http://www.electronicstalk.com/indexes/categorybrowsetx.html Test Accessories latest news on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Wed, 14 May 2008 08:00:00 UT Wed, 14 May 2008 08:00:00 UT http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 The PBH1000 is robust enough for use in the in-vehicle test environment and will withstand maximum voltages of +/-100V (transient) and +/-35V. Tue, 06 May 2008 08:00:00 UT Yokogawa Europe - Test and Measurement http://www.electronicstalk.com/news/yoa/yoa197.html Accessory is ideal for a variety of portable PXI applications, such as in-vehicle test, mobile diagnostics and personal ATE in the automotive, ATE and aerospace and defence industries. Mon, 05 May 2008 08:00:00 UT National Instruments http://www.electronicstalk.com/news/naa/naa368.html Half-length threaded switch probes are ideal for applications where space is limited. Mon, 28 Apr 2008 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak155.html Antenna coupler for Tetra frequencies complements the 2303 Stabilock, a dedicated Tetra mobile station tester for service in the field of PMR. Mon, 07 Apr 2008 08:00:00 UT Willtek Communications http://www.electronicstalk.com/news/wil/wil140.html Probe card cuts the cost of high-volume wafer testing of RF filters and switches by offering superior probe performance and longer life at a lower cost. Thu, 03 Apr 2008 08:00:00 UT Cascade Microtech http://www.electronicstalk.com/news/cqw/cqw104.html Pushback test probes check out the locking mechanism of sockets and pins inside connectors. Mon, 17 Mar 2008 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak154.html Intelligent socket integrates heater, heatsink and thermal sensor, which calculates the precise amount of heat, or cooling, needed to maintain a device at a programmed temperature. Thu, 21 Feb 2008 08:00:00 UT Antares Advanced Test Technologies http://www.electronicstalk.com/news/wes/wes112.html Economical modular switch and control platform can be used in applications from simple RF switching all the way to complex EMC systems. Wed, 20 Feb 2008 08:00:00 UT Rohde and Schwarz http://www.electronicstalk.com/news/rhd/rhd266.html Screw-in probe is designed for push-back testing of wire harnesses and connectors. Fri, 15 Feb 2008 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak153.html System based on Agilent's 16900 logic analyser platform facilitates MIPI D-PHY hardware and software debug and reduces interoperability testing. Fri, 15 Feb 2008 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn274.html Socket is ideal for manual high-speed testing of devices such as CSP, micro-BGA, DSP, LGA, SRAM, DRAM and Flash, with pitches as low as 0.40mm. Mon, 11 Feb 2008 08:00:00 UT Aries Electronics http://www.electronicstalk.com/news/aie/aie156.html Clock reference board enables memory module and system designers to validate DDR3 RDIMMs and simulate system-level functionality effectively and efficiently. Thu, 31 Jan 2008 08:00:00 UT Inphi Corp http://www.electronicstalk.com/news/inp/inp127.html Agilent's new DDR BGA probe provides direct access to the balls of the DRAM with low loading and minimal impact to signal integrity. Tue, 29 Jan 2008 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn266.html Combined company will help customers achieve electrical performance objectives in test and functional interconnect with signal integrity validation and simulation. Wed, 23 Jan 2008 08:00:00 UT Ardent Concepts http://www.electronicstalk.com/news/ard/ard110.html Coaxial solid-state PIN diode switches target engineers designing manufacturing test systems or requiring a fast switching solution to validate component performance. Mon, 21 Jan 2008 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn263.html Nonrotating blade-shaped tip styles ensure perfect alignment when used in connector blocks. Fri, 11 Jan 2008 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak152.html Users of the Elite 300 wafer probe station won't have to retool at each process node or lose business to competing foundries with more accurate test capabilities. Tue, 08 Jan 2008 08:00:00 UT Cascade Microtech http://www.electronicstalk.com/news/cqw/cqw103.html Laser Components has expanded its amplifiers portfolio with the HCA-400M-5K-C high-speed current amplifier from Femto. Fri, 04 Jan 2008 08:00:00 UT Laser Components (UK) http://www.electronicstalk.com/news/lse/lse141.html Sockets use compression mount technology, in which the flexible contacts are pressed onto the contact pads of the PCB by screwing the socket to the board. Thu, 27 Dec 2007 08:00:00 UT Yamaichi Electronics http://www.electronicstalk.com/news/yaa/yaa124.html The NRP-Z81 is suitable for the analysis of radar and communications signals up to 30MHz RF bandwidth with a sensor rise-time of less than 13ns. Fri, 07 Dec 2007 08:00:00 UT TTi (Thurlby Thandar Instruments) http://www.electronicstalk.com/news/bla/bla304.html Device measures only 2.5 x 2.5 x 1.4mm and is designed to reliably test microwave frequencies throughout a product's development stage up to final production. Fri, 30 Nov 2007 08:00:00 UT Murata Electronics (UK) http://www.electronicstalk.com/news/mut/mut123.html Unit offers a high-precision alternative to current clamps in applications where current measurements need to be made on already installed conductors. Tue, 27 Nov 2007 08:00:00 UT Yokogawa Europe - Test and Measurement http://www.electronicstalk.com/news/yoa/yoa189.html Temperature and humidity chambers offer faster temperature changes to apply thermal stress to units under test. Thu, 22 Nov 2007 08:00:00 UT Unitemp http://www.electronicstalk.com/news/unm/unm114.html High linearity amplifiers are particularly suitable for use in systems such as CDMA, GSM, AMPS and TACS. Mon, 19 Nov 2007 08:00:00 UT Link Microtek http://www.electronicstalk.com/news/lib/lib228.html The MFE VIII is ideal for system optimisation and development as well as quality control and benchmark testing. Mon, 12 Nov 2007 08:00:00 UT Head Acoustics http://www.electronicstalk.com/news/hea/hea103.html The P70/G Series threaded test probe is believed to be the shortest threaded probe available for 2.54mm (0.1in) centres. Tue, 06 Nov 2007 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak151.html Antares Advanced Test Technologies' 880 series clamshell burn-in socket can accommodate the latest QFN packages and reduce maintenance-related downtime. Wed, 31 Oct 2007 08:00:00 UT Antares Advanced Test Technologies http://www.electronicstalk.com/news/wes/wes111.html Probing solution enables oscilloscope measurements in environmental chambers and in other settings with extreme temperature conditions. Tue, 30 Oct 2007 08:00:00 UT Agilent Technologies Europe http://www.electronicstalk.com/news/agn/agn247.html Rear assembly allows efficient, simple and quick replacement, with the probe being screwed into the receptacle without having to dismantle the fixture or module. Mon, 22 Oct 2007 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak150.html The Quatrix Kelvin QFN test socket allows chipmakers to migrate Kelvin-configuration testing of QFN packages from the lab to mass production Wed, 03 Oct 2007 08:00:00 UT Antares Advanced Test Technologies http://www.electronicstalk.com/news/wes/wes110.html The risk of an electric shock during product testing is completely eliminated with the latest range of test fixtures and enclosures from electrical safety testing specialist Clare Instruments. Tue, 02 Oct 2007 08:00:00 UT Clare Instruments http://www.electronicstalk.com/news/cku/cku135.html The key to the Intepro Loadsaver's energy saving is its power-recycling unit. Thu, 30 Aug 2007 08:00:00 UT Intepro UK http://www.electronicstalk.com/news/idk/idk102.html Range includes five-, six- and eight-decade boxes designed to provide highly accurate and variable standard values of resistance and current for calibration, comparison and test applications. Wed, 15 Aug 2007 08:00:00 UT Cropico http://www.electronicstalk.com/news/clf/clf117.html Decade boxes are available for resistance, capacitance and inductance - with ranges of values, power handling capabilities and accuracies to suit many different needs. Wed, 15 Aug 2007 08:00:00 UT Time Electronics http://www.electronicstalk.com/news/tio/tio103.html Active probes complement the recently introduced DL9040L and DL9140L digital oscilloscopes. Fri, 10 Aug 2007 08:00:00 UT Yokogawa Europe - Test and Measurement http://www.electronicstalk.com/news/yoa/yoa183.html 52-page catalogue gives full details of one of the widest ranges of probes available in the UK. Fri, 27 Jul 2007 08:00:00 UT Peak Test Services http://www.electronicstalk.com/news/pak/pak148.html Spectrum analyser cable and adapter kit provides the most popular and useful coaxial accessories to interconnect B+K Precision's Model 2650 and 2658 spectrum analysers. Thu, 28 Jun 2007 08:00:00 UT B+K Precision http://www.electronicstalk.com/news/bkp/bkp105.html Pulse sequencer PC software for R and S signal generators allows users to easily generate libraries of complex pulses and to combine them into pulsetrains. Mon, 25 Jun 2007 08:00:00 UT Rohde and Schwarz http://www.electronicstalk.com/news/rhd/rhd249.html Open-top 0.5mm-pitch QFN sockets for test and burn-in applications feature novel high-reliability ZIF contact mechanism. Mon, 25 Jun 2007 08:00:00 UT Yamaichi Electronics http://www.electronicstalk.com/news/yaa/yaa119.html