Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T6373
Edited by the Electronicstalk Editorial
Team on 25 May 2007
ATE system puts display drivers in the
picture
Test system for LCD source, gate and one-chip controller driver ICs looks to capitalise on increasing demand for HDTV.
Advantest Corp has developed a test system for LCD source, gate and one-chip controller driver ICs Available from July 2007, the T6373 comes equipped with up to 3072 channels and offers parallel test for up to 32 devices
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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Spurred by next year's Beijing Olympics and by the rapid transitioning of television broadcast technology from analogue to digital, there is a growing worldwide demand for large, high-definition LCD panels, destined for use mainly for flat-panel digital televisions.
Such demand is expected to result in an expansion in the market for LCD driver ICs, a key component of LCD panels.
Forecasts suggest that by 2010, shipments of these ICs will increase by around 45%, but that this will represent a monetary increase of just 7%, leading to mounting pricing pressure for producers.
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Flash tester runs up to 128 devices at a time
With the ability to simultaneously test up to 128 devices, Advantest reckons its T5771 front-end Flash memory test system is a low-cost solution for achieving higher test throughput.
Testers boost mixed-signal SoC throughput
Advantest has released two new test systems aimed at mixed-signal SoCs: the T6683 has a top speed of 1GHz and up to 2048 test pins; the T6673 runs at up to 500MHz with a maximum of 1024 test pins
At the same time, test time and test costs are spiralling upward, as the introduction of higher definition and larger LCD panels necessitates faster driver ICs, with increasingly high bit resolution and pin count.
Such circumstances have led mass producers of driver ICs to press for a cost-effective test solution.
The new T6373 contributes greatly to reducing test costs.
It has up to 512 channels for digital test of image signal inputs and 3072 channels for LCD test of outputs, doubling that of the previous model on both counts, and it provides parallel testing of up to 32 units.
It also has twice the capacity of its predecessor for parallel testing of 684-pin and 720-pin driver ICs commonly used in large LCD televisions, with the result that four such devices can now be tested simultaneously.
The T6373 has a high-accuracy digitiser unit for each of its LCD channels, enabling testing of higher bit resolution and pin count ICs at a throughput 1.5 times greater than that of its predecessor.
It offers lower cost high- precision testing for a wide range of devices, from mass-produced items such as 8bit (512 grayscale) and 10bit (1024 grayscale) driver ICs for digital consumer electronics, to new and next-generation items like the leading-edge 12bit (4096 grayscale) driver ICs.
With its high-speed digital test function of up to 875Mbit/s, the T6373 also offers testing for reduced swing differential interfaces representative of PPDS and MIPI standards, enabling all LCD driver IC functions to be tested in this one test system.
In addition, because the T6373 builds on the technology of the T6372 LCD driver test system, cost and practical benefits abound.
Not only does it retain the software environment and usability of its predecessor, but it is completely compatible with the T6300 platform, enabling customers to use their existing test program, test board and probe card assets.
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