Product category:
Test Accessories
News Release from: Advantest (Europe) | Subject: M4841
Edited by the Electronicstalk Editorial
Team on 19 December 2006
Test handler is a dynamic performer
Dynamic test handler support packages including BGA, CSP and QFP, with a maximum parallel test capacity of 16 devices and a throughput of 18,500 devices per hour.
Advantest (Europe) has announced that its new M4841 dynamic test handler, supporting packages including BGA, CSP and QFP, with a maximum parallel test capacity of 16 devices and a throughput of 18,500 devices per hour, will be available from beginning of April 2007 The company exhibited the new handler during Semicon Japan at Chiba's Makuhari Messe
This article was originally published on Electronicstalk on 25 Jan 2008 at 8.00am (UK)
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Semiconductor test and handling equipment must evolve to meet these requirements, in the same way it must adapt to increasing demands for higher parallelism and higher throughput.
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The consumer electronics market continues to expand, with cellular phones and game consoles leading the growth trend.
As the prices of end-user products fall, the prices of the devices that drive them - such as MCU and DSP packages - are also being pushed down.
Thus, the demand for equipment that lowers test cost on mass production lines is presently most urgent.
Unique in its class, Advantest's new M4841 dynamic test handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP.
Because of its advanced performance capabilities and features, the M4841 is the optimal dynamic test handler for high volume production of devices used in consumer applications such as portable digital equipment and automotive systems.
The M4841 is capable of parallel testing up to 16 devices, double the capability of the earlier, industry-leading handler, also from Advantest.
The M4841 also delivers a high throughput of 18,500 devices per hour.
With three times the throughput capacity of its predecessor, the M4841 sets a new standard for the industry.
Because of its high test efficiency, the M4841 is well-suited for high-volume production lines.
With its unprecedented combination of 16-device parallel test and 18,500 device-per-hour throughput at 3 seconds test time or less, the M4841 makes a substantial contribution to reduced cost of test.
Advantest's soon-to-be-launched M4841 meets this demand with a maximum parallel test capacity of 16 devices (twice that of the company's previous model) and a throughput of 18,500 devices per hour (triple that of the company's previous model).
Additionally, it employs an advanced temperature-stabilisation method to cool devices to -40C or heat them to +125C, allowing it to test devices that must meet the highest standards, such as those used in automotive electronics and avionics, under a range of extreme environmental stresses.
Inheriting Advantest's acclaimed Soft Touch handling mechanism, together with optimised interior motion controls, the M4841 provides a high-accuracy test environment.
Customers can select the optimal configuration for their needs, as the company offers a range of parameters for parallel test capacity, temperature range, and processing capacity.
This reduces installation costs and contributes to overall system optimisation.
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