Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T2000 LS
Edited by the Electronicstalk Editorial
Team on 18 July 2007
Tester and handler combo cuts per-device
costs
Advantest Corp is introducing a new, high performance SoC test cell solution for manufacturers of IC consumer devices this week at Semicon West.
Advantest's integration of the handler and interfacing along with the tester and software products into a complete test cell offers the industry a new order of test solution for consumer SoCs The turnkey highly parallel solution comprises Advantest's new T2000 LS mainframe and new high-density application modules along with its new M4841 state-of-the-art handler - a complete test cell optimised for very high performance targeted to price-sensitive makers of today's complex consumer device ICs
This article was originally published on Electronicstalk on 25 Jan 2008 at 8.00am (UK)
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Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
LCD driver test system doubles throughput
Addressing a surge in demand for liquid crystal displays, the Advantest T6371 offers twice the throughput offered by previous test systems.
For decades the established leader in parallel test technology for the memory market, Advantest has now applied its expertise to revolutionise test in the nonmemory SoC market.
In addition, Advantest has long designed and manufactured its own handlers, as well as testers, and the company has developed advanced handler technology that, together with its state-of-the-art SoC test systems, contributes to significantly lower cost of test.
At Semicon, Advantest is showcasing its test system, T2000 LS mainframe coupled with its M4841 dynamic test handler, providing a cutting-edge test solution for a range of complex, highly integrated consumer devices.
Further reading
Memory test system more than doubles its speed
The Advantest T5375 memory test system is capable of testing up to 128 devices simultaneously at speeds of either 143 or 286MHz DDR.
Flash tester runs up to 128 devices at a time
With the ability to simultaneously test up to 128 devices, Advantest reckons its T5771 front-end Flash memory test system is a low-cost solution for achieving higher test throughput.
With parallel testing of 16 high-pincount devices and a throughput of 18,500 units per hour, Advantest's new test cell offers the industry's most cost-effective, high-volume digital consumer solution available.
R Keith Lee, President and CEO of Advantest America, says: "Our customers in the consumer device segment of the industry need reliable, accurate high-volume testing for devices that are very complex and very dense".
"Along with these requirements, they need to lower test costs continually to keep pace with the downward pricing pressures that characterise the consumer products market".
"Advantest is able to meet customers' needs by leveraging the strengths of our memory test product line and applying handler solutions".
"Together they make for a single vendor high-performance test cell that only Advantest can deliver".
"Drawing on the company's diverse engineering and applications resources, Advantest is able to cross-pollinate test technology and solutions for the digital consumer market, providing proven, elegantly simple state-of-the-art test capabilities".
The two new applications modules being demonstrated on this new test equipment are a very high density 800Mbit/s digital channel module and a 32-channel PMU module.
The 800MDM digital pin electronics module houses 128 channels in a single test head slot and is capable of up to 800Mbit/s for high speed databuses such as DDR2.
The 32-channel PMU module is useful for general DC measurements as well as ADC/DAC testing, and provides a low-cost solution ideal for testing analogue inputs and outputs on consumer devices.
At Semicon, information will also be available about Advantest's other applications modules for the T2000 open architecture platform.
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