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Test Accessories
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Springwire connectors put to the test
ODU has developed a flat springwire connector that is ideal for mating to flat blade contacts during quality assurance, test and measurement, maintenance procedures and identity software downloads.
News from ODU UK (11 June 2004)
Novel probe design tips the balance
The P7380 active differential probe incorporates a new architecture claimed to set industry benchmarks for bandwidth to 8GHz and superior signal fidelity with fast rise time and low circuit loading. Brochure available
News from Tektronix ( 9 June 2004)
Test plug works with standard PLCC sockets
Aries Electronics has developed a new test plug for use with standard PLCC sockets.
News from Aries Electronics ( 2 June 2004)
Quick and easy way to get hooked up
William Hughes PCB test points are available in three popular sizes.
News from William Hughes (26 May 2004)
New generation of modular integrating spheres
The new Labsphere range is a modular family of compact, multi-purpose integrating spheres that deliver significant advances in design, performance, availability and affordability.
News from Pro-Lite Technology (14 May 2004)
Antenna coupler covers all 3G and more
The latest antenna couple from Willtek Communications supports the extended frequency ranges for 3G mobile phone testing.
News from Willtek Communications ( 5 May 2004)
Contact technology switches to processor testing
Ardent Concepts has begun shipping high-performance LGA contactor solutions based on its novel Redundant Contact technology.
News from Ardent Concepts ( 4 May 2004)
Novel contact simplifies PGA test fixtures
A new range of high-performance PGA test fixture solutions is based on innovative proprietary interconnect technology - the Redundant Contact.
News from Ardent Concepts (23 March 2004)
DSOs gain solid-state storage option
TTi has a new communications interface option for the Tektronix TDS1000 and 2000 series of low cost digital storage oscilloscopes.
News from TTi (Thurlby Thandar Instruments) (12 March 2004)
Process interface aids drive measurements
LEM has added the PI1 process interface for its Norma power analyser family.
News from LEM UK ( 8 March 2004)
Connect up to 480 test contacts at once
The new G2 mass interconnection system from Virginia Panel Corp is a compact, high-density unit that can simultaneously engage up to 480 signal contacts in seconds.
News from Peak Test Services (29 January 2004)
Mass interconnect modules speed test setups
Virginia Panel Corp's new Gemini 2100 Series six- and 10-module mass interconnect systems offer speed, versatility and a modular approach to rapid UUT changeover in a rugged package.
News from Peak Test Services (16 January 2004)
Switching modules offer faster ATE systems
Five new high-density PXI and SCXI flexible switch modules increase relay density by 433%. Brochure available
News from National Instruments (25 November 2003)
Accessory kits provide bargain upgrades
Fluke has introduced a range of new kits of accessories for its professional handheld meters, offering savings of up to 30% compared with buying the accessories separately. Brochure available
News from Fluke (UK) (24 November 2003)
Probe finds faults with automotive harnesses
The new P14/G from Peak Test Services is a threaded probe designed for use in testing cable harnesses and automotive electrical systems.
News from Peak Test Services (19 November 2003)
Custom boards speed BGA test throughput
Custom-engineered microchip socketed test fixture boards electrically interface test equipment to BGA packages and eliminate the time-consuming need to solder the packages to adapters.
News from Advanced Interconnections Corp ( 4 November 2003)
Test interface lines up eight IC packages
Ardent Concepts has developed a strip test interface technology for IC packages.
News from Ardent Concepts (22 October 2003)
Centre-probe sockets tackle high-frequency tests
A new high-frequency test socket is ideal for manual testing of devices from 14 to 27mm2 with pitches down to 0.50mm, in applications with speeds from 1 to more than 10GHz.
News from Aries Electronics (20 October 2003)
Full range of fine-pitch test probes
A number of new devices have been added to the range of fine-pitch test probes available from Peak Test Services, making it probably the most comprehensive range available in the UK.
News from Peak Test Services (17 October 2003)
Aries upgrades quality system
Aries Electronics has received its ISO9001:2000 upgrade certification, based on an audit performed by the company's independent audit company, Lloyd's Register Quality Assurance of Houston, Texas.
News from Aries Electronics (13 October 2003)
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