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Test Accessories
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Universal functional test system developed
The Peak Group has developed a new universal functional test system based on a series of modules that can be configured to meet the manufacturing test requirements of a variety of industries.
News from Peer Group ( 8 November 2004)
New plant supports Taiwanese probe card demands
Kulicke and Soffa Industries has officially opened its new state-of-the-art probe card manufacturing facility in Hsin Chu, Taiwan.
News from Kulicke and Soffa Industries (20 October 2004)
Test interface solutions on show at ITC
Dimensions Consulting will be demonstrating its full complement of performance-engineered test interface solutions on Booth 1127 at the 35th International Test Conference.
News from Dimensions Consulting (15 October 2004)
New scopes have powerful addon
The TPS2PBND Power Bundle is an industrial power option that complements the new TPS2000 Series of DSOs. Brochure available
News from Tektronix (12 October 2004)
RF socket boasts minimal signal loss
Aries Electronics has a new high-frequency test socket for devices from 28 to 55mm2 wide.
News from Aries Electronics ( 5 October 2004)
Location pin stops probe rotation
The new P309/G test probe from Peak Test Services incorporates a location pin fixed horizontally below the probe head to prevent rotation during assembly.
News from Peak Test Services ( 5 October 2004)
Rolling contacts extend test fixture life
Johnstech International has appointed Alliance Sales (Europe) to handle its high performance test and interconnect products throughout the UK, Scandinavia and Finland.
News from Alliance Sales (Europe) ( 1 October 2004)
Camera system keeps watch over EMC tests
A novel fibre optic camera system provides a robust video link to areas where high electromagnetic radiation exists, such as EMC test cells.
News from Worthy Design (27 September 2004)
This probe is not for turning
A novel threaded probe features an innovative pin-and-slot arrangement to maintain permanently correct orientation with no rotation in the probe receptacle.
News from Peak Test Services ( 6 September 2004)
Adapter simplifies PSOC emulation
Ironwood Electronics has developed a novel small footprint surface mount package emulator foot for 5mm-body, 0.5mm-pitch pins such as the Cypress PSOC CY8C2XXXX family.
News from Logic Technology ( 1 September 2004)
USB controller switches relays for ATE systems
The USB-M 48 USB controller allows users to control relays (up to 500mA primary current) directly from a PC via a standard USB interface. Brochure available
News from Gopel Electronic (31 August 2004)
Broadband antenna expands EMC test solutions
The BHA 9220 is a linearly polarised broadband antenna for EMC and RF measurements over the frequency range 200MHz to 2GHz that may be used both as a transmitter and receiver. Brochure available
News from Schaffner EMC (23 August 2004)
Loopback assembly simplifies transceiver testing
Engineers can achieve a stable and convenient means to test small form-factor pluggable (SFP) and small form factor (SFF) devices with the new LC Loopback assembly from Molex.
News from Molex UK (11 August 2004)
Modules simplify PXI/VXI test interconnection
Virginia Panel Corp's QuadraPaddle modules allow consolidation of multiple PXI or VXI instrument connections to meet diverse test and measurement interconnection requirements.
News from Peak Test Services ( 9 August 2004)
Stackable burn-in ovens maximise flexibility
A new range of stackable burn-in chambers offer maximum flexibility for small lot qualification testing, burn-in, reliability testing as well as research and development applications.
News from Alliance Sales (Europe) ( 6 August 2004)
Voltage transducers provide true RMS answers
The ATVR series of voltage transducers offers true RMS measurement of AC voltage at 120, 250 and 400V.
News from LEM UK (27 July 2004)
Novel probing technology aids high-speed design
The P6960 and P6980 are high-density connectorless probes using new D-Max probing technology for the TLA700 Series of logic analysers. Brochure available
News from Tektronix (26 July 2004)
Robotic probers speed ATE throughput
Owens Design has developed a new addition to its family of robotic probers for the high-end semiconductor test industry.
News from Owens Design ( 7 July 2004)
Module keeps scopes in focus
The LF100 laser focus module constantly monitors the focal position of the microscope and makes adjustments through a motorised focus to maintain a perfect image of the specimen. Brochure available
News from Prior Scientific ( 6 July 2004)
Novel contacts exceed expectations
Ardent Concepts founder and President Gordon Vinther has revealed that the cycle life of Redundant Contact technology has advanced far beyond initial expectations.
News from Ardent Concepts (17 June 2004)
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