Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T6577
Edited by the Electronicstalk Editorial
Team on 23 June 2004
Tester gets to grips with high-pin-count
SoCs
The T6577 SoC test system is capable of simultaneous high-speed testing - even for odd numbers of devices - and supports input/output (I/O) pins up to 1024 channels.
The T6577 SoC test system is capable of simultaneous high-speed testing - even for odd numbers of devices - and supports input/output (I/O) pins up to 1024 channels The test system is used in mass-production lines for multifunction, multipin SoC devices that are used in mobile phones, peripheral equipment for networks, and digital consumer electronics, which are incorporating higher performance functions in each successive generation
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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The new T6577 SoC test system supports up to 1024 channels of logic I/O pins, which is double the capacity of its predecessor, the T6500, with the same test head size.
The measuring functions also offer improved flexibility for enabling low-cost testing of SoC devices with extremely large numbers of pins such as large-scale ASICs, FBGA devices and system LSIs used in digital consumer electronics which are incorporating more and more functions.
High-precision mixed signal options covering a wide range from the audio band to the video band are also available for enabling testing of mixed devices such as game consoles, DVD controller devices, and demodulation core processors for digital televisions or set-top boxes.
The test system also supports testing of RF and AC characteristics, such as baseband S/N and modulation accuracy, for enabling manufacturers to test communication devices, such as mobile phones and wireless LANs, with a single T6577 system.
The test head is provided with these high-precision wide-range mixed options and uses an optimised low-noise design to achieve a low floor noise of -100dBm or less.
This enables the high-sensitive testing that lower voltages and increased performance require.
The T6577 test system continues the use of the Viewpoint software system and is compatible with test programs and pattern programs developed for the T6500/T6600 series so that existing software assets can be used effectively.
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