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Test Accessories
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Calibration management software gains new features
CMX v2 calibration management software by Beamex, introduces new advanced features, options and benefits. Brochure available
News from Beamex (26 September 2005)
Probe adapter works with spectrum analysers
The RTPA2A real-time probe adapter is an interface hardware module that allows Tektronix active probes to be used with Tektronix real-time spectrum analysers (RTSA). Brochure available
News from Tektronix (23 September 2005)
Temperature controllers stabilise opto testing
The new TCM series of temperature controllers are designed for use with thermoelectric coolers (TECs), also known as Peltier devices.
News from Electron Dynamics (19 September 2005)
Cables claim constant measurement results
Rugged Sucotest 18 cable assemblies are billed as the ideal solution for daily use in assembly shops, test labs and automatic test equipment applications.
News from Huber+Suhner (12 September 2005)
Wideband amp keeps quiet on the testbench
A new solution to wideband amplification is the APT4-00502000-2410-D4 low noise amplifier manufactured by Amplitech.
News from Gigahertz Marketing Solutions ( 9 September 2005)
Test sockets show bigger bandwidth
New test measurements for Aries centre probe test sockets show a 30% improvement in bandwidth over earlier tests.
News from Aries Electronics (23 August 2005)
Ideal light source has lower running costs
Olympus Life and Material Science Europa has today announced the availability of the new Exfo X-Cite 120 fluorescent light source for its microscopes. Brochure available
News from Olympus Life and Material Science Europa (15 August 2005)
Threaded probes answer automotive test demands
The new P940/G Series from Peak Test Services is a family of threaded probes specifically designed to meet customer requirements in the automotive and cable-harness test environments.
News from Peak Test Services (12 August 2005)
Compact temperature chamber is economical package
The new TestEquity Model 140 temperature chamber provides full-range temperature testing in a compact floor standing package.
News from TestEquity ( 2 August 2005)
Couplers cut the cost of microwave measurements
A new series of single directional couplers provide an economical means of measuring microwave power in commercial mobile-phone infrastructure and test systems.
News from Link Microtek (27 July 2005)
Fibre optic test adapter meets the grade
The Armadillo loopback product line is now fully compliant with the EU RoHS Directive.
News from Timbercon (21 July 2005)
Test accessories meet Cat IV requirements
Connectivity specialist Multi-Contact has launched a range of compatible test accessories for use in measurement category IV.
News from Multi-Contact (UK) (21 July 2005)
RF test socket boasts minimal signal loss
A new high frequency test socket accommodates devices from 28 to 40mm2.
News from Aries Electronics (11 July 2005)
Frequency divider is flexible trigger
The PRL-260ANT is a novel programmable TTL/NECL frequency divider.
News from Pulse Research Lab (11 July 2005)
Probe checks high-frequency automotive connectors
A new coaxial probe is designed specifically to test high-frequency connectors for automotive applications.
News from Peak Test Services (11 July 2005)
Current monitors clamp on for accuracy
Alrad Electronics has a new line of wideband clamp-on current monitors manufactured by Pearson Electronics, the highly respected US supplier of high precision current monitors.
News from Alrad Instruments ( 8 July 2005)
Current clamps aid power quality measurement
Three new current clamps complement the Fluke 430 Series of three-phase power quality analysers. Brochure available
News from Fluke (UK) ( 5 July 2005)
Probes get to grips with PCB impedance measurement
New hand probes significantly improve differential TDR measurement integrity for electrical serial data signals compared with using two single-ended probes. Brochure available
News from Tektronix (28 June 2005)
Adapter eases memory device analysis
A new adapter allows high-speed operation simultaneously enabling memory device analysis used in PDAs, cellphones, digital cameras and MP3 players using the Agilent 16XXX logic analyser system.
News from Logic Technology (16 June 2005)
Loopback provides copper-based alternative
A new SFP electrical loopback provides an alternative copper-based solution for loopback testing applications.
News from Timbercon (14 June 2005)
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