Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: Joint system with SUSS for 20GHz wafer test
Edited by the Electronicstalk Editorial
Team on 23 June 2004
Collaboration aids high-frequency wafer
testing
A novel joint solution from Advantest (Europe) and SUSS MicroTec provides automatic wafer probe testing for 20GHz high-frequency multiport devices.
A novel joint solution from Advantest (Europe) and SUSS MicroTec provides automatic wafer probe testing for 20GHz high-frequency multiport devices The system is suitable for both R and D and production testing of high-frequency parts for both mobile communications and wireless LAN applications
The system offered by Advantest and SUSS MicroTec combines either the Advantest R3860A RF component analyser or R3770 network analyser with the SUSS PA200HF semi-automatic probe system.
And a new connection software package enables the setup of an automatic probe system for 20GHz multiport testing.
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