Product category:
ATE Systems
News Release from: Advantest (Europe)
Edited by the Electronicstalk Editorial
Team on 12 January 2007
Waveform generator wins honourable
mention
A baseband waveform generator digitiser module, introduced at Semicon West last year, has won an honourable mention in Test and Measurement World's 2007 Best in Test awards.
The T2000 16-channel baseband waveform generator digitiser module, introduced at Semicon West last year by Advantest Corp, has won an honourable mention in Test and Measurement World's 2007 Best in Test awards Advantest's BBWGD module was developed with high integration that dramatically reduces test cost for consumer ICs while delivering accuracy, flexibility and high performance
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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The module's 16 channels satisfy diverse mixed-signal testing needs - such as DC, audio, video, base band and high frequencies - on a single board.
This density provides the industry's highest performance mixed-signal test module on the market for the lowest cost.
In addition, its diverse functionality allows semiconductor manufacturers to realise higher utilisation via fewer instruments, streamlining operations with one module.
Aimed at filling SoC customers' test needs, the T2000 BBWGD module further optimises the benefits of Advantest's T2000 Open Architecture Test platform, the industry's only test platform based on Openstar open architecture specifications introduced by the not-for-profit Semiconductor Test Consortium.
Since 1991, the Editors of Test and Measurement World have selected the best test products annually to honour important and innovative new products and services in the electronics test and measurement industry.
According to the Test and Measurement World website, the Editors "narrowed this year's field from scores of deserving products, nominated by vendors that were introduced between 1st November 2005 and 31st October 2006".
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