Test Accessories

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Environmental equipment comes to Nepcon

Unitemp will be exhibiting at Nepcon UK 2006 on Stand H42 in Hall 12 with both new and established ranges of environmental equipment.

News from Unitemp ( 2 May 2006)

QFN socket is tough enough for test duties

Ironwood Electronics has a new high performance QFN socket for 0.4mm pitch devices.

News from Logic Technology ( 2 May 2006)

High-current probe puts batteries on trial

A high-current probe is suitable for applications in the testing of battery system activated elements, battery contacts and electrical current signal transmission.

News from Peak Test Services ( 1 May 2006)

Electronic loads reach new power levels

The Dynaload Division of Transistor Devices has expanded its popular RBL series of electronic loads to a power level of 6kW.

News from Transistor Devices (24 April 2006)

Temperature chambers aid reliability testing

A new range of UK-designed and manufactured low-cost temperature chambers aids testing of electronic and automotive components and assemblies.

News from Unitemp (18 April 2006)

Chamber provides uniform thermal stress

A new and affordable two-zone thermal shock chamber features a 100-litre capacity and subjects products to uniform thermal stress.

News from Unitemp ( 4 April 2006)

Probes put connector pins on trial

Threaded test probes for testing cable harness connectors feature stepped heads to allow accurate measurements to be made on the depth of pins inside a connector housing.

News from Peak Test Services ( 3 April 2006)

Tuner sets standard for microwave testing

A multipurpose electromechanical microwave tuner provides a versatile load-pull system for characterising transistors and facilitating the optimisation of amplifier matching network designs.

News from Link Microtek (28 March 2006)

Electronic load is made for micro power testing

Amrel's Mini Modular eLoad is billed as the first electronic load specifically designed and packaged to meet the special requirements of the rapidly growing micro power industry.

News from Amrel/American Reliance (24 March 2006)

Load banks aid aerospace testing

User application article Smiths Aerospace uses load banks from REO to test assemblies to such standards as MIL-STD-704F and SAE AS5692. Brochure available

News from REO (UK) (22 March 2006)

Transceivers ease boundary scan integration

SFX-TAP(x)/FXT transceivers are the latest addition to the Scanflex JTAG/boundary scan hardware platform. Brochure available

News from Goepel Electronic (21 March 2006)

Environmental chambers are affordable option

Affordable, compact benchtop temperature and humidity chambers are suitable for testing and monitoring of electronic and automotive components and assemblies.

News from Unitemp (20 March 2006)

Burn-in socket springs into action

A new dynamic burn-in socket handles devices from 14 to 27mm2.

News from Aries Electronics (16 March 2006)

Chambers accelerate reliability studies

Temperature and humidity chambers are designed for the testing and monitoring of electronics, semiconductors and automotive products.

News from Unitemp (13 March 2006)

Carry bag is made for instrumentation

A new cleverly designed carry bag will allow users to carry Tabor equipment with total confidence and freedom thanks to novel design and super-durable materials.