 2008 08:00:00 UT Dynalab Test Systems http://www.electronicstalk.com/news/dyl/dyl105.html The handbook is free and discusses topics such as the switching function and switching components, issues in switch system design, switch configurations by signal type and applications. Thu, 08 May 2008 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei221.html Reliability test and data analysis tools allow ACS-based test systems to produce lifetime predictions as much as five times faster than traditional WLR test solutions. Thu, 01 May 2008 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei220.html The Automated Test Summit 2008 will be hosted live online on 5th June 2008, and will be presented in the Americas, Europe and Asia. Wed, 30 Apr 2008 08:00:00 UT National Instruments http://www.electronicstalk.com/news/naa/naa365.html The T5503 tester's semiconductor circuitry makes full use of the latest CMOS technology to achieve greater packaging density. Thu, 24 Apr 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb170.html Test system provides low cost of test and supports a full range of digital, mixed-signal, RF and wireless applications. Tue, 08 Apr 2008 08:00:00 UT Verigy http://www.electronicstalk.com/news/vey/vey100.html The Pilot V8 has 14 mobile resources fully available to test the UUT, with a full range of in-circuit and functional test capabilities. Mon, 31 Mar 2008 08:00:00 UT Seica http://www.electronicstalk.com/news/sez/sez108.html IMC and Keithley will work together on joint research projects to expand existing applications as well as research emerging wireless applications and technologies. Fri, 28 Mar 2008 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei219.html Eagle Test's 200T/FT Series offers the industry's most complete final test solution for discrete devices. Mon, 24 Mar 2008 08:00:00 UT Eagle Test Systems http://www.electronicstalk.com/news/eam/eam100.html Novel limited access technique for in-circuit testing eliminates the need for physical test points, offering benefits that traditional vectorless testing cannot provide. Fri, 21 Mar 2008 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn283.html DiGiCo uses boundary-scan test to verify the assembly of the 10-layer surface-mount PCB at the heart of its audio mixing consoles. Wed, 12 Mar 2008 08:00:00 UT JTAG Technologies http://www.electronicstalk.com/news/jta/jta138.html The XJTAG system has been used by engineers at Curtiss-Wright's video and graphics group in Letchworth, UK, to debug and test its latest range of printed circuit boards. Tue, 11 Mar 2008 08:00:00 UT XJTAG http://www.electronicstalk.com/news/xjt/xjt117.html The co-operation between Q-Star Test and Source III has already led to the establishment of a push-button automated WGL-based VTRAN flow. Tue, 26 Feb 2008 08:00:00 UT Q-Star Test http://www.electronicstalk.com/news/qst/qst106.html Intepro has developed an automatic test system designed to test batteries by performing charge and discharge cycles while monitoring key battery parameters in real time. Tue, 19 Feb 2008 08:00:00 UT Intepro UK http://www.electronicstalk.com/news/idk/idk104.html Technology is a hybrid between two established test methodologies in today's electronic manufacturing test environment: boundary scan and VTEP vectorless testing. Mon, 18 Feb 2008 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn275.html Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour. Fri, 25 Jan 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb169.html Keithley's Automated Characterisation Suite, V3.2 contains ready to run applications for its 4200-SCS, 2600 System SourceMeter instruments and other SMU-based systems. Fri, 11 Jan 2008 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei217.html The addition of boundary scan offers 5800 Series users the advantage of structural device, board and system-level test access throughout the whole product lifecycle. Fri, 16 Nov 2007 08:00:00 UT Aeroflex http://www.electronicstalk.com/news/aof/aof197.html Manufacturers can perform simultaneous testing of two PCBs, effectively doubling their test throughput without doubling capital equipment costs. Thu, 15 Nov 2007 08:00:00 UT Teradyne http://www.electronicstalk.com/news/tee/tee140.html The JT 3705/USB can be used for structural board testing or in-system device programming (ISP) of CPLDs and flash memories. Fri, 09 Nov 2007 08:00:00 UT JTAG Technologies http://www.electronicstalk.com/news/jta/jta137.html Functional test system helps accelerate test-solution development and deployment, helping automotive manufacturers get their products to market faster. Thu, 01 Nov 2007 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn248.html Mixed-signal, concurrent 1149.1/JTAG and CPU emulation based functional tests are combined in a single platform for testing up to 32 PCBs at a time. Thu, 01 Nov 2007 08:00:00 UT Intellitech Corp http://www.electronicstalk.com/news/iky/iky100.html The 12GWSGA RF module is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market. Fri, 19 Oct 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb168.html Embedding large blocks of DRAM into SoCs creates new test and yield challenges due to the higher circuit densities of eDRAMs over more traditional embedded SRAMS. Wed, 17 Oct 2007 08:00:00 UT LogicVision Europe http://www.electronicstalk.com/news/log/log128.html Keithley Instruments has released a 4X4 MIMO (multiple-input, multiple-output) RF test system for R and D and production testing of next generation RF communications equipment and devices. Wed, 10 Oct 2007 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei214.html Keithley Instruments' 4200-CVU instrument is designed for the company's 4200-SCS semiconductor characterisation system. Wed, 10 Oct 2007 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei215.html LXI-based power supply test system addresses the growing market for AC/DC and DC/DC power convertors under 1000W in one single-bay cabinet. Fri, 21 Sep 2007 08:00:00 UT Intepro UK http://www.electronicstalk.com/news/idk/idk103.html Platform provides basis for custom military and aerospace test equipment using drag-and-drop system creation and modification. Wed, 19 Sep 2007 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn242.html The series 3700 system switch/multimeter solutions offer scalable, high-performance switching and multi-channel measurements, optimised for automated testing of electronic products and components. Mon, 17 Sep 2007 08:00:00 UT Keithley Instruments http://www.electronicstalk.com/news/kei/kei211.html Agilent's 11713B and 11713C attenuator/switch drivers allow quick, easy design validation and automated testing. Wed, 12 Sep 2007 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn240.html The R and S TS-PHDT high-speed digital test module features a maximum data rate of 40MHz and a storage capacity of 1.5Gbyte. Fri, 31 Aug 2007 08:00:00 UT Rohde and Schwarz http://www.electronicstalk.com/news/rhd/rhd253.html