Product category:
ATE Systems
News Release from: Advantest (Europe)
Edited by the Electronicstalk Editorial
Team on 20 February 2002
DRAM maker orders multiple ATEs
A leading designer and manufacturer of high-performance DRAM devices, has placed an order with Advantest (Europe) for more than ten T5375 memory testers.
A leading designer and manufacturer of high-performance DRAM devices, has placed an order with Advantest (Europe) for more than ten T5375 memory testers Delivery of the first system will start immediately
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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The T5375 is a highly parallel 143MHz test system targeting wafer test of DRAM or for final test of Flash memory.
The system configured for DRAM wafer test is equipped with MRA4 ev1.
This is a highly efficient redundancy analyser package, which allows complex DRAM redundancy schemes to be carried out for all devices under test with minimal impact on the test-time.
Georg Schmederer, Key Account Manager at Advantest (Europe) said the system would achieve approximately twice the throughput of the previous generation of test systems.
"The versatility of theT5375 provides our customers with leading edge testing technologies.
Our design-in process with the customer has begun already at the conception phase of the T5375".
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