Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T5587
Edited by the Electronicstalk Editorial
Team on 18 August 2005
ATE speeds through multiple memory tests
A new automatic tester for multichip package memory devices achieves high throughput by testing up to 512 devices in parallel.
With a best-in-class maximum parallel test capacity of 512 devices in its two-station configuration, the T5587 offers high throughput testing of MCP (multichip package) memory devices, which are in increasing demand for cellular telephones and other electronic gadgets The growing availability of wireless broadband services has fuelled the development of wireless handheld communications devices, including cellular telephones and PDAs, that woo consumers with an ever greater array of functions packed into ever smaller bodies
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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These trends form the background to the increasing demand for MCP memory devices.
However, MCPs are purpose-designed, featuring application-optimal combinations of SDRAM and every type of Flash memory.
Their special characteristics, operation speeds, and pin counts vary widely, so that manufacturers hitherto have had to incorporate multiple testers into their operations.
Advantest's new T5587 memory tester comes to the rescue, offering an all-in-one, high-throughput solution for DDR-SDRAM, NOR and NAND Flash memory test needs.
Its newly developed high speed bus technology and reinforced bad block mask function help to cut per-device data writing times by up to 80% over previous models, reducing overall test times, and its maximum test speed of 200MHz (400Mbit/s in DDR mode) supports MCPs that incorporate newer, faster types of Flash memory such as DDR-SDRAM and NOR.
Moreover, in combination with Advantest's newest dynamic test handler, the M6300, the T5587's 512-device parallel test capacity will contribute to test cost reduction on mass production lines.
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