RSS News Feed for Advantest (Europe) - from Electronicstalk http://www.electronicstalk.com/news/adb/adb000.html Advantest (Europe) news releases on Electronicstalk en-gb Copyright (C)2008 Pro-Talk Ltd. All rights reserved. Thu, 12 Jun 2008 08:00:00 UT Thu, 12 Jun 2008 08:00:00 UT Pro-Talk Ltd http://www.pro-talk.com/images/protalklogo90.gif http://www.pro-talk.com/ 90 79 Test handler helps meet LCD cost challenges Advancements in technology and changes in semiconductor industry business models are contributing to the continuing fall in price of LCD panels used in flat-screen televisions and computer monitors. Thu, 29 May 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb173.html Test handler is dynamic with DRAM throughput Dynamic test handler provides the industry's highest throughput of 42,200 units per hour. Fri, 23 May 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb172.html ATE system targets automotive mixed-signal devices Scalable architecture and an all-in-one test head contribute to an improvement in throughput for mass production. Thu, 22 May 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb171.html Memory test system handles 128 devices The T5503 tester's semiconductor circuitry makes full use of the latest CMOS technology to achieve greater packaging density. Thu, 24 Apr 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb170.html Test cell wins industry recognition Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour. Fri, 25 Jan 2008 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb169.html RF test system provides high throughput The 12GWSGA RF module is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market. Fri, 19 Oct 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb168.html Tester and handler combo cuts per-device costs Advantest Corp is introducing a new, high performance SoC test cell solution for manufacturers of IC consumer devices this week at Semicon West. Wed, 18 Jul 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb167.html Tool expands high-speed SoC serdes analysis Multilane 6.5Gbit/s high-speed interface serdes tester gains sophisticated jitter analysis capability. Mon, 16 Jul 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb166.html ATE system puts display drivers in the picture Test system for LCD source, gate and one-chip controller driver ICs looks to capitalise on increasing demand for HDTV. Fri, 25 May 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb165.html Handler accelerates memory testing Dynamic test handler for memory devices such as DDR2/3-SDRAM enables parallel testing of up to 512 devices and boasts a throughput of 20,000 units per hour. Thu, 26 Apr 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb164.html Chinese customers appreciate Advantest Advantest has been named one of the best customer-rated equipment suppliers in China. Wed, 18 Apr 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb163.html Test company named as preferred quality supplier Test company named a recipient of Intel's Preferred Quality Supplier (PQS) award for outstanding performance in providing products and services deemed essential to Intel's success. Thu, 29 Mar 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb162.html Waveform generator wins honourable mention A baseband waveform generator digitiser module, introduced at Semicon West last year, has won an honourable mention in Test and Measurement World's 2007 Best in Test awards. Fri, 12 Jan 2007 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb161.html Open test platform turns to high-volume SoCs ATE is specifically designed with the compactness and modularity required to effectively test today's high-functionality SoC consumer devices. Wed, 20 Dec 2006 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb159.html Alliance focuses on automotive component testing Cadence Design Systems and Advantest Corp have announced a collaborative partnership to deliver a methodology for zero-defect testing of digital automotive electronics. Wed, 20 Dec 2006 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb160.html Test handler is a dynamic performer Dynamic test handler support packages including BGA, CSP and QFP, with a maximum parallel test capacity of 16 devices and a throughput of 18,500 devices per hour. Tue, 19 Dec 2006 08:00:00 UT Advantest (Europe) http://www.electronicstalk.com/news/adb/adb157.html