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Test Accessories
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Leads and connectors stand the test of measurement
A new test and measurement catalogue presents a comprehensive portfolio of high-quality components specifically designed for the requirements of measurement and test labs.
News from Huber+Suhner ( 3 June 2003)
Probe helps test high-speed serial buses
A new 5GHz differential oscilloscope probe aims to help engineers working with fast serial bus technologies such as PCI-Express, RapidIO, Serial ATA and SPI/SFI5. Brochure available
News from Tektronix (30 May 2003)
Test leads clip on through insulation
A new line of insulation-piercing alligator clip test leads suitable for a wide range of automobile applications has been introduced by Warwick Test Supplies.
News from Warwick Test Supplies (23 April 2003)
Current probes aim for tight spaces
The new Micro Clamp series of AC current probes for current measurements up to 300A RMS combine a lot of features within a compact design.
News from LEM Heme (15 April 2003)
Differential probes help in analysis
New from LeCroy are the first three members of a family of high-performance WaveLink series probes.
News from LeCroy ( 8 April 2003)
Test cable stays stable with temperature
The new and improved MegaPhase SuperFlex 26.5GHz test temperature stable cable is phase and amplitude stable with unparalleled temperature stability of better than 7ppm/C from -40 to +125C.
News from MegaPhase (27 March 2003)
Probe needles offer high electrical conductivity
Designed for use in wafer and hybrid test applications, the Atek Technology range of probe needles offers high electrical conductivity and flexural strength as well as corrosion and wear resistance.
News from Atek Technology (17 February 2003)
Mounts speed laser diode testing
The Series 854X line of laser diode mounts are designed for use with Keithley LIV light-current-voltage test systems. Brochure available
News from Keithley Instruments (11 February 2003)
Probes tackle fine-pitch testing
The P10/G Series is a range of fine-pitch threaded test probes and receptacles which offer a spacing between centres of only 0.05in (1.27mm): the smallest yet available.
News from Peak Test Services (11 February 2003)
Channel selector simplifies DWDM testing
The FTB-9310 is a channel selector for commissioning and lighting channels in dense wavelength-division multiplexing networks.
News from EXFO Electro-Optical Engineering ( 5 February 2003)
Probes stand the test of high frequencies
The Yamaichi YED274 series of spring probe test contactors provide up to 500,000 cycles operating life and good high-frequency characteristics.
News from Acal Radiatron (27 January 2003)
Optical interface aids EMC measurements
Link Microtek has introduced an optical interface that enables high-speed transfer of electromagnetic field measurements from a probe back to a PC up to 100m away.
News from Link Microtek (22 January 2003)
Speedy delivery for test sockets
Aries Electronics now offers expedited delivery of two weeks, versus six weeks, for its standard lines of Microstrip and Spring Probe RF test sockets.
News from Aries Electronics (20 January 2003)
Probes get right to the point of ATE
The new P25/Z Series of spring-contact test probes has been introduced by Peak Test Services to meet the demands of greater accuracy in ATE systems for PCB testing.
News from Peak Test Services (13 January 2003)
RF test sockets gain thermoelectric cooling
Aries Electronics now offers its lines of interposer, spring probe and Microstrip Contact RF test sockets with thermoelectric cooling.
News from Aries Electronics ( 9 January 2003)
Double-ended spring probes for fine-pitch testing
A new range of double-ended spring probes designed for fine-pitch test applications has been introduced by Peak Test Services.
News from Peak Test Services ( 9 December 2002)
Adapters set up cables for testing
The Unidapt coaxial adapter system allows field and bench technicians to join any two Unidapt adapters with standard coaxial interfaces.
News from RF Industries (25 November 2002)
Probe for flexible current measurement
The latest version of the well known and very successful LEM-Flex III AC current measurement probe allows safe, accurate and nonintrusive measurements.
News from LEM Heme (14 November 2002)
Ball-contact probes withstand lateral stresses
A new type of spring-contact test probe replaces the conventional contact surface based on a moving head and plunger construction with a spring-loaded ball.
News from Peak Test Services (11 November 2002)
Test sockets come with load boards
Aries Electronics has formed a mutual distributor relationship with Altanova to provide a more complete semiconductor test solution.
News from Aries Electronics (25 October 2002)
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