Product category:
ATE Systems
News Release from: Advantest (Europe)
Edited by the Electronicstalk Editorial
Team on 07 October 2002
Pair aim to improve fault diagnostics
Advantest is working with SynTest Technologies to deliver fast, accurate failure diagnostics for deep-submicron, high-speed SoC designs.
Advantest is working with SynTest Technologies to deliver fast, accurate failure diagnostics for deep-submicron, high-speed SoC designs The two companies have partnered to streamline and facilitate communications between Advantest's T6000 automated test equipment (ATE) family and SynTest's new ATE-based debug and failure analysis software, TurboDiagnosis, for optimised discovery and repair of device failures
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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According to Dr LT Wang, President and Chief Executive Officer of SynTest Technologies: "Providing customers with an automated diagnostic flow reduces the amount of time required for prototype debug and failure analysis and, more importantly, accelerates yield improvements and volume production of advanced SoC devices.
This partnership with Advantest helps reduce the barrier between design and prototype test by linking best-in-class products in an intuitive and transparent flow".
Nick Konidaris, President and CEO of Advantest America, noted, "Advantest is committed to creating partnerships and enacting best-in-class practices that will enable us to continually provide our customers with the most advanced SoC test capabilities possible-growing our position in the SoC test market is of paramount importance to our future roadmap.
We look forward to working with technology leaders such as SynTest to help us achieve these strategic objectives".
Advantest's T6000 series ATE systems transfer to SynTest's debug and failure analysis software, via an integrated, bidirectional communication link, the failure data on the location of the device.
The SynTest software receives and analyses the data, using failure logs from the T6000 series, and automatically generates diagnostic patterns to precisely identify the failing node and discover the most common defects.
The combination of the SynTest diagnosis software and the failure logs is particularly effective for diagnosing scan-based designs, the largest and most time-consuming part of any DFT methodology.
These designs can have scan inserted using SynTest's VirtualScan and TurboScan as well as other popular scan tools.
Products incorporating the high-speed communication link will be available from Advantest and SynTest in the fourth quarter 2002.
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