Advantest (Europe) web site, latest news and contact details

Address:
Stefan-George-Ring 2
D-81929 Munich
Germany
Telephone: (Germany) +49 89 993 12 129

Listing of all 71 news releases from Advantest (Europe):

Memory test system handles 128 devices

The T5503 tester's semiconductor circuitry makes full use of the latest CMOS technology to achieve greater packaging density.

News from Advantest (Europe) (24 April 2008)

Test cell wins industry recognition

Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.

News from Advantest (Europe) (25 January 2008)

RF test system provides high throughput

The 12GWSGA RF module is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market.

News from Advantest (Europe) (19 October 2007)

Tester and handler combo cuts per-device costs

Advantest Corp is introducing a new, high performance SoC test cell solution for manufacturers of IC consumer devices this week at Semicon West.

News from Advantest (Europe) (18 July 2007)

Tool expands high-speed SoC serdes analysis

Multilane 6.5Gbit/s high-speed interface serdes tester gains sophisticated jitter analysis capability.

News from Advantest (Europe) (16 July 2007)

ATE system puts display drivers in the picture

Test system for LCD source, gate and one-chip controller driver ICs looks to capitalise on increasing demand for HDTV.

News from Advantest (Europe) (25 May 2007)

Handler accelerates memory testing

Dynamic test handler for memory devices such as DDR2/3-SDRAM enables parallel testing of up to 512 devices and boasts a throughput of 20,000 units per hour.

News from Advantest (Europe) (26 April 2007)

Chinese customers appreciate Advantest

Advantest has been named one of the best customer-rated equipment suppliers in China.

News from Advantest (Europe) (18 April 2007)

Test company named as preferred quality supplier

Test company named a recipient of Intel's Preferred Quality Supplier (PQS) award for outstanding performance in providing products and services deemed essential to Intel's success.

News from Advantest (Europe) (29 March 2007)

Waveform generator wins honourable mention

A baseband waveform generator digitiser module, introduced at Semicon West last year, has won an honourable mention in Test and Measurement World's 2007 Best in Test awards.

News from Advantest (Europe) (12 January 2007)

Open test platform turns to high-volume SoCs

ATE is specifically designed with the compactness and modularity required to effectively test today's high-functionality SoC consumer devices.

News from Advantest (Europe) (20 December 2006)

Alliance focuses on automotive component testing

Cadence Design Systems and Advantest Corp have announced a collaborative partnership to deliver a methodology for zero-defect testing of digital automotive electronics.

News from Advantest (Europe) (20 December 2006)

Test handler is a dynamic performer

Dynamic test handler support packages including BGA, CSP and QFP, with a maximum parallel test capacity of 16 devices and a throughput of 18,500 devices per hour.

News from Advantest (Europe) (19 December 2006)

Tester boosts NAND Flash memory throughput

Test system uses tester-per-site architecture, the optimal choice for Flash memory test, to maximise efficiency at every stage of NAND test from wafer test to package test.

News from Advantest (Europe) (19 December 2006)

Test system is ready for memory expansion

Test system is designed for multipurpose memory devices such as DRAM, SDRAM and DDR SDRAM, as well as Flash memory and package test of MCP and other devices.

News from Advantest (Europe) (13 November 2006)

Sheedy engineers management role

Advantest (Europe) has appointed Gary Sheedy as its new Engineering Manager, based at the company's headquarters in Munich.

News from Advantest (Europe) ( 9 October 2006)

Lutz to develop European business

Advantest (Europe) has appointed Klaus Lutz as Director New Business Development.

News from Advantest (Europe) ( 9 October 2006)

16-channel mixed-signal module for SoC test

High integration dramatically reduces test cost for consumer ICs while delivering accuracy, flexibility and high performance.

News from Advantest (Europe) (14 July 2006)

Advantest stars in customer satisfaction survey

Users of Advantest's test and material handling systems have ranked it among the industry's 10 best large semiconductor equipment suppliers in an annual customer satisfaction survey.