Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: 12GWSGA RF module
Edited by the Electronicstalk Editorial
Team on 19 October 2007
RF test system provides high throughput
The 12GWSGA RF module is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market.
Advantest's 12GHz Wideband Signal Generator/Analyser (12GWSGA) RF module is the industry's first RF test solution that is fully integrated It is designed for accurate, low-cost testing of multiport RF SoC devices, used widely in mobile phones and of increasing importance to the wireless product and equipment market
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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It has a single 12GHz module in the test head with the industry's highest RF port density (32 per module) and multiple RF vectored sources and signal analysers.
Wireless technology is proliferating beyond mobile phones and laptop computers, to game consoles and other new applications.
Standards such as WiMAX and MIMO, which enable large volumes of data to be wirelessly transmitted at high speed, will become more widespread beginning in 2008.
In turn, new wireless infrastructure capabilities demand SoCs with higher levels of functional sophistication in conjunction with RF capabilities.
Leading-edge SoC designs, including RF and MIMO technology for mobile phone transceiver ICs, require more RF ports.
Conventional test solutions cannot deal with these increasing numbers of ports per IC and therefore cannot perform cost-effective parallel test of these devices.
This has resulted in a demand for test systems that can test RF SoC devices with high throughput and increased parallelism, resulting in lower cost of test and the development of Advantest's new RF test solution.
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