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Test Accessories
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Microkim exclusive representative in the UK
Gigahertz Marketing Solutions has been appointed the exclusive representative in the UK and ROI for Microkim .
News from Gigahertz Marketing Solutions (28 July 2006)
Optical cables set calibration standards
Calibration cables provide documented, precision optical performance for testing, calibration and critical signal integrity applications.
News from Timbercon (24 July 2006)
Extender eases mezzanine card debugging
The NAMC-EXT eases debugging of AMC modules by enabling the user to access the module under test from both sides.
News from Meikon (19 July 2006)
Differential probe offers bandwidth of 1.5GHz
The new Yokogawa PBD2000 2GHz differential probe is a high-bandwidth device designed for measurements in LVDS (low-voltage differential signalling) applications.
News from Yokogawa Europe - Test and Measurement (14 July 2006)
Test sockets handle complex RF devices
A new high frequency test socket for devices from 41 to 55mm2 is ideal for manual testing of devices with pitches down to 0.40mm, in applications with speeds from 1GHz to more than 18GHz.
News from Aries Electronics (11 July 2006)
Coaxial spring probe passes automotive test
Peak Test Services has introduced what is believed to be the first threaded coaxial spring probe on the market.
News from Peak Test Services ( 4 July 2006)
USB adapter cables aid serial data analysis
New Forest Electronics has introduced two USB adapter cables as accessories for its serial data analyser products.
News from New Forest Electronics ( 4 July 2006)
Pulsed source tests without solarisation
The OL 700-22 pulsed xenon flash source is a high-pressure short-arc xenon flash lamp operating at 100Hz.
News from Glen Spectra (29 June 2006)
BNC adapters provide Cat 1 safety
Rugged IEC insulated BNC adapters are built for long service life, safe operation and exceptional reliability.
News from Pomona Electronics (29 June 2006)
Probe kit gets right to the point of test
A useful PCB probe testing kit can be used to provide new or additional test points on printed circuit boards
News from OptoTherm (16 June 2006)
Connectors aid automotive testing
In addition to supplying connector products for in-car electronic and electrical systems, ODU can supply a variety of adapters for testing the increasing number of electronic components.
News from ODU UK (12 June 2006)
Precision resistors stand the test of calibration
Isabellenhutte's compact IKL series resistors can be calibrated to allow users to make precise current measurements from 10 up to 2000A.
News from Isabellenhuette Heusler (12 June 2006)
Module converts scope to serial analyser
An embedded serial triggering and analysis module converts the Tektronix DPO4000 Series oscilloscope family into a powerful tool for embedded system designers.
News from TTI (Thurlby Thandar Instruments) ( 9 June 2006)
Test chambers come with a view
Unitemp has a new range of temperature and humidity chambers designed to provide near optimum viewing for continuous observation of the products during testing.
News from Unitemp ( 6 June 2006)
Test probes switch to finer pitch
Peak Test Services has introduced a new range of threaded switch test probes, the P202/GI5 Series, designed for use with 2.54mm (0.1in) centres.
News from Peak Test Services ( 5 June 2006)
Forster assumes greater technical role
UMD has announced that Dr James Forster will assume broader technical responsibilities for the company's thermal management products including its popular iSocket technology.
News from UMD Advanced Test Technologies (29 May 2006)
Thermal chamber cycles quickly
Unitemp has a new rapid rate thermal cycle chamber designed primarily for the testing and monitoring of miniaturised high density semiconductor devices and other electronic devices.
News from Unitemp (23 May 2006)
Socket switches to lower volume applications
Single Site iSocket addresses an industry demand for low-cost thermal management in lower volume device burn-in applications.
News from UMD Advanced Test Technologies (18 May 2006)
Expansion board expands JTAG coverage
The new XJIO expansion board improves test coverage and fault diagnosis on complex printed circuits, checks power rail levels and can eliminate the need for costly custom test jigs.
News from XJTAG (12 May 2006)
Test clips get to grips with fine pitches
SMD MicroGrabber test clips are designed for easy attachment to surface mount device chips with pitches down to 0.2mm.
News from Pomona Electronics ( 8 May 2006)
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