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Test Accessories
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Terminals add safety to lab power supplies
TTi has introduced a new safety terminal for the company's range of laboratory power supplies.
News from TTI (Thurlby Thandar Instruments) ( 2 November 2006)
USB timing hubs get measurements in sync
The release of the Maestro Series of USB-inSync timing hubs to the US market marks the arrival of second generation USB-inSync technology.
News from Fiberbyte (31 October 2006)
Variable supplies answer test demands
Switch-mode power supplies provide an infinitely variable DC output for test applications. Brochure available
News from REO (UK) (30 October 2006)
Chamber boasts reliable temperature control
Low cost benchtop temperature chamber is ideal for use with electronic, electrical and automotive components, subassemblies and nonflammable substances.
News from Unitemp (26 October 2006)
Generator covers wide application requirements
Digital delay and pulse generator can multiplex signal outputs together forming complex waveforms, making it particularly useful as a PIV and flow analysis trigger source.
News from Quantum Composers (20 October 2006)
Probes expand scope of radiation meter
Available now from RF radiation safety specialist Link Microtek are three new single-axis probes for the Narda SRM-3000 selective radiation meter .
News from Link Microtek (17 October 2006)
Kit answers BNC probing requirements
BNC shielded test probe kit combines a collection of probes and clips designed for quick, efficient test connections.
News from Pomona Electronics (17 October 2006)
Test socket accesses fine-pitch devices
CSP test socket for devices from 28 to 40mm2 is ideal for manual testing of devices with pitches down to 0.40mm.
News from Aries Electronics (11 October 2006)
Avoid common pitfalls in accelerated testing
Technical background article Knowing the following pointers can ensure successful HALT and HASS programmes that improve product reliability and shorten time to market.
News from QualMark ( 2 October 2006)
Test probes slim down for ATE fixturing
Steel tipped probes are designed to provide maximum life in normal operation and are tested beyond 100,000 strokes.
News from Atek Technology (25 September 2006)
Probe gets to the root of SMD contacts
SMD Microtip test probe features a stainless steel needle tip that is curved to aid in probing hard-to-reach areas.
News from Pomona Electronics (19 September 2006)
Test fixture brings scope to USB compliance tests
The new Yokogawa busXplorer-USB is a compact USB 2.0 compliance test solution based on the company's DL9240/9240L family of high-performance digital oscilloscopes.
News from Yokogawa Europe - Test and Measurement (11 September 2006)
Clips pierce wire insulation with ease
Five-way alligator to sheathed right angle clips are designed for easy piercing of wire insulation to contact the inner conductor for measurement.
News from Pomona Electronics ( 8 September 2006)
Merger creates new name in ATE consumables
Antares conTech has completed its merger with UMD Advanced Test Technologies.
News from UMD Advanced Test Technologies ( 6 September 2006)
Major step forward for high-speed probing
Tektronix has announced the extension of the Z-Active family of differential probes with the immediate availability of the 6GHz P7360 active differential probe. Brochure available
News from Tektronix ( 4 September 2006)
Accessories aid LXI test setups
Accessories simplify the testing and use of the LXI Wired Trigger Bus required for Class A LXI devices.
News from Pickering Interfaces (30 August 2006)
Ovens are economical for test and manufacture
Economical ovens can perform a wide range of roles from high temperature tests and drying to heat treatment on production lines.
News from Unitemp (24 August 2006)
Loopback aids electrical network testing
Timbercon introduces its high speed serial data connection (HSSDC) loopback designed for testing electrical signals in high speed networks and systems.
News from Timbercon (18 August 2006)
Interface takes control of high-voltage supplies
Surface mount interface board is small enough to be installed inside existing high voltage power supply offerings, providing digital control of most standard products.
News from Spellman High Voltage Electronics Corp (11 August 2006)
SMD multi-use test kit
Pomona Electronics announces its SMD multi-use test kit, designed for multiple tests of small components and circuit boards
News from Pomona Electronics (28 July 2006)
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