Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T5375 memory test system
Edited by the Electronicstalk Editorial
Team on 20 June 2001
Memory test system more than doubles its
speed
The Advantest T5375 memory test system is capable of testing up to 128 devices simultaneously at speeds of either 143 or 286MHz DDR.
The Advantest T5375 memory test system is capable of testing up to 128 devices simultaneously at speeds of either 143 or 286MHz DDR This new low-footprint system is being targeted at front-end testing of commodity memories such as DRAM, synchronous DRAM, double datarate SDRAM and SRAM, as well as back-end testing of flash memories
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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With the ability to simultaneously test up to 128 devices, Advantest reckons its T5771 front-end Flash memory test system is a low-cost solution for achieving higher test throughput.
As the semiconductor industry makes the transition to larger 300mm wafers and continues to shrink design processes, it is becoming increasingly crucial for ATE manufacturers to raise testing throughputs at the front-end stage while also lowering test costs.
Along with the testing of mainstream DRAMs and SDRAMs, the T5375 can also perform testing on such emerging technologies as DDR SDRAMs and Direct Rambus DRAMs - memories that will continue to enjoy increasing demand.
Moreover, with its ability to test simultaneously up to 128 high-capacity wide-bit (x18/x20) devices, the system can provide twice the throughput of its predecessor.
Further reading
Testers boost mixed-signal SoC throughput
Advantest has released two new test systems aimed at mixed-signal SoCs: the T6683 has a top speed of 1GHz and up to 2048 test pins; the T6673 runs at up to 500MHz with a maximum of 1024 test pins
Video-speed ATE boasts audio-grade performance
Advantest has released wideband video frequency generator (WVFG) and wideband video frequency digitiser (WVFD) units for its T6673/T6683 SoC test systems.
Dynamic test handler takes up to eight SoCs
Advantest's M4541AD is a dynamic test handler capable of testing up to eight SoCs or other logic devices simultaneously - twice the capacity of its predecessor.
During front-end testing, redundancy analysis has become crucial in improving yields and slashing test times.
The T5375 thus comes installed with the company's Memory Repair Analyzer 4 (MRA4), which boasts an improved analysis time approximately 30% faster than the previous version.
Finally, the use of an enclosed chilling system that recirculates coolant throughout the test head and mainframe, eliminates air flow and heat dissipation into the test environment - a plus that can help reduce the cost of clean rooms.
With the increasing diversity of such Flash memories as NOR and NAND, the evolution toward greater memory capacities, and the constant rise in data rates led by synchronous flash, ATEs need to provide both increased flexibility and improved throughputs.
To perform testing of high-speed synchronous flash memories, the T5375 can provide testing speeds of either 143 or 286MHz DDR - a more than two-fold improvement in performance over the 70MHz provided by its predecessor the T5371.
Along with these faster data rates, the T5375 also comes with a host of other functions to help boost testing throughputs.
The T5375 is capable of simultaneous testing up to 128 Flash memory (x16/x18) devices.
In addition, for each device it runs a separate control function that is used to prevent excessive writing and erasing.
The system allows testing of defective blocks on a block-by-block basis and lets each device independently set masks that prevent blocks from being tested.
These features greatly contribute to the reduction of test times for NAND Flash memories.
Efficient testing of 300 mm wafers requires high-volume simultaneous testing and fast testing speeds.
The T5375 employs zero insertion force (ZIF) sockets to interface with the device under test, enabling a large number of signals to be transmitted with extremely high precision.
The system's software is also compatible with Advantest's T5300 and T5581 series of memory test systems, allowing users to make effective use of test programs and other engineering assets.
By freeing customers from having to perform unnecessary procedures such as developing new test programs, the T5375 enables significant reductions in turnaround time.
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