Test Accessories

Archive page 2 of 16

Our RSS feed for Test Accessories press releases

PowerPC board users get diagnositcs CD

A kDiagnostics CD is now shipping with Freescale PowerPC-based reference platforms.

News from Kozio ( 2 March 2007)

Shortform brings probe ranges together

Four-page shortform catalogue covers wire-harness and connector probes.

News from Peak Test Services (23 February 2007)

Programmable load powers up to 6kW

Electronic load with a power level of 6kW is ideal for use in the fuel-cell, power-supply and energy-storage markets that demand testing at higher power levels.

News from TTi (Thurlby Thandar Instruments) (20 February 2007)

Access points ease network testing

Test access points allow diagnostic access to computer networks without breaking the circuit.

News from New Forest Electronics (15 February 2007)

Adapters cover a large range of popular packages

Low-cost RoHS compliant programming and test adapters are suitable for development and production applications.

News from Atomic Programming (15 February 2007)

Test chamber assesses effects of dust

Compact dust chamber aids testing and monitoring of the effects of dust and similar contaminants on electronic, electrical and mechanical components and assemblies.

News from Unitemp (14 February 2007)

Probe achieves high-speed signal acquisition

Single-ended active FET probe provides the excellent high-speed electrical and mechanical performance required for the real-time testing and debugging of today's digital system designs.

News from TTi (Thurlby Thandar Instruments) ( 2 February 2007)

Software analyses multigigabit transceivers

Serial link optimiser combines Agilent measurement and analysis software with Xilinx intellectual property and JTAG communication infrastructure.

News from Agilent Technologies Europe (30 January 2007)

Miniature switches suit VXI RF instruments

Miniature electromechanical RF switches are designed for use in single-slot VXIbus modules and other applications where space is restricted.

News from Link Microtek (24 January 2007)

Low-jitter clock generator has time for testing

The Stanford Research Systems CG635 is a low-jitter clock generator which can provide a wide range of clean, precise clocks for the most critical timing requirements.

News from TTi (Thurlby Thandar Instruments) (19 January 2007)

Accessories ease broadband microwave testing

Agilent Technologies has introduced a series of first-to-market, broadband microwave test accessories specifically optimised for communications and aerospace/defence applications.

News from Agilent Technologies Europe ( 3 January 2007)

Detector upgrades microscope performance

The new 3Max detector from El-Mul Technologies is billed as the first true innovation in Everhart-Thornley (ET) type chamber detectors in over 40 years.

News from AP Technologies ( 3 January 2007)

Read between the lines of test chamber specs

Technical background article Determining which HALT or HASS chamber can best meet your reliability programme requirements takes more than a quick glance of spec sheets.

News from QualMark (19 December 2006)

Test handler is a dynamic performer

Dynamic test handler support packages including BGA, CSP and QFP, with a maximum parallel test capacity of 16 devices and a throughput of 18,500 devices per hour.

News from Advantest (Europe) (19 December 2006)

Webcast to explain bead probe technology

Agilent Technologies is holding a free webcast on Medalist bead probe technology.

News from Agilent Technologies Europe (18 December 2006)

Multi-RF direct adapter kit

Pomona Electronics announces its new Multi-RF Direct Adapter Kit, a comprehensive kit of the most frequently used 50? adapters housed in a rugged pistol-grip case.