Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T6683 and T6673
Edited by the Electronicstalk Editorial
Team on 19 July 2001
Testers boost mixed-signal SoC
throughput
Advantest has released two new test systems aimed at mixed-signal SoCs: the T6683 has a top speed of 1GHz and up to 2048 test pins; the T6673 runs at up to 500MHz with a maximum of 1024 test pins
Advantest has released two new test systems aimed at mixed-signal SoCs: the T6683 has a maximum test speed of 1GHz and up to 2048 test pins (1024 I/O); the T6673 runs at up to 500MHz with a maximum of 1024 test pins The new systems build on Advantest's T6600 SoC family, which includes the high-end T6682 1GHz test system and the T6672 for 500MHz midrange testing
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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Advantest reckons the T6683 has improved standard features and options that give users the power to test almost every high-end device existing today.
In addition, the mixed-signal capabilities of the T6683 have been expanded considerably to keep pace with SoC technology advances.
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For example, to perform accurate testing of microprocessors and microcontrollers, the T6683, like the T6682, possesses Advantest's highly acclaimed "fly-by" architecture to quickly switch between driving data into, and receiving data out of, I/O pins.
For testing high-pin-count ASICs, the T6683 has also inherited the T6682's ability to control each I/O pin independently, allowing users to test with a maximum of 1024 input and 1024 output channels.
The T6683 also sports a number of improvements to the T6682, including a beefed-up pattern generator, increased precision, and expanded timing capabilities to handle devices with multiple busses running at different speeds.
Furthermore, to handle the large currents required by advanced microprocessors and their accelerated datarates, Advantest has readied an option for the T6683 that supplies device power at up to 256A - a four-fold improvement over its predecessor system.
Customers can also choose to add an optional high-speed, low-jitter clock.
With its ability to simultaneously test a maximum of eight devices at up to 500MHz, the T6673 test system further reduces test costs for mass-production lines and has enhanced mixed-signal testing functionality.
To slash test costs, Advantest has reduced the time required for simultaneous testing of mixed-signal devices by vastly improving the operating time of the T6673's internal CPU and by accelerating its bus speed.
To extend the range of the T6673's mixed-signal testing capabilities, the company has readied a wide variety of options for analogue testing.
For example, for testing of baseband devices users can add a high throughput testing option that allows simultaneous testing of up to eight such devices.
For high-precision testing of devices used in digital subscriber lines, users can also choose an optional wideband video frequency digitiser (16bit, 200Msample/s) and generator (16bit, 250Msample/s).
And for products like next-generation mass storage devices, Advantest has readied an 8bit arbitrary waveform generator, which has the world's fastest sampling rate today of 4Gsample/s.
Finally, the T6673 has a time measurement unit option that allows users to measure a single pulse at up to 1.6Gbit/s with a resolution of 1.15ps or continuously measure up to eight pulses without any dead time.
The latter feature is extremely useful for measuring the jitter in computer bus cycles.
These improvements make it possible for the T6673 to cut the test time in half for mobile handset baseband devices compared with its predecessor.
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