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Test Accessories
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Probe suits vehicle testing buses
The PBH1000 is robust enough for use in the in-vehicle test environment and will withstand maximum voltages of +/-100V (transient) and +/-35V.
News from Yokogawa Europe - Test and Measurement ( 6 May 2008)
Portable touchscreen makes mobile ATE
Accessory is ideal for a variety of portable PXI applications, such as in-vehicle test, mobile diagnostics and personal ATE in the automotive, ATE and aerospace and defence industries. Brochure available
News from National Instruments ( 5 May 2008)
Probes cater for cramped assemblies
Half-length threaded switch probes are ideal for applications where space is limited.
News from Peak Test Services (28 April 2008)
Antenna coupler covers Tetra frequencies
Antenna coupler for Tetra frequencies complements the 2303 Stabilock, a dedicated Tetra mobile station tester for service in the field of PMR.
News from Willtek Communications ( 7 April 2008)
Probes promise faster RF testing
Probe card cuts the cost of high-volume wafer testing of RF filters and switches by offering superior probe performance and longer life at a lower cost.
News from Cascade Microtech ( 3 April 2008)
Probes put locks on trial
Pushback test probes check out the locking mechanism of sockets and pins inside connectors.
News from Peak Test Services (17 March 2008)
Thermal management makes burn-in more accurate
User application article Intelligent socket integrates heater, heatsink and thermal sensor, which calculates the precise amount of heat, or cooling, needed to maintain a device at a programmed temperature.
News from Antares Advanced Test Technologies (21 February 2008)
Switching matrix creates complex RF test systems
Economical modular switch and control platform can be used in applications from simple RF switching all the way to complex EMC systems.
News from Rohde and Schwarz (20 February 2008)
Harness and connector probe offers tip options
Screw-in probe is designed for push-back testing of wire harnesses and connectors.
News from Peak Test Services (15 February 2008)
Probes put handset protocols on test
System based on Agilent's 16900 logic analyser platform facilitates MIPI D-PHY hardware and software debug and reduces interoperability testing.
News from Agilent Technologies Europe (15 February 2008)
Test socket promises minimal signal loss
Socket is ideal for manual high-speed testing of devices such as CSP, micro-BGA, DSP, LGA, SRAM, DRAM and Flash, with pitches as low as 0.40mm.
News from Aries Electronics (11 February 2008)
Board sets the standard for DDR3 testing
Clock reference board enables memory module and system designers to validate DDR3 RDIMMs and simulate system-level functionality effectively and efficiently.
News from Inphi Corp (31 January 2008)
Probe meets demands of faster DRAM
Agilent's new DDR BGA probe provides direct access to the balls of the DRAM with low loading and minimal impact to signal integrity.
News from Agilent Technologies Europe (29 January 2008)
Liberty brings signal integrity expertise
Combined company will help customers achieve electrical performance objectives in test and functional interconnect with signal integrity validation and simulation.
News from Ardent Concepts (23 January 2008)
Switches enable high-speed ATE systems
Coaxial solid-state PIN diode switches target engineers designing manufacturing test systems or requiring a fast switching solution to validate component performance.
News from Agilent Technologies Europe (21 January 2008)
Screw-in probes test harnesses and connectors
Nonrotating blade-shaped tip styles ensure perfect alignment when used in connector blocks.
News from Peak Test Services (11 January 2008)
Wafer probing provides 45nm resolution
Users of the Elite 300 wafer probe station won't have to retool at each process node or lose business to competing foundries with more accurate test capabilities.
News from Cascade Microtech ( 8 January 2008)
DC-coupled amp allows sensitive measurement
Laser Components has expanded its amplifiers portfolio with the HCA-400M-5K-C high-speed current amplifier from Femto.
News from Laser Components (UK) ( 4 January 2008)
Fine-pitch burn-in socket takes larger devices
Sockets use compression mount technology, in which the flexible contacts are pressed onto the contact pads of the PCB by screwing the socket to the board.
News from Yamaichi Electronics (27 December 2007)
Wideband power sensor works with PCs
The NRP-Z81 is suitable for the analysis of radar and communications signals up to 30MHz RF bandwidth with a sensor rise-time of less than 13ns.
News from TTi (Thurlby Thandar Instruments) ( 7 December 2007)
Compact RF switch eases device testing
Device measures only 2.5 x 2.5 x 1.4mm and is designed to reliably test microwave frequencies throughout a product's development stage up to final production.
News from Murata Electronics (UK) (30 November 2007)
Current transformer upgrades power analysis
Unit offers a high-precision alternative to current clamps in applications where current measurements need to be made on already installed conductors.
News from Yokogawa Europe - Test and Measurement (27 November 2007)
Chambers apply more thermal stress
Temperature and humidity chambers offer faster temperature changes to apply thermal stress to units under test.
News from Unitemp (22 November 2007)
Solid-state amps aid comms and EMC tests
High linearity amplifiers are particularly suitable for use in systems such as CDMA, GSM, AMPS and TACS.
News from Link Microtek (19 November 2007)
Reference gateway sets standard for VoIP
The MFE VIII is ideal for system optimisation and development as well as quality control and benchmark testing.
News from Head Acoustics (12 November 2007)
Threaded probes get into tight spaces
The P70/G Series threaded test probe is believed to be the shortest threaded probe available for 2.54mm (0.1in) centres.
News from Peak Test Services ( 6 November 2007)
Semiconductor socket accommodates 0.35mm pitches
Antares Advanced Test Technologies' 880 series clamshell burn-in socket can accommodate the latest QFN packages and reduce maintenance-related downtime.
News from Antares Advanced Test Technologies (31 October 2007)
Extension cable takes probes to extremes
Probing solution enables oscilloscope measurements in environmental chambers and in other settings with extreme temperature conditions.
News from Agilent Technologies Europe (30 October 2007)
Switch probe is designed for rear assembly
Rear assembly allows efficient, simple and quick replacement, with the probe being screwed into the receptacle without having to dismantle the fixture or module.
News from Peak Test Services (22 October 2007)
Test socket aids mass production
The Quatrix Kelvin QFN test socket allows chipmakers to migrate Kelvin-configuration testing of QFN packages from the lab to mass production
News from Antares Advanced Test Technologies ( 3 October 2007)
Enclosures protect against shocks
The risk of an electric shock during product testing is completely eliminated with the latest range of test fixtures and enclosures from electrical safety testing specialist Clare Instruments. Brochure available
News from Clare Instruments ( 2 October 2007)
Electronic loads reduce testing power wastage
The key to the Intepro Loadsaver's energy saving is its power-recycling unit.
News from Intepro UK (30 August 2007)
Decade boxes set resistance standards
Range includes five-, six- and eight-decade boxes designed to provide highly accurate and variable standard values of resistance and current for calibration, comparison and test applications. Brochure available
News from Cropico (15 August 2007)
Rugged boxes are around for four decades
Decade boxes are available for resistance, capacitance and inductance - with ranges of values, power handling capabilities and accuracies to suit many different needs.
News from Time Electronics (15 August 2007)
Probes add to oscilloscope applications
Active probes complement the recently introduced DL9040L and DL9140L digital oscilloscopes.
News from Yokogawa Europe - Test and Measurement (10 August 2007)
Spring test probes and receptacles come together
52-page catalogue gives full details of one of the widest ranges of probes available in the UK.
News from Peak Test Services (27 July 2007)
Connection kit eases spectrum analyser links
Spectrum analyser cable and adapter kit provides the most popular and useful coaxial accessories to interconnect B+K Precision's Model 2650 and 2658 spectrum analysers.
News from B+K Precision (28 June 2007)
PC software masters complex pulses
Pulse sequencer PC software for R and S signal generators allows users to easily generate libraries of complex pulses and to combine them into pulsetrains.
News from Rohde and Schwarz (25 June 2007)
ZIF sockets take stress out of burn-in and test
Open-top 0.5mm-pitch QFN sockets for test and burn-in applications feature novel high-reliability ZIF contact mechanism.
News from Yamaichi Electronics (25 June 2007)
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