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News Release from: Accellera
Edited by the Electronicstalk Editorial
Team on 20 October 2006
Tool interface spec is passed on to IEEE
Accellera has approved a new test standard - the Open Compression Interface standard (OCI 1.0) - and its transfer to the IEEE for standardisation.
The Accellera members and Board of Directors have approved a new test standard - the Open Compression Interface standard (OCI 1.0) - and its transfer to the IEEE for standardisation OCI standardises the interface between different suppliers' tools to enable vendor interoperability for test pattern generation and diagnosis
This article was originally published on Electronicstalk on 8 Nov 2004 at 8.00am (UK)
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"The goal to improve design productivity with open and interoperability standards led our members and constituents to review how to improve access to test compression data", said Shrenik Mehta, Chair of Accellera.
"OCI is a result of these efforts and allows designers to select the best tools for their applications".
"Before on-chip scan compression, it was possible to use different EDA tool vendors for test pattern generation and diagnosis".
"On-chip scan compression changed that model because each tool supplier offers a different type of scan compression logic and a tool-specific way to pass information between the insertion, generation and diagnosis steps", said Bruce Cory, Technical SubCommittee chair.
"OCI standardises how data is passed from logic insertion to pattern generation and from pattern generation to diagnosis to enable designers to use different supplier tools for each step independent of the on-chip scan compression logic".
The next step for OCI will be an IEEE ballot for it to become an extension to the IEEE1450.6 standard.
The IEEE1450.x family of standards is for STIL, a standard tester interface language.
OCI leverages IEEE1450.6, which is the latest extension to STIL called CTL and which allows STIL to support core-based design testing.
The OCI standard is available from the Accellera website.
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