Product category:
ATE Systems
News Release from: Advantest (Europe) | Subject: T2000 LS Mainframe and M4841 Dynamic Test Handler
Edited by the Electronicstalk Editorial
Team on 25 January 2008
Test cell wins industry recognition
Advantest's SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
Advantest's T2000 LS Mainframe and M4841 Dynamic Test Handler (the company's SoC test cell) have won a 2008 Best in Test Award Introduced at Semicon West 2007, Advantest's T2000 LSMF/M4841 test cell was selected by the editors of Test and Measurement World magazine, as a Best in Test product for its innovation and contribution to the field of electronics test, measurement and inspection
This article was originally published on Electronicstalk on 11 May 2001 at 8.00am (UK)
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Addressing a surge in demand for liquid crystal displays, the Advantest T6371 offers twice the throughput offered by previous test systems.
Advantest's SoC test cell solution offers single-vendor tester-handler integration, bringing highly parallel, high-performance turn-key testing capabilities to SoC consumer device manufacturing.
This singular SoC consumer device test solution supports parallel testing of 16 high-pin-count consumer devices with throughput of up to 18,500 units per hour.
The T2000's OpenStar-compliant architecture offers scalability and flexibility and the test system's liquid cooling design improves the performance of the 26-slot test head, which accommodates instrument modules for a variety of testing: RF, audio, baseband and data conversion.
The M4841 is also designed for maximum flexibility and high performance.
It handles a variety of packages, has extremely high throughput and reliability and features proprietary innovations such as Advantest's Soft Touch technology, which uses an electro-pneumatic air pressure technique to avoid damaging extremely miniaturised parts during touchdown.
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